M. Terashima, Takuya Miayayama, T. Shirao, H. Mo, Yasuhiro Hatae, H. Fujimoto, Katsumi Watanabe
{"title":"结合LEIPS和UPS评价OLED材料的电子能带结构","authors":"M. Terashima, Takuya Miayayama, T. Shirao, H. Mo, Yasuhiro Hatae, H. Fujimoto, Katsumi Watanabe","doi":"10.1384/jsa.27.34","DOIUrl":null,"url":null,"abstract":"The electron affinity and ionization potential of OLED materials were evaluated using low energy inverse photoelectron spectroscopy (LEIPS) and ultraviolet photoelectron spectroscopy (UPS), which can be incorporated into a multi-technique X-ray Photoelectron Spectroscopy (XPS) system. The energy level of lowest unoccupied molecular orbital (LUMO) and highest occupied molecular orbital (HOMO) were estimated by LEIPS and UPS for three kinds of samples, i.e. CuPc (Cu phthalocyanine) thin film (10 nm) / ITO (indium tin oxide) film / glass substrate, C 60 thin film (10 nm) / Au film / ITO film / glass substrate, and α-NPD (Bis[N-(1-naphthyl)-N-phenyl]benzidine) thin film (10 nm) / ITO film / glass substrate, respectively. The band gap at the surface of the materials were determined by these levels. In addition, by utilizing Ar-gas cluster ion beam (Ar-GCIB), in-situ LEIPS and UPS depth profiling of interface of the multilayer","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The Electronic Band Structure Evaluation of OLED Materials by Combination of LEIPS and UPS\",\"authors\":\"M. Terashima, Takuya Miayayama, T. Shirao, H. Mo, Yasuhiro Hatae, H. Fujimoto, Katsumi Watanabe\",\"doi\":\"10.1384/jsa.27.34\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The electron affinity and ionization potential of OLED materials were evaluated using low energy inverse photoelectron spectroscopy (LEIPS) and ultraviolet photoelectron spectroscopy (UPS), which can be incorporated into a multi-technique X-ray Photoelectron Spectroscopy (XPS) system. The energy level of lowest unoccupied molecular orbital (LUMO) and highest occupied molecular orbital (HOMO) were estimated by LEIPS and UPS for three kinds of samples, i.e. CuPc (Cu phthalocyanine) thin film (10 nm) / ITO (indium tin oxide) film / glass substrate, C 60 thin film (10 nm) / Au film / ITO film / glass substrate, and α-NPD (Bis[N-(1-naphthyl)-N-phenyl]benzidine) thin film (10 nm) / ITO film / glass substrate, respectively. The band gap at the surface of the materials were determined by these levels. In addition, by utilizing Ar-gas cluster ion beam (Ar-GCIB), in-situ LEIPS and UPS depth profiling of interface of the multilayer\",\"PeriodicalId\":90628,\"journal\":{\"name\":\"Journal of surface analysis (Online)\",\"volume\":\"1 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of surface analysis (Online)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1384/jsa.27.34\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of surface analysis (Online)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1384/jsa.27.34","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Electronic Band Structure Evaluation of OLED Materials by Combination of LEIPS and UPS
The electron affinity and ionization potential of OLED materials were evaluated using low energy inverse photoelectron spectroscopy (LEIPS) and ultraviolet photoelectron spectroscopy (UPS), which can be incorporated into a multi-technique X-ray Photoelectron Spectroscopy (XPS) system. The energy level of lowest unoccupied molecular orbital (LUMO) and highest occupied molecular orbital (HOMO) were estimated by LEIPS and UPS for three kinds of samples, i.e. CuPc (Cu phthalocyanine) thin film (10 nm) / ITO (indium tin oxide) film / glass substrate, C 60 thin film (10 nm) / Au film / ITO film / glass substrate, and α-NPD (Bis[N-(1-naphthyl)-N-phenyl]benzidine) thin film (10 nm) / ITO film / glass substrate, respectively. The band gap at the surface of the materials were determined by these levels. In addition, by utilizing Ar-gas cluster ion beam (Ar-GCIB), in-situ LEIPS and UPS depth profiling of interface of the multilayer
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