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Editorial Announcing the 2025 Transactions on Plasma Science Best Paper Award 宣布2025年等离子体科学学报最佳论文奖的社论
IF 1.5 4区 物理与天体物理
IEEE Transactions on Plasma Science Pub Date : 2025-09-16 DOI: 10.1109/TPS.2025.3588547
Edl Schamiloglu
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引用次数: 0
Lightweight Gesture Recognition Based on Depthwise Separable Convolution and FECAM Attention Mechanism for sEMG 基于深度可分离卷积和FECAM注意机制的表面肌电信号轻量手势识别
IF 4.3 2区 综合性期刊
IEEE Sensors Journal Pub Date : 2025-09-16 DOI: 10.1109/JSEN.2025.3608298
Haozhu Wang;Du Jiang;Juntong Yun;Li Huang;Yuanmin Xie;Baojia Chen;Meng Jia;Ying Sun
{"title":"Lightweight Gesture Recognition Based on Depthwise Separable Convolution and FECAM Attention Mechanism for sEMG","authors":"Haozhu Wang;Du Jiang;Juntong Yun;Li Huang;Yuanmin Xie;Baojia Chen;Meng Jia;Ying Sun","doi":"10.1109/JSEN.2025.3608298","DOIUrl":"https://doi.org/10.1109/JSEN.2025.3608298","url":null,"abstract":"Surface electromyography (sEMG) is a promising approach for noninvasive gesture recognition in human–computer interaction and rehabilitation. However, existing high-accuracy models often incur high-computational costs, thereby limiting real-time deployment. To address this, we propose FSGR-Net, a lightweight residual network that reconstructs ResNet50 using a small-convolution stacking strategy and a Lite-Fusion Block. The Lite-Fusion Block integrates depthwise separable convolution (DSC), ghost convolution (GC), and a channel compression–expansion mechanism to reduce redundancy. In particular, a frequency-enhanced channel attention mechanism (FECAM) is introduced after DSC layers to enhance discriminative features while mitigating the Gibbs phenomenon. Furthermore, a joint data augmentation strategy—time-shifting and masking—is applied to improve generalization. Evaluations on NinaPro DB1, DB5, and our SC-Myo datasets show that FSGR-Net achieves 93.17%, 87.83%, and 93.35% accuracy, respectively, with only 0.85 M parameters and 0.22 G FLOPs, demonstrating strong potential for deployment in mobile and low-power wearable systems.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 20","pages":"39273-39281"},"PeriodicalIF":4.3,"publicationDate":"2025-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145289547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Blank Page 空白页
IF 1.5 4区 物理与天体物理
IEEE Transactions on Plasma Science Pub Date : 2025-09-15 DOI: 10.1109/TPS.2025.3603438
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引用次数: 0
Special Issue on Pulsed Power Science and Technology 脉冲功率科学与技术专刊
IF 1.5 4区 物理与天体物理
IEEE Transactions on Plasma Science Pub Date : 2025-09-15 DOI: 10.1109/TPS.2025.3606770
{"title":"Special Issue on Pulsed Power Science and Technology","authors":"","doi":"10.1109/TPS.2025.3606770","DOIUrl":"https://doi.org/10.1109/TPS.2025.3606770","url":null,"abstract":"","PeriodicalId":450,"journal":{"name":"IEEE Transactions on Plasma Science","volume":"53 9","pages":"2513-2513"},"PeriodicalIF":1.5,"publicationDate":"2025-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11164932","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145059840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Deep Learning-Based Resolution Enhancement for Automotive SAR Images Under Limited Bandwidth Constraints 有限带宽条件下基于深度学习的汽车SAR图像分辨率增强
IF 4.3 2区 综合性期刊
IEEE Sensors Journal Pub Date : 2025-09-15 DOI: 10.1109/JSEN.2025.3607750
Heekwon Yoon;Soyoon Park;Seonmin Cho;Byungkwan Kim;Seongwook Lee
{"title":"Deep Learning-Based Resolution Enhancement for Automotive SAR Images Under Limited Bandwidth Constraints","authors":"Heekwon Yoon;Soyoon Park;Seonmin Cho;Byungkwan Kim;Seongwook Lee","doi":"10.1109/JSEN.2025.3607750","DOIUrl":"https://doi.org/10.1109/JSEN.2025.3607750","url":null,"abstract":"In this study, we propose a deep learning-based super-resolution network for reconstructing high-resolution (HR) synthetic aperture radar (SAR) images under bandwidth-limited conditions. In general, automotive SAR systems operate under strict bandwidth regulations, which impose a limitation on enhancing range resolution. To address this issue, we design a generative adversarial network (GAN)-based super-resolution method that enables HR image generation without hardware modifications. The proposed network adopts a GAN architecture consisting of a generator and a discriminator, and is trained to generalize across diverse environments using data collected with a TI AWR1642 radar. The training optimizes a combination of various losses to promote both structural fidelity and perceptual quality in generated SAR images. Through this approach, the proposed model achieves notable performance improvements. In particular, compared to the bicubic interpolation method, the proposed model increases the peak signal-to-noise ratio (PSNR) by 20.86 dB, improves the structural similarity index by 0.44, and reduces the learned perceptual image patch similarity (LPIPS) by 0.48. Moreover, in real-time autonomous driving scenarios, it maintains competitive performance against other GAN-variant models. In addition, the proposed super-resolution method reduces the half-power bandwidth (HPBW) by 82.39%, that reduction is 50.01%p greater than that achieved by the Unet baseline.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 20","pages":"39260-39272"},"PeriodicalIF":4.3,"publicationDate":"2025-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145290236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transactions on Plasma Science 等离子体科学汇刊
IF 1.5 4区 物理与天体物理
IEEE Transactions on Plasma Science Pub Date : 2025-09-15 DOI: 10.1109/TPS.2025.3603442
{"title":"Transactions on Plasma Science","authors":"","doi":"10.1109/TPS.2025.3603442","DOIUrl":"https://doi.org/10.1109/TPS.2025.3603442","url":null,"abstract":"","PeriodicalId":450,"journal":{"name":"IEEE Transactions on Plasma Science","volume":"53 9","pages":"C2-C2"},"PeriodicalIF":1.5,"publicationDate":"2025-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11164945","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145073302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Special Issue on Plenary, Invited, Workshop on Pulsed Power for Fusion from PPPS-2025 来自PPPS-2025的聚变脉冲功率研讨会全体会议特刊
IF 1.5 4区 物理与天体物理
IEEE Transactions on Plasma Science Pub Date : 2025-09-15 DOI: 10.1109/TPS.2025.3606772
{"title":"Special Issue on Plenary, Invited, Workshop on Pulsed Power for Fusion from PPPS-2025","authors":"","doi":"10.1109/TPS.2025.3606772","DOIUrl":"https://doi.org/10.1109/TPS.2025.3606772","url":null,"abstract":"","PeriodicalId":450,"journal":{"name":"IEEE Transactions on Plasma Science","volume":"53 9","pages":"2514-2514"},"PeriodicalIF":1.5,"publicationDate":"2025-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11165124","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145061884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Device and Materials Reliability Publication Information IEEE器件与材料可靠性学报
IF 2.3 3区 工程技术
IEEE Transactions on Device and Materials Reliability Pub Date : 2025-09-10 DOI: 10.1109/TDMR.2025.3603779
{"title":"IEEE Transactions on Device and Materials Reliability Publication Information","authors":"","doi":"10.1109/TDMR.2025.3603779","DOIUrl":"https://doi.org/10.1109/TDMR.2025.3603779","url":null,"abstract":"","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 3","pages":"C2-C2"},"PeriodicalIF":2.3,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11157723","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145050783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wide Band Gap Semiconductors for Automotive Applications 汽车用宽带隙半导体
IF 2.3 3区 工程技术
IEEE Transactions on Device and Materials Reliability Pub Date : 2025-09-10 DOI: 10.1109/TDMR.2025.3603929
{"title":"Wide Band Gap Semiconductors for Automotive Applications","authors":"","doi":"10.1109/TDMR.2025.3603929","DOIUrl":"https://doi.org/10.1109/TDMR.2025.3603929","url":null,"abstract":"","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 3","pages":"752-753"},"PeriodicalIF":2.3,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11157714","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145028012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Device and Materials Reliability Information for Authors IEEE器件与材料可靠性信息学报
IF 2.3 3区 工程技术
IEEE Transactions on Device and Materials Reliability Pub Date : 2025-09-10 DOI: 10.1109/TDMR.2025.3603780
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引用次数: 0
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