{"title":"IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY","authors":"","doi":"10.1109/LEMCPA.2025.3643664","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3643664","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"C2-C2"},"PeriodicalIF":1.0,"publicationDate":"2025-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11316301","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Simplified Two-Antenna Method for Characterizing the Shielding Effectiveness of Physically Small Enclosures","authors":"Zhao Chen;Tim Claeys;Johan Catrysse;Davy Pissoort","doi":"10.1109/LEMCPA.2025.3623691","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3623691","url":null,"abstract":"Evaluating the shielding effectiveness (SE) of physically small enclosures presents a critical challenge in electromagnetic compatibility (EMC). IEEE Standard 299.1 outlines a reverberation chamber (RC) method, which in practice is often implemented with a vector network analyzer (VNA) and calibrated antennas with known efficiency. This letter investigates a simplified two-antenna method in an RC that eliminates the need for antenna efficiency characterization and allows flexible instrumentation, such as using a signal generator and receiver instead of a VNA. For comparison purposes, a VNA is employed in this letter. Measurement results under four shielding conditions using a straight monopole antenna confirm that the proposed method achieves comparable SE performance to the standardized method, with reduced setup complexity, making it suitable for generic EMC laboratories with limited resources.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"141-146"},"PeriodicalIF":1.0,"publicationDate":"2025-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Simulation-Based Analysis of Noise Spectral Components Affecting Mobile Communication in Industrial Drones","authors":"Koh Watanabe;Ifong Wu;Yasushi Matsumoto;Yushi Mitsuya;Satoshi Tanaka;Makoto Nagata;Kaoru Gotoh","doi":"10.1109/LEMCPA.2025.3618568","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3618568","url":null,"abstract":"Mobile communication systems are essential for expanding the operational range of industrial drones. However, electromagnetic (EM) noise from onboard electronics can be a source of intrasystem EM interference (EMI), which may lead to receiver sensitivity degradation. This issue is particularly critical in industrial drones, for which miniaturization and weight constraints limit the application of conventional EMI countermeasures. The impacts of non-Gaussian EMI vary depending on its temporal and spectral structures, and such impacts on various wireless systems have been reported. The degree and nature of impacts are often highly dependent on the specific communication scheme. In this letter, we focus on an intrasystem EMI problem specific to a drone platform, evaluating the effects of frequency-domain characteristics of EMI that are typical of noise generated by onboard drone equipment on long-term evolution (LTE) communication performance. White noise from the power module and clock-driven harmonic noise from the control module were modeled and evaluated using a wireless communication simulator. The results showed that both noise types degrade receiver sensitivity, with clock-driven harmonic noise having stronger impacts when the total in-band power is equal. Since this degradation occurs during downconversion and demodulation, the findings apply beyond the 800-MHz band. These results highlight the importance of considering not only total noise power but also spectral composition in EMI mitigation strategies. The proposed simulation-based EMI analysis can be an efficient approach to evaluating EMI effects in mobile communication systems, particularly during the early design phase of compact and lightweight electronic devices. While the results are specific to the evaluated drone, the proposed simulation-based EMI analysis provides a broadly applicable framework for assessing EMI effects in mobile communication systems.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"129-134"},"PeriodicalIF":1.0,"publicationDate":"2025-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11195865","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Musab Hameed;Samuel J. Carver;Jianchi Zhou;David Pommerenke
{"title":"An Inductive Method for ESD Current Capture on the ESD Generator Tip Using Two-Step Analog Integration","authors":"Musab Hameed;Samuel J. Carver;Jianchi Zhou;David Pommerenke","doi":"10.1109/LEMCPA.2025.3611110","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3611110","url":null,"abstract":"This letter presents a lightweight current capture device for electrostatic discharge (ESD) testing. The device contains a magnetic field sensor, which is mounted on the tip of the ESD generator. A two-step analog integration is performed to correct the frequency response of the sensor from 1 to 800 MHz, thus ensuring the reliable capture of ESD current. The ESD current waveform is different for different test scenarios. The proposed device can measure the waveform for each discharge scenario. The measured results in the frequency and time domains are presented in this letter.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"135-140"},"PeriodicalIF":1.0,"publicationDate":"2025-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11168898","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Call for Application Letters on the Special Issue Practical Applications and Advancements in Electromagnetic Shielding and Absorbers","authors":"","doi":"10.1109/LEMCPA.2025.3605431","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3605431","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"104-105"},"PeriodicalIF":1.0,"publicationDate":"2025-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11163694","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Synopsis of the September 2025 Issue of the IEEE Letters on Electromagnetic Compatibility Practice and Applications","authors":"","doi":"10.1109/LEMCPA.2025.3598959","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3598959","url":null,"abstract":"Summary form only: Abstracts of articles presented in this issue of the publication.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"64-67"},"PeriodicalIF":1.0,"publicationDate":"2025-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11163692","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE ELECTROMAGNETIC COMPATIBILITY SOCIETY","authors":"","doi":"10.1109/LEMCPA.2025.3605430","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3605430","url":null,"abstract":"","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 3","pages":"C2-C2"},"PeriodicalIF":1.0,"publicationDate":"2025-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11163678","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145036791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Gala Dushyanth;Kajal Chaudhary;Sachin Kalraiya;Raghvendra Kumar Chaudhary
{"title":"Broadband AT Rasorber for Radome Application","authors":"Gala Dushyanth;Kajal Chaudhary;Sachin Kalraiya;Raghvendra Kumar Chaudhary","doi":"10.1109/LEMCPA.2025.3608868","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3608868","url":null,"abstract":"This letter presents a compact absorptive–transmissive (AT) frequency-selective rasorber (FSR), providing more than 90% absorption of electromagnetic (EM) waves from 3.88 to 8.43 GHz and a good insertion loss at 9.48 GHz. The structure is simple, consisting of a top lossy layer and a bottom frequency-selective surface (FSS) layer, isolated by an air spacer. The design methodology of the proposed structure and its detailed analysis using S-parameters are discussed. The lossy layer consists of four octagonal rings symmetrically placed at corners and connected through a common larger-sized central octagonal ring of copper with resistors. The FSS layer consists of a single dielectric octagonal ring cut over uniform copper. Based on the equivalent circuit model, the EM characteristics of FSR are presented. The effect of resistance and the height of substrate on the EM performance of the rasorber are analyzed. Finally, the rasorber is fabricated and measured to experimentally validate the performance of the proposed design.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"114-117"},"PeriodicalIF":1.0,"publicationDate":"2025-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Martin Humeau;Mohsen Koohestani;David Boudikian;Mohamed Ramdani
{"title":"Characterization of Near-Field Interactions Between Multiple Noise Sources and a Conductive Wire","authors":"Martin Humeau;Mohsen Koohestani;David Boudikian;Mohamed Ramdani","doi":"10.1109/LEMCPA.2025.3601614","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3601614","url":null,"abstract":"This letter presents the development of an analytical model to characterize near-field electromagnetic coupling between multiple noise sources and a metallic wire. The noise sources are modeled as two spatially separated, radiating single-turn metallic closed loops positioned above the wire in the presence of a ground plane. The analytical model applies the superposition theorem to account for the combined magnetic-field contributions of both noise sources. Validation was performed through full-wave simulations in Ansys HFSS and experimental measurements. Whatever the distance between the two radiating loops, the results demonstrate a reasonable correlation between the analytical model predictions, simulations, and measurements across a frequency range of 1 MHz–1 GHz. Notably, the analytical model maintains its computational advantage, providing accurate results in seconds compared to the hours required by full-wave simulations. This enhancement is particularly beneficial for electromagnetic-compatibility-compliant designs in industrial applications, where accurate and rapid assessments of complex multisource environments are essential.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"123-128"},"PeriodicalIF":1.0,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Amr Madi;Piotr Lezynski;Robert Smolenksi;Niek Moonen;Frank Leferink
{"title":"Modern EMC Power Quality Issues: Overvoltage Caused by PV Penetration","authors":"Amr Madi;Piotr Lezynski;Robert Smolenksi;Niek Moonen;Frank Leferink","doi":"10.1109/LEMCPA.2025.3598177","DOIUrl":"https://doi.org/10.1109/LEMCPA.2025.3598177","url":null,"abstract":"Due to the global vision and actions taken to lower the <inline-formula> <tex-math>${mathrm { CO}}_{2}$ </tex-math></inline-formula> and decrease the emitted greenhouse gases, there has been a boost and encouragement for deploying photovoltaic (PV) systems in Poland and many other countries. However, the extensive installation of PV units in residential prosumers has led to a new electromagnetic-compatibility (EMC) problem. This problem is the overvoltage (OV) resulting from high penetration of the PV units. Energy companies started to receive complaints from customers about service interruptions. However, in many cases, these OV incidents were not detected by the companies’ metering systems, making it difficult to identify the root cause of the problem. This letter presents a field investigation showing the recognized EMC issue, highlighting how high PV penetration can lead to OV in the low-voltage distribution network. It also explains why the energy companies fail to detect OV. In addition, this letter provides insight into the PV inverter’s operation and protection in accordance with the IEC standard.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"7 4","pages":"118-122"},"PeriodicalIF":1.0,"publicationDate":"2025-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145824291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}