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IEEE Women in Engineering IEEE工程女性
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9982539
Mariya Antyufeyeva
{"title":"IEEE Women in Engineering","authors":"Mariya Antyufeyeva","doi":"10.1109/memc.2022.9982539","DOIUrl":"https://doi.org/10.1109/memc.2022.9982539","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488919","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2022 “Standards Week” Tutorials at Annual Symposium 2022年“标准周”年度研讨会辅导
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780342
{"title":"2022 “Standards Week” Tutorials at Annual Symposium","authors":"","doi":"10.1109/memc.2022.9780342","DOIUrl":"https://doi.org/10.1109/memc.2022.9780342","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Young Professionals EMC — Get Ready to Meet In Person in Spokane! 年轻的专业人士EMC -准备在斯波坎亲自见面!
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780283
Patrick DeRoy
{"title":"Young Professionals EMC — Get Ready to Meet In Person in Spokane!","authors":"Patrick DeRoy","doi":"10.1109/memc.2022.9780283","DOIUrl":"https://doi.org/10.1109/memc.2022.9780283","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Call for EMC Society Awards Nominations: Nominations Due: February 15, 2023 EMC协会奖提名征集:提名截止日期:2023年2月15日
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9982574
Flavia Grassi
{"title":"Call for EMC Society Awards Nominations: Nominations Due: February 15, 2023","authors":"Flavia Grassi","doi":"10.1109/memc.2022.9982574","DOIUrl":"https://doi.org/10.1109/memc.2022.9982574","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IBIS Update: 2022 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) IBIS更新:2022年IEEE电磁兼容性、信号和电源完整性国际研讨会(EMC+SIPI)
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9982579
Randy Wolff, Zhiping Yang
{"title":"IBIS Update: 2022 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","authors":"Randy Wolff, Zhiping Yang","doi":"10.1109/memc.2022.9982579","DOIUrl":"https://doi.org/10.1109/memc.2022.9982579","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"9 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment 利用电子设备泄漏电磁波恢复图像信息的新趋势
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/MEMC.2022.9982567
D. Choi, Euibum Lee, Taesik Nam, J. Yook
{"title":"Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment","authors":"D. Choi, Euibum Lee, Taesik Nam, J. Yook","doi":"10.1109/MEMC.2022.9982567","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9982567","url":null,"abstract":"Information input/output technology has been employed in various fields in our modern lives, and it is almost impossible for society to function without the devices based on this technology. Therefore, security issues associated with such electronic devices have attracted extensive attention. This study thoroughly reviews various TEMPEST-related research outcomes and trends. It contains both conventional and deep learning-based image processing techniques and research involving realistic scenarios, including concrete walls, information recovery under multiple devices, and reconstruction of color information.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"77-83"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs 基于pcb上电磁场分布测量的安全性和EMC同步评估
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/MEMC.2022.9982569
Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi
{"title":"Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs","authors":"Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi","doi":"10.1109/MEMC.2022.9982569","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9982569","url":null,"abstract":"This article introduces a method to simultaneously evaluate the security and electromagnetic compatibility (EMC) of information devices equipped with cryptographic modules by measuring the electromagnetic (EM) field distribution on a printed circuit board (PCB). The proposed method requires a single correlation analysis above the cryptographic integrated circuit (IC) to define the frequency band of the EM field containing the secret information. Then, focusing on the radiation intensity in the frequency domain, an efficient method capable of obtaining the EM field distribution that contributes to the leakage of confidential information is proposed. Simultaneous EMC and security evaluations can be conducted by analyzing the obtained EM field distribution. Using the proposed method, EM field radiation and information leakage of an actual cryptographic device are analyzed. Compared to conventional methods requiring a large computational resource and analysis time, the proposed method can efficiently obtain the distribution of electric and magnetic fields that cause leakage of confidential information. Lastly, discussion, design guide, and future research directions are briefly provided.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"84-92"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Signal Integrity and Power Integrity 信号完整性和电源完整性
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780310
Zhiping Yang
{"title":"Signal Integrity and Power Integrity","authors":"Zhiping Yang","doi":"10.1109/memc.2022.9780310","DOIUrl":"https://doi.org/10.1109/memc.2022.9780310","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EMC Society Podcasts Featuring Industry Luminaries EMC协会播客以行业名人为特色
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9873826
{"title":"EMC Society Podcasts Featuring Industry Luminaries","authors":"","doi":"10.1109/memc.2022.9873826","DOIUrl":"https://doi.org/10.1109/memc.2022.9873826","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New Credential Program at iNARTE iNARTE的新证书课程
IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780305
Christian Thornton
{"title":"New Credential Program at iNARTE","authors":"Christian Thornton","doi":"10.1109/memc.2022.9780305","DOIUrl":"https://doi.org/10.1109/memc.2022.9780305","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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