{"title":"Report on Committee to Promote National Microwave Standards","authors":"D. Rytting","doi":"10.1109/ARFTG.1985.323619","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323619","url":null,"abstract":"","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126268921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Fully Automated System for Performing High Power, Broadband IMD Measurements","authors":"M. Minot","doi":"10.1109/ARFTG.1985.323624","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323624","url":null,"abstract":"Microwave power semiconductors are finding increased use in highly linear applications such as digital and SSB radio link transceivers. Until now, large scale testing of device linearity has been both time-consuming and prone to measurement errors. An automated system is described which measures Nth order intermodulation products of devices operating in the 1-18 GHz range. Measurement time is significantly reduced and both accuracy and repeatability improved.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133550507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Real-Time Display of VCO FM Linearity","authors":"Thomas Dobrino, Robert Fleeger","doi":"10.1109/ARFTG.1985.323628","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323628","url":null,"abstract":"The a1 i gnmen t and t u n i ng o f microwave v o l tage c o n t r o l 1 ed o c i 1 1 a t o r s (VCO ' s ) can be a t ime consuming opera t ion . The a b i l i t y t o d i s p l a y b o t h f requency modu la t ion (FM) s e n s i t i v i t y and l i n e a r i t y d u r i n g tun ing, i s a n e c e s s i t y and was a major problem. Three measurement techniques have been used a t Hughes f o r VCO t e s t i n g .","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114393511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measuring a Non-Insertable Device","authors":"H. Stinehelfer","doi":"10.1109/ARFTG.1985.323620","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323620","url":null,"abstract":"A coaxial waveguide adaptor is a non-insertable device. This paper illustrates how the adaptor can be measured with the waveguide circuit not terminated in the conventional manner.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127891944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Time Domain Measurements in KA Band (26.5-40.0 GHz) Using a WR28 5 Port Junction","authors":"G. Riblet","doi":"10.1109/ARFTG.1985.323638","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323638","url":null,"abstract":"This paper describes the use of a WR28 5 port junction to make time domain measurements in Ka band (26.5 - 40.0 GHz) via the 6-port measurement technique. A solid state signal generator, with about one milliwatt of output power, is used as the signal source. Results on the time domain analysis of narrow height WR28 mismatch standards open at the ends are presented. The two reflections from the junction where the waveguide height narrows, and from the open end are well separated.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134646585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A PCB Interface for Using the IBM-PC as a Frequency Counter in Computer-Aided Testing (CAT) of Microwave Oscillator Stabi1ity","authors":"F. Ghannouchi, R. Bosisio","doi":"10.1109/ARFTG.1985.323627","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323627","url":null,"abstract":"In this paper we describe a means of usinq an IBM-PC in computer aided testing (CAT) of the frequency stability of a microwave oscillator. Both long term stability (drift) and short term stability (noise) results are given for a commercial oscillator (Vectron CO-371B) operating at 475 MHz. The short term stability was characterized by specfying the noises that accompagny the oscillation for the Fourier frequency range, frequency counter for gathering the experimental data, as a data processor for frequency stability calculations, and as a word processor for both text and graphics.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125828730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated Testing of Developmental Satellite Communications Systems and Subsystems","authors":"R. Kerczewski, K. Shalkhauser","doi":"10.1109/ARFTG.1985.323629","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323629","url":null,"abstract":"Lower frequency bands allocated for satellite communications use are rapidly becoming saturated due to steadily increasing demand. NASA has an ongoing program to develop the new technologies required to meet the demands of future systems. Under this program, higher frequency components and more efficient system techniques are being developed and tested. In order to accurately evaluate the performance of these technologies, an automated test system has been designed and built at NASA's Lewis Research Center. This paper describes the automated system's design and discusses its capabilities.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114342775","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}