A Semi Automated Scalar-Vector Setup for Load and Source Pull Measurement

Abstract

A semi automated scalar vector measurement setup for the characterization of a GaAs power FET is described. Input and output impedances of a power FET can be measured as a function of a scalar parameter such as Pout, gain, efficiency, AM/PM, etc. Computer control enables quick, accurate and repeatable measurements right up to the chip device plane. Results of a single stage Internally Matched power FET designed using measurements from the above setup are given.