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Advances in x-ray analysis最新文献

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Development of μ-Fluorescent and Diffracted X-Ray Spectrometer with a Fine Focused X-Ray Beam and its Application for Ulsi Microanalysis 精细聚焦型μ荧光衍射x射线光谱仪的研制及其在微量硅分析中的应用
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022564
N. Yamamoto
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引用次数: 4
Peritectic Melting Sequence of Bi-2212 and Bi-2212/Ag Measured Using Insitu XRD 用原位XRD测定Bi-2212和Bi-2212/Ag的包晶熔化顺序
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002317X
S. Misture, D. Mathers, R. Snyder, T. Blanton, G. M. Zom, B. Seebacher
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引用次数: 0
Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples 刚玉板和粉末样品的x射线粉末衍射循环试验结果
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022990
V. Valvoda, D. Rafaja, R. Jenkins
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引用次数: 0
Recent Developments in Txrf of Light Elements 轻元素Txrf的最新进展
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023235
C. Streli, V. Bauer, P. Wobrauschek
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引用次数: 5
The Excitation of Low Z Elements by Means of a Cylindrical Graded Multilayer as a High Energy Cut-Off in Edxrf Analysis 在Edxrf分析中用圆柱形渐变多层层作为高能截止点激发低Z元素
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022527
B. Kanngießer, B. Beckhoff
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引用次数: 4
X-Ray Point Focusing Using Cylindrically Bent Crystals with Modulated Structures for Synchrotron X-Ray Beams 利用具有调制结构的圆柱形弯曲晶体聚焦同步加速器x射线束
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022503
W. Chang, F. Chukhovskii, E. Förster
{"title":"X-Ray Point Focusing Using Cylindrically Bent Crystals with Modulated Structures for Synchrotron X-Ray Beams","authors":"W. Chang, F. Chukhovskii, E. Förster","doi":"10.1154/S0376030800022503","DOIUrl":"https://doi.org/10.1154/S0376030800022503","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"2 1","pages":"103-107"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76934721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate 晶体衬底生长有机薄膜外延的能量色散掠入射x射线衍射研究
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023090
K. Ishida, A. Kita, K. Hayashi, T. Horiuchi, S. Kal, K. Matsushige
{"title":"Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate","authors":"K. Ishida, A. Kita, K. Hayashi, T. Horiuchi, S. Kal, K. Matsushige","doi":"10.1154/S0376030800023090","DOIUrl":"https://doi.org/10.1154/S0376030800023090","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"21 9","pages":"659-664"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72616465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Software for Comparative Analysis of Diffraction-Line Broadening 衍射在线展宽比较分析软件
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022874
D. Balzar, H. Ledbetter
{"title":"Software for Comparative Analysis of Diffraction-Line Broadening","authors":"D. Balzar, H. Ledbetter","doi":"10.1154/S0376030800022874","DOIUrl":"https://doi.org/10.1154/S0376030800022874","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"40 1","pages":"457-464"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74685430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite Al2O3/SiC(w)复合材料表面和抛光表面的残余应力深度分布
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022783
X. Zhu, P. Predecki, M. Eatough, R. Goebner
{"title":"Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite","authors":"X. Zhu, P. Predecki, M. Eatough, R. Goebner","doi":"10.1154/S0376030800022783","DOIUrl":"https://doi.org/10.1154/S0376030800022783","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"7 1","pages":"371-380"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73144882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method 利用x射线粉末衍射数据和Rietveld方法改进高密度聚乙烯的结构
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022941
K. B. Schwartz, R. Dreele
{"title":"Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method","authors":"K. B. Schwartz, R. Dreele","doi":"10.1154/S0376030800022941","DOIUrl":"https://doi.org/10.1154/S0376030800022941","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"11 1","pages":"515-521"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88738187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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