{"title":"实现高功率宽带IMD测量的全自动系统","authors":"M. Minot","doi":"10.1109/ARFTG.1985.323624","DOIUrl":null,"url":null,"abstract":"Microwave power semiconductors are finding increased use in highly linear applications such as digital and SSB radio link transceivers. Until now, large scale testing of device linearity has been both time-consuming and prone to measurement errors. An automated system is described which measures Nth order intermodulation products of devices operating in the 1-18 GHz range. Measurement time is significantly reduced and both accuracy and repeatability improved.","PeriodicalId":101637,"journal":{"name":"25th ARFTG Conference Digest","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Fully Automated System for Performing High Power, Broadband IMD Measurements\",\"authors\":\"M. Minot\",\"doi\":\"10.1109/ARFTG.1985.323624\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microwave power semiconductors are finding increased use in highly linear applications such as digital and SSB radio link transceivers. Until now, large scale testing of device linearity has been both time-consuming and prone to measurement errors. An automated system is described which measures Nth order intermodulation products of devices operating in the 1-18 GHz range. Measurement time is significantly reduced and both accuracy and repeatability improved.\",\"PeriodicalId\":101637,\"journal\":{\"name\":\"25th ARFTG Conference Digest\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"25th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1985.323624\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"25th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1985.323624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Fully Automated System for Performing High Power, Broadband IMD Measurements
Microwave power semiconductors are finding increased use in highly linear applications such as digital and SSB radio link transceivers. Until now, large scale testing of device linearity has been both time-consuming and prone to measurement errors. An automated system is described which measures Nth order intermodulation products of devices operating in the 1-18 GHz range. Measurement time is significantly reduced and both accuracy and repeatability improved.
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