{"title":"News on 2023 IEEE International Symposium on EMC+SIPI in Grand Rapids, Michigan","authors":"","doi":"10.1109/memc.2022.9982558","DOIUrl":"https://doi.org/10.1109/memc.2022.9982558","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Scenes from the 2022 IEEE International Symposium on Electromagnetic Compatibility (EMC), Signal and Power Integrity (SIPI) in Spokane, Washington, August 1-5","authors":"","doi":"10.1109/memc.2022.9982562","DOIUrl":"https://doi.org/10.1109/memc.2022.9982562","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"STANDARDS WEEK 2022: Standards Activities at the EMC+SIPI Symposium in Spokane, Washington","authors":"E. Hare, R. Carlton","doi":"10.1109/memc.2022.9982568","DOIUrl":"https://doi.org/10.1109/memc.2022.9982568","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Announcing the “Ask The Experts” Panels at the 2022 IEEE International Symposium on EMC+SIPI in Spokane, Washington","authors":"F. Leferink","doi":"10.1109/memc.2022.9780299","DOIUrl":"https://doi.org/10.1109/memc.2022.9780299","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The John Howard Memorial EMC Education Grant Call for Proposals","authors":"","doi":"10.1109/memc.2022.10058854","DOIUrl":"https://doi.org/10.1109/memc.2022.10058854","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Computational Intelligence Based Selection and Placement of Decoupling Capacitors: A Comparative Study","authors":"Surendra Hemaram, J. N. Tripathi","doi":"10.1109/MEMC.2022.9873812","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9873812","url":null,"abstract":"In high-speed VLSI systems, decoupling capacitors are the key components to minimize power supply noise in power delivery networks. For efficiently maintaining power integrity in these systems, optimal selection and placement of decoupling capacitors is necessary. This paper presents a computational intelligence based generic framework to solve the industrial problem of decoupling capacitor optimization in a practical power delivery network using metaheuristic algorithms. The cumulative impedance of a power delivery network is minimized below the target impedance by optimal selection and placement of decoupling capacitors using the state-of-the-art metaheuristic algorithms. A comparative analysis of the performance of these algorithms is presented with the insights of practical implementation.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"49-59"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488832","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"2022 EMC+SIPI Symposium: Clayton R. Paul Global University Announced","authors":"","doi":"10.1109/memc.2022.9780337","DOIUrl":"https://doi.org/10.1109/memc.2022.9780337","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Practical papers, articles and application notes","authors":"K. See","doi":"10.1109/MEMC.2022.9873814","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9873814","url":null,"abstract":"RF receivers for airborne applications are critical systems for wireless signal reception and processing. Any unwanted interfering signals received by the receiver have a direct impact on the quality of the intended signals. The first paper, “Improved Complex Receiver System Design Strategies to Overcome EMI/EMC Challenges,” describes the strategies and implementation techniques for a complex receiver system design to meet environmental stress screening (ESS) requirements, especially EMC. The proposed design methodology segregates the various modules and stacks them together tactfully without compromising EMC. By applying these techniques, an actual design with four modules is demonstrated and tested for EMC compliance over an extreme temperature range from -40°C to +71°C.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"3 1","pages":"37-37"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Serra, G. Gradoni, G. Andrieu, V. M. Primiani, M. Magdowski, O. Legrand, M. Ahmed
{"title":"Reverberation Chambers at the Edge of Chaos: Discussion Forum at EMC Europe 2020","authors":"R. Serra, G. Gradoni, G. Andrieu, V. M. Primiani, M. Magdowski, O. Legrand, M. Ahmed","doi":"10.1109/memc.2022.9780346","DOIUrl":"https://doi.org/10.1109/memc.2022.9780346","url":null,"abstract":"Reverberation chambers (RCs) have served yet another purpose, though, this time, a not-so-technical one. At EMC Europe 2020 in Roma, Italy, an open debate has been carried out on some disputing arguments regarding RCs. This debate focused on a (apparent?) confrontation between the “traditional” RCs and the “chaotic” RCs. The fruitful debate inspired, in a novel way, intriguing and captivating comments on the nature, the uses and applications of RCs. The reader will find that there are several topics on which the debaters still disagree. Most probably, the reader him/herself would have a divergent opinion on some of the topics detailed in this paper. These divergences should not represent any major issue but, on the contrary, they should make research even more interesting by acknowledging and reflecting on the exciting complexity of the learning process. This is a rather unusual paper which briefly reports on the main topics and arguments covered during the debate. Furthermore, and perhaps more interestingly, it also reflects on the importance of scientific debates, conversations and exchange of ideas which were experienced during such discussion forum.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"73-88"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}