{"title":"Thickness-driven evolution of optical transitions and dielectric function in few-layer MoS2","authors":"Premlata Yadav,Budhi Singh,Chandrabhan Dohare,Nayana Devaraj,Varun Gupta,Kartick Tarafder,Subhasis Ghosh","doi":"10.1063/5.0354897","DOIUrl":"https://doi.org/10.1063/5.0354897","url":null,"abstract":"MoS2 film thickness strongly influences light absorption and interaction, impacting its performance in layered optoelectronic devices. Earlier studies have mostly examined the optical features, dielectric response, and electronic structure separately, especially for large-area films grown by chemical vapor deposition (CVD). Here, we bring these together and follow how they evolve as CVD-grown MoS2 changes from bilayer to bulk-like thickness (1.32–5.14 nm), using UV–visible absorption, Raman spectroscopy, spectroscopic ellipsometry, and first-principles calculations. We resolve six optical transitions (A–F) between 1.7 and 5.5 eV. The A and B excitons come from spin–orbit-split valence bands at the K/K′ valleys, while the higher-energy C–F transitions arise from band-nesting and interband processes at several critical points. As the films thicken, the transitions broaden and shift, reflecting stronger interlayer coupling and dielectric screening, and the Raman mode separation tracks changes in the optical bandgap. Our calculations reproduce the overall ordering and thickness trends of the measured transitions and identify their origin in the band structure.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"7 1","pages":""},"PeriodicalIF":4.0,"publicationDate":"2026-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149089889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sunhyuk Lim,Dohyung Lee,Sungjune Jung,Hyunjin Park,Wooseok Song
{"title":"Deterministic selector–memristor mode switching in SnSe-based devices\u0000 via\u0000 ultraviolet-mediated interface engineering","authors":"Sunhyuk Lim,Dohyung Lee,Sungjune Jung,Hyunjin Park,Wooseok Song","doi":"10.1063/5.0353240","DOIUrl":"https://doi.org/10.1063/5.0353240","url":null,"abstract":"Resistive switching devices are promising candidates for high-density memory and in-memory computing applications, but sneak-path leakage in crossbar arrays requires selector elements with strong nonlinearity. Here, we demonstrate deterministic switching-mode selection in solution-processed SnSe-based Al/AlOx/SnSe/Ag devices via ultraviolet-mediated interface engineering (UIE). By varying only the UIE time (tUIE) of the Al bottom electrode, the interfacial oxidation state was elaborately manipulated, as manifested by contact angle measurements and comprehensive spectro-microscopic surveys entailing x-ray photoelectron spectroscopy and cross-sectional scanning transmission electron microscopy observations. The pristine device (tUIE = 0 min) exhibited stable memristor operation with nonvolatile resistive switching, whereas the moderately oxidized device (tUIE = 10 min) showed selector operation with volatile threshold switching and a nonlinearity of approximately 2.25 × 103. In contrast, the excessively oxidized devices (tUIE = 20 min) revealed breakdown-like irreversible high-conductance behavior, which signals the existence of an optimized interfacial oxidation window for switching-mode control. These results propose newly devised UIE as a straightforward and indisputable strategy for deterministic selector–memristor mode control within a common SnSe-based device platform.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"228 1","pages":""},"PeriodicalIF":4.0,"publicationDate":"2026-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149089894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}