Hao Dong, Zhuodong Yang, Xiao Yang, Licheng Lu, Yi Zhang, B. Qi, Chengrong Li
{"title":"Simulation Analysis of Electric Field and Mechanical Stress of Ceramic Supporting Insulator in UHVDC Wall Bushing","authors":"Hao Dong, Zhuodong Yang, Xiao Yang, Licheng Lu, Yi Zhang, B. Qi, Chengrong Li","doi":"10.1109/CEIDP50766.2021.9705433","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705433","url":null,"abstract":"Compared with epoxy resin composite materials, silicon nitride ceramics have excellent insulation and mechanical properties, and have certain application potential in SF6 gasinsulated UHVDC equipment. Based on the silicon nitride ceramic material, this paper designs a \"wine bottle shape\" insulating pillar suitable for ±800kV pure SF6 gas-insulated wall bushing. And using finite element simulation to compare its electrical and mechanical properties with traditional epoxy resin pillars. The study found that: compared with epoxy resin insulated pillars, the peak values of the tangential and normal electric fields of the ceramic insulating pillars are lower by 15% and 23.6%, respectively; The safety margin of ceramic insulated pillars is 112% higher than that of epoxy pillars under operating conditions; Under the magnitude 8 earthquake intensity, the safety margin of ceramic insulated pillars is 21.25% higher than that of epoxy pillars. The silicon nitride ceramic insulation pillar designed in this paper has passed the type test and has been put into operation at the Wuhan Converter Station in China.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"12 1","pages":"407-410"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91066102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. R. Pallaka, Witold K. Fuchs, Mychal P. Spencer, Ana L. Arteaga, Andy Zwoster, L. Fifield
{"title":"Detection of diffusion limited oxidation in thermally aged ethylene propylene rubber cable insulation material","authors":"M. R. Pallaka, Witold K. Fuchs, Mychal P. Spencer, Ana L. Arteaga, Andy Zwoster, L. Fifield","doi":"10.1109/CEIDP50766.2021.9705460","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705460","url":null,"abstract":"The lifetime prediction of electrical cable insulation in nuclear power plants (NPPs) is primarily based on accelerated aging. Polymeric insulation exposed to accelerated aging at high temperatures may demonstrate diffusion limited oxidation (DLO) where oxygen within the material is consumed faster than can be supplied by diffusion from the surrounding air. This situation leads to equilibrium oxidation at the exposed surfaces and limited oxidation away from the surfaces. Therefore, DLO results in a heterogeneously aged material which can lead to overestimation of lifetime for in-service cable insulation. In this study, the presence of inhomogeneous aging caused by DLO was evaluated on cross-sectioned cable insulation specimens made of ethylene propylene rubber (EPR). The studies were performed on thermally aged specimens (165 °C, 1 day and 165 °C, 16 days) using local measurement techniques including nanoindentation, micro-Fourier transform infrared spectroscopy (FTIR), and scanning electron microscopy (SEM) - energy dispersive spectroscopy (EDS). All the results indicate some degree of heterogenous aging, with 165 °C, 16 days, aging demonstrating highest degree of oxidative degradation on the inside edges presumably caused due to copper catalyzed oxidation.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"18 1","pages":"526-530"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75797005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Niharika Baruah, Rohith Sangineni, Chandrima Saha, Deepak Kanumuri, Manas Chakraborty, S. K. Nayak
{"title":"Supervised machine learning model for predictive analysis of dielectric response of insulating liquids","authors":"Niharika Baruah, Rohith Sangineni, Chandrima Saha, Deepak Kanumuri, Manas Chakraborty, S. K. Nayak","doi":"10.1109/CEIDP50766.2021.9705387","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705387","url":null,"abstract":"The present study deals with application of a supervised machine learning (ML) technique to predict and explain the trends in the dielectric properties of the oil samples with change in temperature. The insulation system of the transformer mainly consists of the conventional mineral oil (MO) and the solid insulation like kraft paper and pressboards. High temperature, ageing and oxidation of the oil reduce the lifetime of the insulation. Therefore, it is of utmost importance to carry out periodic monitoring of the insulation system to avert any untoward failures in the power system network. Nanofluid (NF) is evolving as a dielectric liquid for usage in various high voltage apparatus for the purpose of insulation and heat transfer because of its certain advantages. For formulating the NF, semiconductive Titanium oxide (TiO2) nanoparticle (NP) is dispersed into the MO in a specific volume percentage. The study in this work aims at predictive analysis of the dielectric properties like permittivity and dielectric losses of MO and MO-NF considering its dielectric response using the frequency domain spectroscopy (FDS). For the predictive study, the supervised ML model known as decision tree regression is used as it is one of the most powerful tool for prediction. The model is developed using a dataset of 355 experimentally measured values of the dielectric properties with temperature range of 30oC to 90oC. These results indicate the variation in the dielectric properties of both MO and MO-NFs and help to comprehend the changes in the oil properties at a wide range of frequencies.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"32 1","pages":"414-417"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73774781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Semi-Empirical Models for Temperature and Electric Field Dependent Complex Permittivity of Solid Dielectrics","authors":"P. Johri, C. Reddy","doi":"10.1109/CEIDP50766.2021.9705461","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705461","url":null,"abstract":"In this paper, the authors present models for the temperature and electric field dependence of AC complex permittivity of solid dielectrics used for power cables. Until now, variation in permittivity, with temperature and field, has been more or less neglected. Although small, both real and imaginary components of the complex AC permittivity are somewhat nonlinear in nature and thus, determination of true behavior of the dielectric requires accurate modelling of the complex AC permittivity. Careful and intensive experimental investigations are carried out using Novocontrol Technologies’ broadband dielectric spectrometer, for different temperatures and electric fields and constant frequency of 50Hz and the data is used for curve fitting and subsequent optimization. The suitability of the proposed models has been verified for two different dielectrics. Interesting results on coefficients of the models have been arrived at, that provide deeper insight into the dielectric behaviour.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"140 1","pages":"438-441"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76597120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. S. Ferreira, A. Sengupta, P. Picher, I. Fofana, H. Ezzaidi
{"title":"Influence of Transformer Structures on the Frequency Response Analysis: A Laboratory Case Study","authors":"R. S. Ferreira, A. Sengupta, P. Picher, I. Fofana, H. Ezzaidi","doi":"10.1109/CEIDP50766.2021.9705354","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705354","url":null,"abstract":"Frequency response analysis (FRA) is used in the electrical industry for condition assessment of power transformers. The method is sensitive to even slight variations occurring in the active parts of transformers. Over the years, FRA has demonstrated its good capacity for detection of mechanical and electrical failure modes This paper explores different measurements taken on a laboratory transformer model where the influence of cylindrical grounded structures (simulating a tank and a core) is investigated. The cylindrical structures were added in order to study their impacts on the frequency response with a specific focus on the inductance and capacitance changes. The core and tank influences on the frequency response measurements are explained by shunt capacitances variation in both cases causing similar changes to the traces. Besides, radially induced currents in the tank made of magnetic steel affected the main inductance of the winding causing a shift of the first anti-resonance frequency. Such radially induced currents were prevented by the design of the simulated core made of aluminum strips. The results indicated that the transformer structure has a significant influence on the frequency response, related to changes in the main inductance and capacitances of the equivalent transformer circuit model. These academic experiments help contributing to a better understanding and further support of transformer FRA trace interpretations.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"20 1","pages":"155-158"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78720966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yiwei Long, Zhuolin Cheng, Zhimin Yan, Da-fun Chen, Jianying Li, Jiajun Hu, Kai Wang, H. Xia, Shenghe Wang
{"title":"Effect of Thermal Cycle Ageing on the Breakdown Performance of Epoxy and Its Micro-composites","authors":"Yiwei Long, Zhuolin Cheng, Zhimin Yan, Da-fun Chen, Jianying Li, Jiajun Hu, Kai Wang, H. Xia, Shenghe Wang","doi":"10.1109/CEIDP50766.2021.9705385","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705385","url":null,"abstract":"Epoxy-based materials are widely used in electronic devices as the main insulation due to their excellent dielectric and thermal properties. However, thermal cycles originating from the drastic changes in working temperature can greatly accelerate their degradation. In this paper, the effect of thermal cycle ageing (-55 ~ 150 °C) on the AC breakdown strength (EB) of neat epoxy (EP) and micron boron-nitride/epoxy (BN/EP) composites are investigated. The aging process can be understood by two stages. During the first stage, EB of EP experienced an evident rise from 64.73 to 76.17 kV/mm, and that of BN/EP displayed a similar growth from 73.01 to 77.41 kV/mm. The variation of their glass transition temperature (Tg) was consistent with EB. Results of Fourier transform infrared spectroscopy and the trap characteristics indicate that post-curing of epoxy matrix and the effect of low temperature were both responsible for the initial increase. In the later stage, owing to the effects of thermal-oxidative reactions of epoxy resin, EB of EP dropped to 63.11 kV/mm at 150 cycles. There was a more drastic decline of BN/EP to 61.38 kV/mm, and this severer deterioration might be attributed to the thermal expansion coefficients mismatch between BN fillers and epoxy matrix.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"8 1","pages":"113-116"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80966009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mirai Shimura, M. Kurimoto, S. Sugimoto, T. Kato, Kazuma Tagawa, Y. Suzuoki
{"title":"Electrical Treeing Breakdown Voltage of Epoxy/Hollow-silica Nanocomposites","authors":"Mirai Shimura, M. Kurimoto, S. Sugimoto, T. Kato, Kazuma Tagawa, Y. Suzuoki","doi":"10.1109/CEIDP50766.2021.9705414","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705414","url":null,"abstract":"The relative permittivity of epoxy nanocomposites (NCs) containing hollow silica nanoparticles (epoxy/hollow-silica NC) is lower than that of the unfilled epoxy resin. The low permittivity in hollow silica nanoparticles is caused by the nanometric pores present in them; however, the effect of nanometric pores on the dielectric breakdown strength is unclear. In this study, we investigated the electrical treeing breakdown voltage (BDV) of epoxy/hollow-silica NC and compared it with that of the unfilled epoxy resin and epoxy nanocomposites containing solid silica nanoparticles (epoxy/solid-silica NC). The average size and the particle porosity of the hollow silica nanoparticles were approximately 100 nm and 48 vol%, respectively. The filler volume fraction of the silica nanoparticles in the NCs was 5 wt %. The breakdown test was performed using a needle-plate electrode with a gap of 3 mm. The average BDV of the epoxy/hollow-silica NC was almost the same as that of the unfilled epoxy resin and epoxy/solid-silica NC. These results suggest that the nanometric pores in the epoxy/ hollow-silica NC did not behave as defects to reduce the treeing BDV.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"40 1","pages":"490-493"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80061466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improving Reliability of Transformers based on DGA Analysis using Machine Learning Techniques","authors":"A. Harshith Kumar, B. S. Thind, C. C. Reddy","doi":"10.1109/CEIDP50766.2021.9705451","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705451","url":null,"abstract":"Classifiers, Artificial Neural Networks (ANN), Fuzzy Logic (FL) and Adaptive Neuro Fuzzy Inference System (ANFIS) have been used as methods to detect faults using data obtained from Dissolved Gas Analysis (DGA). DGA provides reasonably good results in detecting insipient faults but improvement on the method’s accuracy has been done. Comparative analysis using the mentioned methods have been done on IEC 599 standard, Rogers Ratio Method and Doernenburg’s method. Fault databases have been used to train the models to improve the diagnostic capability. ANFIS has shown superiority on Classifiers, ANN and FL which is evident from the obtained results. ANFIS being a union of all the said methods, it has a higher prediction accuracy and is user friendly thereby, providing a promising surrogate in reinstating the conventional methods.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"64 1","pages":"151-154"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76502784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Novel nanocomposite thin film for arc ablation resistance","authors":"Kerry Davis, Yifei Wang, Qian Wang, Yang Cao","doi":"10.1109/CEIDP50766.2021.9705445","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705445","url":null,"abstract":"High Voltage Direct Current (HVDC) transmission systems are at the forefront of electrical engineering research. There are a few challenges with incorporating HVDC for industrial use, of which, developing safe and capable circuit breakers is of utmost importance. When a circuit breaks in a HVDC system, arc plasma is generated due to the extremely high voltages. This work presents a unique solution for arc ablation resistant materials, a thin Poly(methyl methacrylate) (PMMA) film with inorganic fillers dip-coated on an alumina substrate. The presence of Zinc Oxide nanofillers increases the dielectric permittivity while keeping the loss tangent the same as the baseline PMMA coating. The presence of Zinc Oxide is also shown to shift the UV absorption peak, indicating that the composite can be tuned for energy absorption during plasma arc.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"141 1","pages":"352-354"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82265978","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Aging assessment of insulating materials through broadband dielectric measurements: the appropriate frequency choice","authors":"S. V. Suraci, D. Fabiani","doi":"10.1109/CEIDP50766.2021.9705347","DOIUrl":"https://doi.org/10.1109/CEIDP50766.2021.9705347","url":null,"abstract":"In this article the dielectric response of differently filled insulating materials is studied. The contribution of polymer additives showed to influence both the dielectric spectrum and conductivity values of the considered materials. Among the different analyzed frequencies, it has been concluded that the highest frequency region (e.g. 100 kHz), related to the dipolar polarization, is affected significantly by additives and it depicts a monotonous increase with aging time, hence it could be suitable as an aging marker for cable nondestructive diagnostics.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"92 1","pages":"32-35"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85763383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}