" A Microstrip Chip Carrier and Insert for the Transistor Test Fixture"

Abstract

A microstrip insert is being developed for the Transistor Test Fixture (TTF) to provide accurate and convenient measurement of chip transistors up to 18 GHz. Chips are mounted on drop-in microstrip carriers. Calibration is done at a microstrip reference plane using drop-in calibration standards. This paper is a progress report and will discuss methods of calibration, actual measured data on chip transistors, and some pitfalls and their solutions.