Is Low Power Testing Necessary? What does the Test Industry Truly Need?

A. Uzzaman
{"title":"Is Low Power Testing Necessary? What does the Test Industry Truly Need?","authors":"A. Uzzaman","doi":"10.1109/ATS.2009.91","DOIUrl":null,"url":null,"abstract":"With the changing face of the consumer driven semiconductor industry, there are new challenges facing the industry which need to be resolved. Minimizing Power dissipation is a significant and growing challenge with the growth of the wireless and portable device segments and with the need to be ‘green’. Even during manufacturing test, power is definitely among the top ten items needing attention and expertise. Since 90-nm there has been a recognition that power consumption during test can be a factor affecting product quality and yield. Excessive power consumption during manufacturing test affects the reliability of digital integrated circuits, leading to power-driven failures and higher infant mortality. These trends if continuing on their present course will force designers to adopt specific power management and low power design techniques for manufacturing test.","PeriodicalId":106283,"journal":{"name":"2009 Asian Test Symposium","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2009.91","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

With the changing face of the consumer driven semiconductor industry, there are new challenges facing the industry which need to be resolved. Minimizing Power dissipation is a significant and growing challenge with the growth of the wireless and portable device segments and with the need to be ‘green’. Even during manufacturing test, power is definitely among the top ten items needing attention and expertise. Since 90-nm there has been a recognition that power consumption during test can be a factor affecting product quality and yield. Excessive power consumption during manufacturing test affects the reliability of digital integrated circuits, leading to power-driven failures and higher infant mortality. These trends if continuing on their present course will force designers to adopt specific power management and low power design techniques for manufacturing test.
低功耗测试是必要的吗?测试行业真正需要什么?
随着消费者驱动的半导体行业面貌的变化,该行业面临着新的挑战,需要解决。随着无线和便携式设备领域的发展以及对“绿色”的需求,最大限度地降低功耗是一项重大且日益严峻的挑战。即使在制造测试中,电源也绝对是需要关注和专业知识的十大项目之一。自90纳米以来,人们已经认识到测试过程中的功耗可能是影响产品质量和良率的一个因素。在制造测试过程中,过度的功耗会影响数字集成电路的可靠性,导致功率驱动的故障和更高的婴儿死亡率。这些趋势如果继续发展下去,将迫使设计人员采用特定的电源管理和低功耗设计技术进行制造测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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