部分穷举门跃迁故障模型

2009 Asian Test Symposium Pub Date : 2009-11-23 DOI:10.1109/ATS.2009.62

B. Keller, Dale Meehl, A. Uzzaman, Richard Billings

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引用次数: 0

摘要

本文给出了一种定义部分穷举门过渡故障模型的方法，用于捕捉在使用更传统的故障模型时遗漏的缺陷。我们定义ATPG必须为这个错误模型创建的门级转换，以及它如何捕获未建模的缺陷。未来的工作将分析使用该故障模型对商业芯片设计进行应用测试的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Partially-Exhaustive Gate Transition Fault Model

This paper shows a way to define a partially-exhaustive gate transition fault model for use in catching defects that escape when using more traditional fault models. We define the gate-level transitions ATPG must create for this fault model and how this may catch un-modeled defects. Future work will analyze results of applying tests generated using this fault model against a commercial chip design.

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2009 Asian Test Symposium

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