S. Misture, D. Mathers, R. Snyder, T. Blanton, G. M. Zom, B. Seebacher
{"title":"Peritectic Melting Sequence of Bi-2212 and Bi-2212/Ag Measured Using Insitu XRD","authors":"S. Misture, D. Mathers, R. Snyder, T. Blanton, G. M. Zom, B. Seebacher","doi":"10.1154/S037603080002317X","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"9 1","pages":"723-729"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in x-ray analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1154/S037603080002317X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}