A Fully Automated System for Performing High Power, Broadband IMD Measurements

Abstract

Microwave power semiconductors are finding increased use in highly linear applications such as digital and SSB radio link transceivers. Until now, large scale testing of device linearity has been both time-consuming and prone to measurement errors. An automated system is described which measures Nth order intermodulation products of devices operating in the 1-18 GHz range. Measurement time is significantly reduced and both accuracy and repeatability improved.