Journal of surface analysis (Online)最新文献

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We Are Digitally Connected. Is That Enough? 我们是数字化连接的。这就够了吗?
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.28.1
Hiroto Ito
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引用次数: 0
Eulogy to Hideo-san 致秀夫先生的悼词
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.27.129
Takashi Sekiguchi
{"title":"Eulogy to Hideo-san","authors":"Takashi Sekiguchi","doi":"10.1384/jsa.27.129","DOIUrl":"https://doi.org/10.1384/jsa.27.129","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Erratum to “Vocabulary Used in the Surface Analysis (Preliminary TASSA)” [J. Surf. Anal. 26, 260-268 (2020)] 《表面分析词汇表(初步TASSA)》的勘误[J]。冲浪。肛门。26,260-268 (2020)]
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.27.175
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引用次数: 0
Problems in XPS Surface Analysis Community Worldwide 全球XPS表面分析界存在的问题
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.27.148
B. Crist
{"title":"Problems in XPS Surface Analysis Community Worldwide","authors":"B. Crist","doi":"10.1384/jsa.27.148","DOIUrl":"https://doi.org/10.1384/jsa.27.148","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of the Material Sequencer for Automatic Various Evaluations 用于各种自动评定的物料定序仪的研制
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.28.35
S. Yagyu, M. Yoshitake, T. Nagata, T. Chikyow
{"title":"Development of the Material Sequencer for Automatic Various Evaluations","authors":"S. Yagyu, M. Yoshitake, T. Nagata, T. Chikyow","doi":"10.1384/jsa.28.35","DOIUrl":"https://doi.org/10.1384/jsa.28.35","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
International Standardization of S-SIMS Quantitative Analysis of Binary Organic Mixtures with Relative Sensitivity Factor Method S-SIMS定量分析二元有机混合物的国际标准化
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.28.20
A. Takano, A. Kurokawa, S. Aoyagi
{"title":"International Standardization of S-SIMS Quantitative Analysis of Binary Organic Mixtures with Relative Sensitivity Factor Method","authors":"A. Takano, A. Kurokawa, S. Aoyagi","doi":"10.1384/jsa.28.20","DOIUrl":"https://doi.org/10.1384/jsa.28.20","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655620","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In Memory of Late Hideo Iwai 纪念已故岩井俊夫
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.27.77
Takashi Sekiguchi
{"title":"In Memory of Late Hideo Iwai","authors":"Takashi Sekiguchi","doi":"10.1384/jsa.27.77","DOIUrl":"https://doi.org/10.1384/jsa.27.77","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"8 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
How to Write Beautiful Mathematical Formulas in “Word” 如何用“字”写出漂亮的数学公式
Journal of surface analysis (Online) Pub Date : 2021-01-01 DOI: 10.1384/jsa.27.111
Y. Harada, S. Tanuma
{"title":"How to Write Beautiful Mathematical Formulas in “Word”","authors":"Y. Harada, S. Tanuma","doi":"10.1384/jsa.27.111","DOIUrl":"https://doi.org/10.1384/jsa.27.111","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automatic Threshold Estimation from Photoelectron Yield Spectroscopy (PYS) - Automatic Estimation of Analysis Range by Residual Analysis - 光电子产率谱(PYS)的自动阈值估计。残差分析分析范围的自动估计
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/JSA.27.15
柳生 進二郎, 道子 吉武
{"title":"Automatic Threshold Estimation from Photoelectron Yield Spectroscopy (PYS) - Automatic Estimation of Analysis Range by Residual Analysis -","authors":"柳生 進二郎, 道子 吉武","doi":"10.1384/JSA.27.15","DOIUrl":"https://doi.org/10.1384/JSA.27.15","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":"15-21"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654775","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The Electronic Band Structure Evaluation of OLED Materials by Combination of LEIPS and UPS 结合LEIPS和UPS评价OLED材料的电子能带结构
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.27.34
M. Terashima, Takuya Miayayama, T. Shirao, H. Mo, Yasuhiro Hatae, H. Fujimoto, Katsumi Watanabe
{"title":"The Electronic Band Structure Evaluation of OLED Materials by Combination of LEIPS and UPS","authors":"M. Terashima, Takuya Miayayama, T. Shirao, H. Mo, Yasuhiro Hatae, H. Fujimoto, Katsumi Watanabe","doi":"10.1384/jsa.27.34","DOIUrl":"https://doi.org/10.1384/jsa.27.34","url":null,"abstract":"The electron affinity and ionization potential of OLED materials were evaluated using low energy inverse photoelectron spectroscopy (LEIPS) and ultraviolet photoelectron spectroscopy (UPS), which can be incorporated into a multi-technique X-ray Photoelectron Spectroscopy (XPS) system. The energy level of lowest unoccupied molecular orbital (LUMO) and highest occupied molecular orbital (HOMO) were estimated by LEIPS and UPS for three kinds of samples, i.e. CuPc (Cu phthalocyanine) thin film (10 nm) / ITO (indium tin oxide) film / glass substrate, C 60 thin film (10 nm) / Au film / ITO film / glass substrate, and α-NPD (Bis[N-(1-naphthyl)-N-phenyl]benzidine) thin film (10 nm) / ITO film / glass substrate, respectively. The band gap at the surface of the materials were determined by these levels. In addition, by utilizing Ar-gas cluster ion beam (Ar-GCIB), in-situ LEIPS and UPS depth profiling of interface of the multilayer","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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