Juan J. Santaella;Safae El-Amrani;Antonio Illán;Pablo Padilla;Juan F. Valenzuela;David Boudikian;Mario F. Pantoja
{"title":"3-D Simulation of Conducted EMI for Automotive Lighting Systems","authors":"Juan J. Santaella;Safae El-Amrani;Antonio Illán;Pablo Padilla;Juan F. Valenzuela;David Boudikian;Mario F. Pantoja","doi":"10.1109/LEMCPA.2024.3495985","DOIUrl":null,"url":null,"abstract":"Full-wave simulations of lighting systems in the automotive industry remain as a computational challenge for electromagnetic compatibility (EMC) purposes. This is mainly due to the need to simulate complex nonlinear electronic systems in computationally large environments. In this letter, we present a numerical procedure that accurately predicts conducted electromagnetic interference (EMI) in such systems. This procedure is based on the concurrent use of electronic-electromagnetic solvers linked by multiple source ports characterized in terms of S- and Y-parameters. Numerical results are validated, using a feature-selective validation (FSV) algorithm, when confronted with measurements taken at the input terminals of the line impedance stabilization network (LISN). Further representation of currents on the main board demonstrates the unique ability of full-wave simulations to provide their physical distribution, a result of interest not only for EMC purposes but also for further structural and thermal validations.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"6 4","pages":"160-165"},"PeriodicalIF":0.9000,"publicationDate":"2024-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10750865/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Full-wave simulations of lighting systems in the automotive industry remain as a computational challenge for electromagnetic compatibility (EMC) purposes. This is mainly due to the need to simulate complex nonlinear electronic systems in computationally large environments. In this letter, we present a numerical procedure that accurately predicts conducted electromagnetic interference (EMI) in such systems. This procedure is based on the concurrent use of electronic-electromagnetic solvers linked by multiple source ports characterized in terms of S- and Y-parameters. Numerical results are validated, using a feature-selective validation (FSV) algorithm, when confronted with measurements taken at the input terminals of the line impedance stabilization network (LISN). Further representation of currents on the main board demonstrates the unique ability of full-wave simulations to provide their physical distribution, a result of interest not only for EMC purposes but also for further structural and thermal validations.