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2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)最新文献

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The Correlation between Audible Noise and Corona Discharge on an Overhead Line Conductor under Positive DC Voltage 直流正电压下架空线导体可听噪声与电晕放电的关系
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705478
Xu Zhang, C. Emersic, Chengxing Lian, I. Cotton
{"title":"The Correlation between Audible Noise and Corona Discharge on an Overhead Line Conductor under Positive DC Voltage","authors":"Xu Zhang, C. Emersic, Chengxing Lian, I. Cotton","doi":"10.1109/CEIDP50766.2021.9705478","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705478","url":null,"abstract":"Audible noise is generated in HVAC and HVDC transmission systems as a result of elevated electric fields at the conductor surface. This can be enhanced by pollution, damage and raindrops. Within this paper, a superhydrophobic coating was applied to a conductor to examine whether it can reduce the audible noise under a positive DC voltage. Partial discharge was measured to explore the correlation between corona discharge behavior and audible noise. Unlike the noise reduction with using superhydrophobic coating on the HVAC conductor, the coated conductor shows a higher audible noise level than the uncoated conductor under positive DC voltage. The total partial discharge magnitude also has trend similar to the audible noise performance. It is shown that the A-weighted sound pressure level is correlated to the total partial discharge magnitude.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"5 1","pages":"586-589"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84609873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Partial discharge measurement in DC GIS: comparison between conventional and UHF methods 直流GIS中的局部放电测量:常规与超高频方法的比较
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705420
T. Vu-Cong, M. Dalstein, C. Toigo, F. Jacquier, A. Girodet
{"title":"Partial discharge measurement in DC GIS: comparison between conventional and UHF methods","authors":"T. Vu-Cong, M. Dalstein, C. Toigo, F. Jacquier, A. Girodet","doi":"10.1109/CEIDP50766.2021.9705420","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705420","url":null,"abstract":"The detection, identification and localization of defects are essential to ensure the service reliability of Gas Insulated Switchgear (GIS). Partial discharge (PD) measurement is well-known as one of the most effective technique for defect detection and identification in electrical insulation systems. PD measurement according to IEC standard 60270 is known as the conventional technique, in which PD is quantified in terms of apparent charge. Moreover, non-conventional technique, like UHF detection, can also be used for partial discharge measurement to enhance the signal/noise ratio in GIS. For AC electrical insulating systems both techniques are effectives, widely used and give the same signature of defect. Unfortunately, very little information is available for DC systems, especially regarding the comparison of the defect fingerprint between the two methods. The aim of this paper is to investigate the partial discharge signals recorded with both conventional and UHF methods in DC voltage. The results showed that the defect fingerprints are similar between the conventional measurement and the UHF measurement, regardless the UHF antenna position in the equipment.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"37 1","pages":"607-610"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81404438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electret: A Method to Increase Critical Flashover Voltage in Power Dense Applications 驻极体:一种在功率密集应用中提高临界闪络电压的方法
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705382
Omar Faruqe, F. Haque, Chanyeop Park
{"title":"Electret: A Method to Increase Critical Flashover Voltage in Power Dense Applications","authors":"Omar Faruqe, F. Haque, Chanyeop Park","doi":"10.1109/CEIDP50766.2021.9705382","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705382","url":null,"abstract":"Surface flashover in medium to high voltage devices and in power-electronics-driven applications is a challenge that threatens the dielectric integrity of emerging technologies. The risk of surface flashover is increasing in many of the latest applications owing to their high voltage rating, high power density, and high dv/dt. Therefore, it is necessary to improve the critical flashover voltage (CFO) for enhanced dielectric robustness. In this study, a novel technique to increase insulator CFO with the incorporation of electret film on dielectric surfaces is proposed. The CFO of insulator with and without the incorporation of electret films is compared experimentally. The electret-based approach increases the CFO by either acting as a potential barrier that impedes surface charge migration or by reducing the local electric field near the triple point.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"37 1","pages":"109-112"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80277467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
In-line Measurement Techniques of Resin-based Insulation Processes for Wireless Power Transfer Systems 无线电力传输系统中树脂基绝缘过程的在线测量技术
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705443
M. Kneidl, Daniel Benke, M. Masuch, A. Kühl, J. Franke
{"title":"In-line Measurement Techniques of Resin-based Insulation Processes for Wireless Power Transfer Systems","authors":"M. Kneidl, Daniel Benke, M. Masuch, A. Kühl, J. Franke","doi":"10.1109/CEIDP50766.2021.9705443","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705443","url":null,"abstract":"The increasing demand for electric mobility is continuously generating innovations in the development and production of electrical machines such as wireless power transfer (WPT) systems. Therefore, new insulation resins with different filler types are investigated in detail to prevent electrical breakdowns and to increase the thermal conductivity of the whole insulation system. In contrast to the development and optimization of new materials, the application technology, process control and testing still remains largely unchanged. As a result, the transfer of the optimized material properties of new insulation resins to the specific component properties is restricted. In the worst case, this leads to an inappropriate processability of the resin and subsequently to the failure of the electrical machine. Furthermore, end-of-line tests only allow a qualification of the final insulation system after impregnation and curing. Thus, defective components can only be identified and discarded or repaired at the end of the process chain, which causes additional costs in production. The aim presented in this work is to identify and measure the dielectric properties of the insulation material along the encapsulation process of a coil structure for WPT systems, to derive information about the overall quality of the insulation system. Therefore, a test setup for qualifying the insulation system capability during the encapsulation process will be elaborated. The results of the in-line measurements are then validated with partial discharge measurements and micrographs of the conductor structure.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"4 1","pages":"167-170"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88954317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Development of a fractal-based model for simulating streamer flashover of insulating surfaces 基于分形的绝缘表面闪络模拟模型的建立
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705398
A. Ioannidis, N. Karanikiotis, P. Mikropoulos, P. K. Samaras, T. Tsovilis
{"title":"Development of a fractal-based model for simulating streamer flashover of insulating surfaces","authors":"A. Ioannidis, N. Karanikiotis, P. Mikropoulos, P. K. Samaras, T. Tsovilis","doi":"10.1109/CEIDP50766.2021.9705398","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705398","url":null,"abstract":"A fractal-based model for simulating the final stage of positive streamer flashover is introduced. The proposed model considers the stochastic nature of discharge growth along insulating surfaces and integrates physical criteria on surface discharge propagation. An application of the proposed model to simulate flashover along a Polyethylene (PE) insulating specimen bridging a short sphere-ring air gap has been made. With reference to experimental results, the proposed model well predicts the flashover voltage and spark path along the insulating surface. The statistical dispersion of the flashover voltage and spark path should be accounted for in determining the creepage distance of insulators utilized in critical electronic equipment.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"42 1","pages":"663-666"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89143160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Study on the Material Used for On-site Insulation of Bare Overhead Conductors 裸露架空导体现场绝缘材料的研究
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705432
Ruiqi Shang, F. Yin, Liming Wang
{"title":"Study on the Material Used for On-site Insulation of Bare Overhead Conductors","authors":"Ruiqi Shang, F. Yin, Liming Wang","doi":"10.1109/CEIDP50766.2021.9705432","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705432","url":null,"abstract":"Distribution network is one of the main parts of the power systems. Currently, the widely used bare overhead transmission line in the distribution work may lead to unwanted accidents. However, the cost of replacing existing bare conductors with new insulated wires is too high. The on-site insulating of bare conductors is a promising solution. To this end, an insulating material that is proper for this application is vital. In this paper, five kinds of insulating materials are compared, and the one-component room temperature vulcanized silicone rubber (RTVSR) is selected. Through the experiments, the best ratio of low and high viscosity α, ω-dihydroxy polysiloxane silicone rubber is obtained. This paper can provide guidelines for the selection of material for on-site insulation of bare conductors and the effect of raw rubber and MQ silicone rubber on the insulating material’s properties.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"92 1 1","pages":"255-258"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88378669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electrical Investigations on the Interface between a FRP Tube and a Low-Density Polymeric Foam 玻璃钢管与低密度聚合物泡沫材料界面的电学研究
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705375
Diego Machetti, Isabella Nett, M. Domm, J. Seifert
{"title":"Electrical Investigations on the Interface between a FRP Tube and a Low-Density Polymeric Foam","authors":"Diego Machetti, Isabella Nett, M. Domm, J. Seifert","doi":"10.1109/CEIDP50766.2021.9705375","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705375","url":null,"abstract":"The internal insulation of hollow-core composite insulators (HCIs) is typically realized with low-density dielectrics such as foams. The use of foams inside HCIs results in an interface foam-FRP material. The leakage current along an interface composed of an FRP material and a novel sort of polymeric foam was investigated experimentally, with a novel guard electrode arrangement embedded inside the interface, as well as with a FE simulation model. The experimental results indicate that the interface currents are in the picoampere range and that are affected by the homogeneity of the foam’s pore structure, differing from the simulated currents as much as one order of magnitude. The use of an adhesion promoter that enhanced the bonding increased the interface current in two orders of magnitude.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"47 1","pages":"231-234"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81643578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Comprehensive Model for Electrical Degradation of Power Cable Insulation 电力电缆绝缘电气退化的综合模型
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705370
Ayesha Azimuddin, S. Refaat
{"title":"A Comprehensive Model for Electrical Degradation of Power Cable Insulation","authors":"Ayesha Azimuddin, S. Refaat","doi":"10.1109/CEIDP50766.2021.9705370","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705370","url":null,"abstract":"The widely used cross-linked polyethylene (XLPE) cables for power distribution and transmission systems are subjected to a large number of stresses such as electrical, mechanical, chemical, environmental, and thermal stresses. Electrical stress is a phenomenon that significantly contributes to cable aging resulting in the reduction of its functionality. It is necessary to study the dielectric properties and their changes during the aging process to improve grid efficiency, stability, reliability. This paper proposes a comprehensive physical model to simulate and illustrate the electrical insulation degradation phenomenon in XLPE insulated medium voltage power cables. The statistical analysis of aging concerning the change in dielectric polarization is conducted to characterize XLPE insulation degradation in a 24 kV power cable. A three-dimensional finite-element analysis (FEA) cable model is developed in COMSOL Multiphysics software to illustrate the aging phenomenon. Six different cases with varying stress effects in the insulation region are evaluated and compared. Namely, the voltages stress on power cables when the progressive change in the electric polarization process in the insulation region takes place for a prolonged period. It also presents the electric polarization variation in the insulation region for different numbers of voids. The results of the study show the impact of the electric stress through the measurement of the polarization index in the insulation region.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"10 1","pages":"133-138"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81671275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Investigations on DC Breakdown in Solids under Needle tip-Plane Electrode Configuration 针尖-平面电极结构下固体直流击穿的研究
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705446
Ajith John Thomas, C. Reddy
{"title":"Investigations on DC Breakdown in Solids under Needle tip-Plane Electrode Configuration","authors":"Ajith John Thomas, C. Reddy","doi":"10.1109/CEIDP50766.2021.9705446","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705446","url":null,"abstract":"Electrical treeing is considered to be one of the most important physical evidence of insulation damage in HV cables, caused due to the high field enhancement at the tip of these defects in the insulation. In this paper, breakdown experiments are conducted using needle-tip electrode configuration under stepped DC stress profile. Further, the authors present an estimation of electric field and space charge distributions in needle tip-plane system based on FEM. Nonlinear conduction is incorporated in the computation by using a semi-empirical equation of field and temperature-dependent conductivity. The results show the interesting aspects of nonlinear conductivity on the electric field and space charge distribution. Further, the effect of temperature dependence on field distribution at the needle-tip is also presented. Furthermore, from the breakdown experiments, the electric field at the tip is estimated for different tip radii and the results give a reasonable and realistic estimate of breakdown tip-field, using the proposed model.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"62 1","pages":"73-76"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78486144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Investigation of Space Charge Behavior in Epoxy Resin Substrate of Semiconductor Devices 半导体器件环氧树脂衬底空间电荷行为研究
2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Pub Date : 2021-12-12 DOI: 10.1109/CEIDP50766.2021.9705317
Naho Saito, Kosuke Sato, H. Miyake, Yasuhiro Tanaka
{"title":"Investigation of Space Charge Behavior in Epoxy Resin Substrate of Semiconductor Devices","authors":"Naho Saito, Kosuke Sato, H. Miyake, Yasuhiro Tanaka","doi":"10.1109/CEIDP50766.2021.9705317","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705317","url":null,"abstract":"In recent years, new semiconductor devices using SiC, GaN, etc. that can be operated even at high temperature under high electric field have been developed. While it is possible to miniaturize the equipment by using them, the insulating substrate for the semiconductor element is exposed to a more severe thermal and electrical environment than ever. Therefore, the insulating substrate is required to have high insulating properties at high temperatures. In this research, we focus on epoxy resin to apply them as the substrate, and we especially investigated the space charge accumulation behaviors in them, because they were expected to affect the insulating performance at high temperature under high electric field. In particular, to investigate the effect of impurities in the epoxy resin, space charge distribution measurements were performed on samples that were further annealing after thermosetting. As a result, the annealing under vacuum condition improves the space charge accumulation properties of epoxy resins at temperature of 100 °C.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"67 1","pages":"458-461"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80884447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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