使用多个线性反馈移位寄存器进行低功耗扫描测试的确定性内置自检

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI:10.1109/ATS.2009.50

Lung-Jen Lee, W. Tseng, Rung-Bin Lin, Chi-Wei Yu

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引用次数: 5

摘要

庞大的测试数据量和过高的测试功率是VLSI测试面临的两大严峻挑战。本文提出了一种使用多个lfsr生成低功耗测试集的确定性BIST。实验结果表明，在有限的硬件开销下，这两个问题都可以得到显著改善，尤其是在降低测试功耗方面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing

Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to generate the low power test set. Experimental results show, the two problems, especially in the reduction of testing power, can be significantly improved with limited hardware overhead.

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2009 Asian Test Symposium

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