2009 Asian Test Symposium最新文献

A Practical Approach to Threshold Test Generation for Error Tolerant Circuits 容错电路阈值测试生成的一种实用方法

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.19

H. Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue

引用次数: 13

Efficient Software-Based Self-Test Methods for Embedded Digital Signal Processors 嵌入式数字信号处理器基于软件的有效自检方法

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.30

Jun-Jie Zhu, Wen-Ching Lin, Jheng-Hao Ye, Ming-Der Shieh

引用次数: 1

Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs? 为什么传统的ATPG不足以用于先进的低功耗设计?

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.80

K. Chakravadhanula, V. Chickermane, B. Keller, Patrick R. Gallagher, A. Uzzaman

引用次数: 5

A Low-Cost Output Response Analyzer for the Built-in-Self-Test Σ-Δ Modulator Based on the Controlled Sine Wave Fitting Method 基于可控正弦波拟合方法的嵌入式自检Σ-Δ调制器低成本输出响应分析仪

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.88

Shao-Feng Hung, Hao-Chiao Hong, Sheng-Chuan Liang

引用次数: 4

A Partially-Exhaustive Gate Transition Fault Model 部分穷举门跃迁故障模型

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.62

B. Keller, Dale Meehl, A. Uzzaman, Richard Billings

引用次数: 0

An Adaptive Test for Parametric Faults Based on Statistical Timing Information 基于统计时序信息的参数故障自适应测试

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.90

Michihiro Shintani, T. Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, K. Hatayama, T. Aikyo, K. Masu

引用次数: 16

Functional Built-In Delay Binning and Calibration Mechanism for On-Chip at-Speed Self Test 功能内置延迟分组和校准机制片上高速自检

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.72

Chen-I Chung, Jyun-Sian Jhou, Ching-Hwa Cheng, Sih-Yan Li

引用次数: 5

Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing 使用多个线性反馈移位寄存器进行低功耗扫描测试的确定性内置自检

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.50

Lung-Jen Lee, W. Tseng, Rung-Bin Lin, Chi-Wei Yu

引用次数: 5

N-distinguishing Tests for Enhanced Defect Diagnosis 用于增强缺陷诊断的n -区分测试

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.47

Gang Chen, J. Rajski, S. Reddy, I. Pomeranz

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引用次数: 5

A Delay Measurement Technique Using Signature Registers 一种基于签名寄存器的延迟测量技术

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI: 10.1109/ATS.2009.54

Kentaroh Katoh, Toru Tanabe, Haque Md Zahidul, K. Namba, Hideo Ito

引用次数: 11