25th ARFTG Conference Digest最新文献

In Search of an Impedance Standard for Microwave Frequencies 寻找微波频率的阻抗标准

25th ARFTG Conference Digest Pub Date : 1985-06-06 DOI: 10.1109/ARFTG.1985.323617

G. Engen

{"title":"In Search of an Impedance Standard for Microwave Frequencies","authors":"G. Engen","doi":"10.1109/ARFTG.1985.323617","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323617","url":null,"abstract":"F i r s t , i t i s necessary t o c a r e f u l l y review t h e measurement ob jec t ives , which u s u a l l y i nc lude ob ta in ing values f o r t h e parameters o r p roper t i es of c e r t a i n hardware items. To t h e ex ten t t h a t these parameters are l oose ly o r i l l d e f i n e d , a l i m i t a t i o n w i l l be imposed on t h e meaningful accuracy one can c l a i m f o r t h e network analyzer, i r r e s p e c t i v e o f i t s own i n t e r n a l characteri s t i c s . I n t h i s context it i s impor tant t o r e c a l l t h a t microwave c i r c u i t theory owes i t s ex is tence t o t h e form taken by t h e s o l u t i o n o f Maxwell 's equations i n an assumed un i fo rm propagat ing s t r u c t u r e (e.g., waveguide), and t h i s i n t u r n prov ides t h e bas is f o r t h e usual d e f i n i t i o n o f impedance a t microwave frequencies. Although one's i n a b i l i t y t o completely r e a l i z e t h e un i fo rm i t y cond i t i on may be p a r t i a l l y compensated i n coax ia l systems (prov ided t h a t t h e rad ius i s small i n comparison t o t h e wavelength), t h e usual r e s u l t i s t h a t t h e impedance, which i s a common measurement ob jec t ive , i s not p r e c i s e l y de f i ned .","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129480417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Coherent (VQ) Detector Error Analysis Software 相干(VQ)检测器误差分析软件

25th ARFTG Conference Digest Pub Date : 1985-06-06 DOI: 10.1109/ARFTG.1985.323631

Kenneth Bradley

{"title":"Coherent (VQ) Detector Error Analysis Software","authors":"Kenneth Bradley","doi":"10.1109/ARFTG.1985.323631","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323631","url":null,"abstract":"Software for analysis and alignment of I/Q Detectors is described using the results developed by Kyle in \" Precision Alignment of I/Q Detectors Using Fourier Transforms\". The relationship of the continuous and discrete Fourier transforms is described. The measurement technique uses two locked synthesizers to provide sinusoidal responses at the outputs, I and Q, of the detector. Measurement data acquisition uses sampling techniques to obtain time sequences of the detector I and Q outputs. The sampling process is performed by a Tektronix 390AD giving 2048 values (10 bits each) for each input. The 390AD data is processed to give floating point time samples of the I and Q response. Availability of the time response sequences permits use of digital signal processing techniques for detector characteristics analysis. Discrete Fourier Transforms are introduced and compared with the continuous tranforms. The FFT of the time sequences i (t), q (t) are performed resulting in frequency domain (spectrum) sequences I (n) and Q (n). The spectral coefficients are identified for the input signal and analyzed to determine ka, the detector amplitude balance, and ¿, the detector phase error. The power spectrum is developed and Image Rejection is evaluated. The power spectrum is plotted with the amplitude balance, phase error, and image rejection shown. Finally window functions are shown to provide equivalent results for the non-ideal i (t) and q (t) sequences. The technique is shown to provide fast-accurate results of the determination of I/Q detector characteristics.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116756097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The Characterization of Load-Dependent Devices 负载相关器件的特性

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323621

V. Adamian

引用次数: 1

" A Microstrip Chip Carrier and Insert for the Transistor Test Fixture" 一种用于晶体管测试夹具的微带芯片载体和插片

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323626

G. Simpson, R. Lane

引用次数: 0

Calibration and Automation of Transmission Line Discriminators for FM Noise Measurement 调频噪声测量传输线鉴别器的标定与自动化

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323616

J. Ashley

引用次数: 0

A Semi Automated Scalar-Vector Setup for Load and Source Pull Measurement 一种用于负载和源拉力测量的半自动标量矢量装置

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323622

M. Avasarala

引用次数: 1

Precision Alignment of I/Q Detectors Using Fourier Transforms 利用傅里叶变换实现I/Q检测器的精确对准

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323630

Robert Kyle

引用次数: 2

An Automatic Calibration System for Diode Power Detectors 二极管功率检测器的自动校准系统

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323618

B. Herscher, R. Britton

引用次数: 2

De-Embedded Measurements Using the HP 8510 Microwave Network Analyzer 使用hp8510微波网络分析仪进行嵌入式测量

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323625

Glenn E Elmore

{"title":"De-Embedded Measurements Using the HP 8510 Microwave Network Analyzer","authors":"Glenn E Elmore","doi":"10.1109/ARFTG.1985.323625","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323625","url":null,"abstract":"This paper describes a. technique for modifying the error coefficients used inside the HP 8510A to provide a measurement vantage point different from that which normal calibration and measurement techniques will allow. Such modification enables the HP 8510A to display data as though it had been calibrated at a measurement plane separated from the actual calibration plane by an embedding network. This technique, called de-embedding, enables direct device measurement at measurement planes for which suitable calibration standards are unavailable or inconvenient to use. While not totally general, the technique can accommodate many fixturing applications (the same ones to which conventional calibration techniques apply), particularly if certain attributes are included in the design and fabrication of the fixture. The technique may be easily extended to allow embedding the device under test in a hypothetical network to allow viewing the device as though it were actually in a circuit with such a. network. Some examples are given which demonstrate the measurement of a packaged transistor in a. fixture with various amounts of de-embedding. Finally, tile same transistor is shown de-embedded from the entire fixture and with a matching/filter network embedded allowing real time observation of the \"finished amplifier\" performance as a function of bias conditions. author has been with HP since 1972. The majority of that time was spent as a member of a lab team developing swept microwave sources, including the HP 8350 family of broadband plug-ins. Since 1981, he has been involved with the development of the HP 8511-8515 test sets for the HP 8510 and most recently was responsible for the development of the hardware and algorithms used as part of tile HP 85014A Active Device Measurements Pac.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130174757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

A Simpler Calibration Method for Six-Port Automatic Network Analyzers 一种简单的六端口自动网络分析仪校准方法

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI: 10.1109/ARFTG.1985.323615

L. Kaliouby, R. Bosisio

引用次数: 0