基于pcb上电磁场分布测量的安全性和EMC同步评估

Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi
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引用次数: 0

摘要

本文介绍了一种通过测量印刷电路板(PCB)上的电磁场分布来同时评估安装了加密模块的信息设备的安全性和电磁兼容性的方法。该方法需要在加密集成电路(IC)之上进行单次相关分析,以确定包含秘密信息的电磁场的频带。然后,针对频域辐射强度,提出了一种有效的获取导致机密信息泄露的电磁场分布的方法。通过分析得到的电磁场分布,可以同时进行电磁兼容和安全评估。利用该方法对实际加密设备的电磁场辐射和信息泄露进行了分析。与需要大量计算资源和分析时间的传统方法相比,该方法可以有效地获得导致机密信息泄露的电场和磁场分布。最后简要提出了讨论、设计指导和未来的研究方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simultaneous Security and EMC Evaluations Based on Measuring Electromagnetic Field Distribution on PCBs
This article introduces a method to simultaneously evaluate the security and electromagnetic compatibility (EMC) of information devices equipped with cryptographic modules by measuring the electromagnetic (EM) field distribution on a printed circuit board (PCB). The proposed method requires a single correlation analysis above the cryptographic integrated circuit (IC) to define the frequency band of the EM field containing the secret information. Then, focusing on the radiation intensity in the frequency domain, an efficient method capable of obtaining the EM field distribution that contributes to the leakage of confidential information is proposed. Simultaneous EMC and security evaluations can be conducted by analyzing the obtained EM field distribution. Using the proposed method, EM field radiation and information leakage of an actual cryptographic device are analyzed. Compared to conventional methods requiring a large computational resource and analysis time, the proposed method can efficiently obtain the distribution of electric and magnetic fields that cause leakage of confidential information. Lastly, discussion, design guide, and future research directions are briefly provided.
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