IEEE electromagnetic compatibility magazine最新文献_第10页

Call for EMC Society Awards Nominations: Nominations Due: February 15, 2023 EMC协会奖提名征集:提名截止日期:2023年2月15日

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9982574

Flavia Grassi

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IBIS Update: 2022 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) IBIS更新:2022年IEEE电磁兼容性、信号和电源完整性国际研讨会(EMC+SIPI)

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9982579

Randy Wolff, Zhiping Yang

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Signal Integrity and Power Integrity 信号完整性和电源完整性

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780310

Zhiping Yang

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EMC Society Podcasts Featuring Industry Luminaries EMC协会播客以行业名人为特色

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9873826

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Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment 利用电子设备泄漏电磁波恢复图像信息的新趋势

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/MEMC.2022.9982567

D. Choi, Euibum Lee, Taesik Nam, J. Yook

引用次数: 1

Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs 基于pcb上电磁场分布测量的安全性和EMC同步评估

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/MEMC.2022.9982569

Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi

{"title":"Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs","authors":"Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi","doi":"10.1109/MEMC.2022.9982569","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9982569","url":null,"abstract":"This article introduces a method to simultaneously evaluate the security and electromagnetic compatibility (EMC) of information devices equipped with cryptographic modules by measuring the electromagnetic (EM) field distribution on a printed circuit board (PCB). The proposed method requires a single correlation analysis above the cryptographic integrated circuit (IC) to define the frequency band of the EM field containing the secret information. Then, focusing on the radiation intensity in the frequency domain, an efficient method capable of obtaining the EM field distribution that contributes to the leakage of confidential information is proposed. Simultaneous EMC and security evaluations can be conducted by analyzing the obtained EM field distribution. Using the proposed method, EM field radiation and information leakage of an actual cryptographic device are analyzed. Compared to conventional methods requiring a large computational resource and analysis time, the proposed method can efficiently obtain the distribution of electric and magnetic fields that cause leakage of confidential information. Lastly, discussion, design guide, and future research directions are briefly provided.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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New Credential Program at iNARTE iNARTE的新证书课程

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780305

Christian Thornton

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Vulnerability Assessment Method for Electronic Devices Excited by Transient Electromagnetic Disturbances 瞬变电磁干扰下电子器件易损性评估方法

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/MEMC.2022.10058843

Yu-hao Chen, Kejie Li, Zongyang Wang, Yi Zhou, Yan-zhao Xie

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What's New with IBIS and Upcoming Opportunities for SI and PI Engineers to Learn More IBIS的最新动态以及SI和PI工程师了解更多信息的机会

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780308

Randy Wolff

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Analysis of Several Electromagnetic Band Gap Topologies for Reducing Simultaneous Switching Noise 几种降低同时开关噪声的电磁带隙拓扑分析

IEEE electromagnetic compatibility magazine Pub Date : 2022-01-01 DOI: 10.1109/memc.2022.9780309

Y. U. Maheswari, A. Amudha, L. Kumar

{"title":"Analysis of Several Electromagnetic Band Gap Topologies for Reducing Simultaneous Switching Noise","authors":"Y. U. Maheswari, A. Amudha, L. Kumar","doi":"10.1109/memc.2022.9780309","DOIUrl":"https://doi.org/10.1109/memc.2022.9780309","url":null,"abstract":"In the case of high-speed PCB design, the use of electromagnetic band gap (EBG) structure technology is useful in reducing simultaneous switching noise (SSN) in high-frequency applications. In high-frequency processes, parasitic filters are ineffective. Conducted emission is reduced by including the planar EBG structure into PCB plane layers. Various planar structures are taken and simulated in this research, including LC type, Z-Bridge with embedded double square, L-Bridge with slit type, alternating impedance, slit type EBG, Triple square type, and two topology type structures. A frequency sweep of 0 GHz to 10 GHz is used with a FEM solution. Theoretical calculations of the structures are performed and compared to simulation results, which show that they are very similar. Based on the best bandwidth and noise depth, the L-Bridge with slit and Triple square type cases were chosen, constructed, and analyzed using a vector network analyzer; it was discovered that the noise depth and bandwidth are in good accord. In addition, the AC analysis-Electric Field distribution for power and ground planes is explored, and the maximum and minimum field levels may be understood as a consequence.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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