一种用于晶体管测试夹具的微带芯片载体和插片

25th ARFTG Conference Digest Pub Date : 1985-06-01 DOI:10.1109/ARFTG.1985.323626

G. Simpson, R. Lane

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引用次数: 0

摘要

为晶体管测试夹具(TTF)开发了一种微带插入，以提供精确和方便的测量高达18 GHz的芯片晶体管。芯片安装在插入式微带载体上。使用插入式校准标准在微带参考平面上进行校准。本文是一份进度报告，将讨论芯片晶体管的校准方法、实际测量数据、一些陷阱及其解决方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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" A Microstrip Chip Carrier and Insert for the Transistor Test Fixture"

A microstrip insert is being developed for the Transistor Test Fixture (TTF) to provide accurate and convenient measurement of chip transistors up to 18 GHz. Chips are mounted on drop-in microstrip carriers. Calibration is done at a microstrip reference plane using drop-in calibration standards. This paper is a progress report and will discuss methods of calibration, actual measured data on chip transistors, and some pitfalls and their solutions.

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来源期刊

25th ARFTG Conference Digest

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