Journal of surface analysis (Online)最新文献

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光電子収量分光(PYS)スペクトルからの自動閾値推定 -残差分析による自動分析範囲の推定- 根据光电子产量光谱(PYS)光谱估计自动阈值-通过残差分析估计自动分析范围-
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/JSA/27.15
柳生 進二郎, 道子 吉武
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引用次数: 0
Developing a Materials Curation® Support System 开发材料管理®支持系统
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.27.22
M. Yoshitake, Fumitaka Sato, Hiroyuki Kawano
{"title":"Developing a Materials Curation® Support System","authors":"M. Yoshitake, Fumitaka Sato, Hiroyuki Kawano","doi":"10.1384/jsa.27.22","DOIUrl":"https://doi.org/10.1384/jsa.27.22","url":null,"abstract":"Materials Curation ® is a method to search materials by combining scientific principles in multi-disciplinary way proposed by one of the authors. This method utilizes relations among various material properties to overcome a problem that experimental or calculation data on materials in an issue are not enough at all for big-data type analysis in machine learning. For the interdisciplinary use of scientific principles, the authors have developed a prototype of materials curation support system. Examples of relations among material properties, the concept of database of relations and searching relations, and the construction of the system including the database and searching program are described.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Vocabulary Used in the Surface Analysis (preliminary TASSA) 表面分析中使用的词汇(初步TASSA)
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.26.260
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引用次数: 0
Development of Atmospheric Pressure MeV-SIMS and Solid–Liquid Interface Analysis 大气压MeV-SIMS及固液界面分析的发展
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/JSA.26.254
T. Seki
{"title":"Development of Atmospheric Pressure MeV-SIMS and Solid–Liquid Interface Analysis","authors":"T. Seki","doi":"10.1384/JSA.26.254","DOIUrl":"https://doi.org/10.1384/JSA.26.254","url":null,"abstract":"MeV-SIMS of for long we show the results of continuous SIMS measurement of benzoic acid solution on a Si substrate in a wet He environment for solid-liquid interface analysis.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
表面化学分析に関わる用語解説(TASSA のたまご) 第 7 回 表面化学分析相关术语讲解(TASSA之卵)第7期
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.27.46
標準化活動部会
{"title":"表面化学分析に関わる用語解説(TASSA のたまご) 第 7 回","authors":"標準化活動部会","doi":"10.1384/jsa.27.46","DOIUrl":"https://doi.org/10.1384/jsa.27.46","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Photoemission Electron Spectroscopy V: Novel Topics 光电子能谱学V:新课题
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.18.36
J. D. Lee, T. Nagatomi, G. Mizutani
{"title":"Photoemission Electron Spectroscopy V: Novel Topics","authors":"J. D. Lee, T. Nagatomi, G. Mizutani","doi":"10.1384/jsa.18.36","DOIUrl":"https://doi.org/10.1384/jsa.18.36","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1384/jsa.18.36","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66651891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Current Status of BL6N1 of AichiSR: a Tender X-ray Beamline for XAFS and Photoemission Spectroscopy AichiSR BL6N1的现状:用于XAFS和光电发射光谱的柔顺x射线束线
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/JSA.26.228
H. Oji, T. Murai, Y. Shibata, M. Tabuchi, Y. Watanabe, Y. Takeda
{"title":"Current Status of BL6N1 of AichiSR: a Tender X-ray Beamline for XAFS and Photoemission Spectroscopy","authors":"H. Oji, T. Murai, Y. Shibata, M. Tabuchi, Y. Watanabe, Y. Takeda","doi":"10.1384/JSA.26.228","DOIUrl":"https://doi.org/10.1384/JSA.26.228","url":null,"abstract":"Hiroshi Oji, Takaaki Murai, Yoshitaka Shibata, Masao Tabuchi, Yoshio Watanabe, and Yoshikazu Takeda 1 Synchrotron Radiation Research Center, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan 2 Aichi Synchrotron Radiation Center (AichiSR), Aichi Science & Technology Foundation, 250-3 Minamiyamaguchi-cho, Seto 489-0965, Japan 3 Aichi Center for Industry and Science Technology 1267-1 Akiai, Yakusa-cho, Toyota 470-0356, Japan *h.oji@nusr.nagoya-u.ac.jp","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Surface Analysis Society of Japan for Reliability Improvement and Standardization 日本表面分析可靠性改进与标准化学会
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.27.1
H. Makino
{"title":"Surface Analysis Society of Japan for Reliability Improvement and Standardization","authors":"H. Makino","doi":"10.1384/jsa.27.1","DOIUrl":"https://doi.org/10.1384/jsa.27.1","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66655130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In-situ Observations of Reactions with Environmental Transmission Electron Microscopy 环境透射电镜对反应的原位观察
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/JSA.26.245
Kawasaki Tadahiro
{"title":"In-situ Observations of Reactions with Environmental Transmission Electron Microscopy","authors":"Kawasaki Tadahiro","doi":"10.1384/JSA.26.245","DOIUrl":"https://doi.org/10.1384/JSA.26.245","url":null,"abstract":"ETEM is a dynamic observation technique based on transmission electron microscopy (TEM). In normal TEMs, specimens are set under vacuum condition because electron scattering by air molecules must be minimized. In contrast, ETEM enables to observe specimens immersed in gas or liquid environments. Therefore, ETEM can reveal nature of materials under the conditions in which they are formed or utilized, for example, catalysts in gas, battery electrodes in liquid electrolyte, and so on. This paper describes principles and features of two types of the ETEM, and also demonstrates effectiveness of this technique by introducing application results on gas reaction of gold nanoparticulate catalyst and high-resolution imaging in liquid environment.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Surface Analysis of a 28Si-enriched Sphere for a New Kilogram Definition 新千克定义下富28si球的表面分析
Journal of surface analysis (Online) Pub Date : 2020-01-01 DOI: 10.1384/jsa.27.2
Lulu Zhang
{"title":"Surface Analysis of a 28Si-enriched Sphere for a New Kilogram Definition","authors":"Lulu Zhang","doi":"10.1384/jsa.27.2","DOIUrl":"https://doi.org/10.1384/jsa.27.2","url":null,"abstract":"The new definition of the International System of Units (SI) of the kilogram based on a fixed numerical value of the Planck constant, one of the fundamental physical constants, came into force on May 20, 2019. AIST has measured the Planck constant with world’s highest level of precision and contributed substantially to the new definition of the kilogram by X-ray crystal density (XRCD) method with Si-enriched spheres. In an accurate determination of the Planck constant by the XRCD method, the surface characterization of the Si sphere is indispensable. We measured the composition and the thicknesses of the oxide and carbonaceous layer existing on the Si sphere surface by X-ray photoelectron spectroscopy (XPS) and succeeded in reducing the uncertainty caused by the surface layer in the determination of the Planck constant. This paper describes an accurate thickness measurement of the surface layer on a Si-enriched sphere using XPS.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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