{"title":"一种用于负载和源拉力测量的半自动标量矢量装置","authors":"M. Avasarala","doi":"10.1109/ARFTG.1985.323622","DOIUrl":null,"url":null,"abstract":"A semi automated scalar vector measurement setup for the characterization of a GaAs power FET is described. Input and output impedances of a power FET can be measured as a function of a scalar parameter such as Pout, gain, efficiency, AM/PM, etc. Computer control enables quick, accurate and repeatable measurements right up to the chip device plane. Results of a single stage Internally Matched power FET designed using measurements from the above setup are given.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Semi Automated Scalar-Vector Setup for Load and Source Pull Measurement\",\"authors\":\"M. Avasarala\",\"doi\":\"10.1109/ARFTG.1985.323622\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A semi automated scalar vector measurement setup for the characterization of a GaAs power FET is described. Input and output impedances of a power FET can be measured as a function of a scalar parameter such as Pout, gain, efficiency, AM/PM, etc. Computer control enables quick, accurate and repeatable measurements right up to the chip device plane. Results of a single stage Internally Matched power FET designed using measurements from the above setup are given.\",\"PeriodicalId\":101637,\"journal\":{\"name\":\"25th ARFTG Conference Digest\",\"volume\":\"111 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"25th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1985.323622\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"25th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1985.323622","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Semi Automated Scalar-Vector Setup for Load and Source Pull Measurement
A semi automated scalar vector measurement setup for the characterization of a GaAs power FET is described. Input and output impedances of a power FET can be measured as a function of a scalar parameter such as Pout, gain, efficiency, AM/PM, etc. Computer control enables quick, accurate and repeatable measurements right up to the chip device plane. Results of a single stage Internally Matched power FET designed using measurements from the above setup are given.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
