Saif Taqy,Ayesha Tasnim,Istiaq F. Shiam,Dhanu Chettri,Ariful Haque
{"title":"p- and n-Type doping of AlN: Current challenges, emerging solutions, and device applications","authors":"Saif Taqy,Ayesha Tasnim,Istiaq F. Shiam,Dhanu Chettri,Ariful Haque","doi":"10.1063/5.0330815","DOIUrl":"https://doi.org/10.1063/5.0330815","url":null,"abstract":"Ultrawide bandgap aluminum nitride (AlN) has recently gained significant attention for high-power electronics and deep-ultraviolet (DUV) optoelectronics applications owing to its exceptionally large and direct bandgap, high breakdown field, and thermal and chemical stability. While these intrinsic properties promise substantial performance improvements over silicon (Si), silicon carbide (SiC), gallium nitride (GaN), gallium oxide (Ga2O3), and diamond devices, the core challenge lies in achieving a reliable n- and p-type doping due to deep impurity levels, carrier compensation, and native defect formation. This review is motivated by the urgent need to bridge fundamental doping science with device engineering to unlock the full potential of AlN in high-power devices and solar-blind DUV devices. We discuss a clear roadmap, beginning with a contextual overview of wide- and ultrawide bandgap semiconductors, highlighting why AlN stands out for high-power applications. The body of the review is structured into four core sections, starting with n-type doping techniques, covering silicon, oxygen, and germanium donors, compensation effects, and deep-level centers. Then, the challenges and progress in p-type doping are discussed, evaluating acceptor species (e.g., Mg, Be, C), co-doping schemes, and impurity-band engineering. Section IV focuses on different doping methods, including metal-organic chemical vapor deposition, molecular-beam epitaxy, metal-modulated epitaxy, ion implantation, and polarization doping, and their role in defect control and non-equilibrium activation. Section V presents how these material innovations translate to device prototypes, including Schottky diodes, polarization-doped field effect transistors, and deep-UV emitters, illustrating gradual improvements in the current technology. The review concludes with existing challenges and prospects of AlN, including vacancy-engineered contacts, scalable single-crystal substrates, co-doping strategies, and emerging device architectures that could yield reliable bipolar conductivity and practical AlN-based power electronics. By discussing critical components in theory, fundamental growth science, and device-level demonstrations of AlN, this review aims to serve as a comprehensive guide for researchers and engineers seeking to position AlN as a foundational material for next-generation power and optoelectronic systems.","PeriodicalId":8200,"journal":{"name":"Applied physics reviews","volume":"14 1","pages":""},"PeriodicalIF":15.0,"publicationDate":"2026-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149090058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mohamed Shehabeldin,Xuguo Zhou,Ran Li,Pablo Jarillo-Herrero,Yuxuan Cosmi Lin,Jian Tang,Qiong Ma
{"title":"Light-controlled van der Waals tunnel junctions: Mechanisms, architectures, functionalities, and opportunities","authors":"Mohamed Shehabeldin,Xuguo Zhou,Ran Li,Pablo Jarillo-Herrero,Yuxuan Cosmi Lin,Jian Tang,Qiong Ma","doi":"10.1063/5.0337456","DOIUrl":"https://doi.org/10.1063/5.0337456","url":null,"abstract":"The phenomenon of electron tunneling has long been central to quantum transport and continues to provide a powerful framework for understanding and controlling electronic processes in solids. When combined with optical excitation, tunneling becomes a particularly rich platform for experiments, because light can drive nonequilibrium carrier populations and open transport pathways that are inaccessible without optical excitation. The emergence of van der Waals (vdW) materials has greatly expanded this opportunity by enabling atomically thin heterostructures with clean interfaces, engineered barriers, and highly tunable band alignment. In this review, we discuss the fundamental mechanisms of photo-assisted transport and the realization of vdW tunnel junctions and show how they provide electrical access to nonequilibrium dynamics and collective excitations in quantum materials. We further examine emerging functionalities including photodetection, tunneling-driven light emission, sensing, and memory. Finally, we present a forward-looking perspective on new opportunities such as quantum-geometric probes, twist-resolved spectroscopy, moiré ferroelectricity, and scalable architectures for computing and sensing.","PeriodicalId":8200,"journal":{"name":"Applied physics reviews","volume":"37 1","pages":""},"PeriodicalIF":15.0,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149090005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Unraveling the defect physics of SiC micropipe sidewalls by non-line-of-sight confocal spectromicroscopy: Amphoteric giant traps","authors":"Irwan Saleh Kurniawan,Russel Cruz Sevilla,Ruth Jeane Soebroto,Hsiu-Ying Huang,Ji-Lin Shen,Sheng Hsiung Chang,Wen-Chung Li,Chi-Tsu Yuan","doi":"10.1063/5.0350159","DOIUrl":"https://doi.org/10.1063/5.0350159","url":null,"abstract":"Despite substantial advances in SiC crystal growth, micropipes can still occur in thick and large-diameter SiC wafers, remaining among the most detrimental extended defects associated with device failure. However, the microscopic nature of the defects residing on their internal sidewalls and their contribution to the leakage current remain poorly understood because the high-aspect-ratio hollow geometry severely restricts direct, nondestructive optical access. Here, we develop a non-line-of-sight confocal multiple-reflection spectromicroscopy combined with direct defect photoionization to unravel the underlying defect physics of micropipe sidewalls. We show that the internal sidewalls host a high density of spatially and energetically distributed donor-like and acceptor-like deep-level states, thus giving rise to ultrabroad defect emissions comprising inherent donor–acceptor-pair-like (DAP-like) recombination and detrapping-mediated free-to-bound transitions. The dominant DAP-like emissions can be attributed to rapid carrier capture by the sidewall defects, as evidenced by a fast rise, nanosecond-scale decay, and coupled carrier kinetics. These results suggest that micropipe sidewalls can serve as extended amphoteric giant traps and carrier reservoirs, providing preferential leakage pathways through trap-assisted carrier transport along the internal sidewalls. Our work establishes a nondestructive optical technique for directly probing high-aspect-ratio extended defects and provides mechanistic insight into their defect physics and associated leakage mechanisms.","PeriodicalId":8200,"journal":{"name":"Applied physics reviews","volume":"15 1","pages":""},"PeriodicalIF":15.0,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149090006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}