Vulnerability Assessment Method for Electronic Devices Excited by Transient Electromagnetic Disturbances

Abstract

Vulnerability assessment of electronic devices excited by various transient electromagnetic disturbances (TEDs) has been a key issue in electromagnetic susceptibility research. This paper proposes a generalized vulnerability assessment method that includes acquiring data and building assessment model. The data is normally acquired by carrying out experiments, while the assessment model is mainly determined by prior information. As different devices under test (DUTs) could offer a different amount of prior information, a generalized assessment model consisting of a white-box model, a grey-box model, and a black-box model is built to deal with situations of sufficient prior information, partial prior information, and no prior information, respectively.