{"title":"Developing a Materials Curation® Support System","authors":"M. Yoshitake, Fumitaka Sato, Hiroyuki Kawano","doi":"10.1384/jsa.27.22","DOIUrl":"https://doi.org/10.1384/jsa.27.22","url":null,"abstract":"Materials Curation ® is a method to search materials by combining scientific principles in multi-disciplinary way proposed by one of the authors. This method utilizes relations among various material properties to overcome a problem that experimental or calculation data on materials in an issue are not enough at all for big-data type analysis in machine learning. For the interdisciplinary use of scientific principles, the authors have developed a prototype of materials curation support system. Examples of relations among material properties, the concept of database of relations and searching relations, and the construction of the system including the database and searching program are described.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Vocabulary Used in the Surface Analysis (preliminary TASSA)","authors":"","doi":"10.1384/jsa.26.260","DOIUrl":"https://doi.org/10.1384/jsa.26.260","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"27 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development of Atmospheric Pressure MeV-SIMS and Solid–Liquid Interface Analysis","authors":"T. Seki","doi":"10.1384/JSA.26.254","DOIUrl":"https://doi.org/10.1384/JSA.26.254","url":null,"abstract":"MeV-SIMS of for long we show the results of continuous SIMS measurement of benzoic acid solution on a Si substrate in a wet He environment for solid-liquid interface analysis.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Photoemission Electron Spectroscopy V: Novel Topics","authors":"J. D. Lee, T. Nagatomi, G. Mizutani","doi":"10.1384/jsa.18.36","DOIUrl":"https://doi.org/10.1384/jsa.18.36","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1384/jsa.18.36","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66651891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Oji, T. Murai, Y. Shibata, M. Tabuchi, Y. Watanabe, Y. Takeda
{"title":"Current Status of BL6N1 of AichiSR: a Tender X-ray Beamline for XAFS and Photoemission Spectroscopy","authors":"H. Oji, T. Murai, Y. Shibata, M. Tabuchi, Y. Watanabe, Y. Takeda","doi":"10.1384/JSA.26.228","DOIUrl":"https://doi.org/10.1384/JSA.26.228","url":null,"abstract":"Hiroshi Oji, Takaaki Murai, Yoshitaka Shibata, Masao Tabuchi, Yoshio Watanabe, and Yoshikazu Takeda 1 Synchrotron Radiation Research Center, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan 2 Aichi Synchrotron Radiation Center (AichiSR), Aichi Science & Technology Foundation, 250-3 Minamiyamaguchi-cho, Seto 489-0965, Japan 3 Aichi Center for Industry and Science Technology 1267-1 Akiai, Yakusa-cho, Toyota 470-0356, Japan *h.oji@nusr.nagoya-u.ac.jp","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Surface Analysis Society of Japan for Reliability Improvement and Standardization","authors":"H. Makino","doi":"10.1384/jsa.27.1","DOIUrl":"https://doi.org/10.1384/jsa.27.1","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"In-situ Observations of Reactions with Environmental Transmission Electron Microscopy","authors":"Kawasaki Tadahiro","doi":"10.1384/JSA.26.245","DOIUrl":"https://doi.org/10.1384/JSA.26.245","url":null,"abstract":"ETEM is a dynamic observation technique based on transmission electron microscopy (TEM). In normal TEMs, specimens are set under vacuum condition because electron scattering by air molecules must be minimized. In contrast, ETEM enables to observe specimens immersed in gas or liquid environments. Therefore, ETEM can reveal nature of materials under the conditions in which they are formed or utilized, for example, catalysts in gas, battery electrodes in liquid electrolyte, and so on. This paper describes principles and features of two types of the ETEM, and also demonstrates effectiveness of this technique by introducing application results on gas reaction of gold nanoparticulate catalyst and high-resolution imaging in liquid environment.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Surface Analysis of a 28Si-enriched Sphere for a New Kilogram Definition","authors":"Lulu Zhang","doi":"10.1384/jsa.27.2","DOIUrl":"https://doi.org/10.1384/jsa.27.2","url":null,"abstract":"The new definition of the International System of Units (SI) of the kilogram based on a fixed numerical value of the Planck constant, one of the fundamental physical constants, came into force on May 20, 2019. AIST has measured the Planck constant with world’s highest level of precision and contributed substantially to the new definition of the kilogram by X-ray crystal density (XRCD) method with Si-enriched spheres. In an accurate determination of the Planck constant by the XRCD method, the surface characterization of the Si sphere is indispensable. We measured the composition and the thicknesses of the oxide and carbonaceous layer existing on the Si sphere surface by X-ray photoelectron spectroscopy (XPS) and succeeded in reducing the uncertainty caused by the surface layer in the determination of the Planck constant. This paper describes an accurate thickness measurement of the surface layer on a Si-enriched sphere using XPS.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}