2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)最新文献_第9页

Investigation of Radiative Coupling from InGaAsP Quantum Wells for Improving End-of-Life (EOL) Efficiency in Multijunction Solar Cells InGaAsP量子阱辐射耦合提高多结太阳能电池寿命终止效率的研究

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8981220

G. Bradshaw, M. Kacharia, E. Kessler-Lewis, D. Wilt, S. Polly, C. Mann, H. Kum, S. Hubbard

引用次数: 0

Nanometer-Scale Imaging of Inhomogeneous Active Charge Carriers in Arsenic-Doped CdTe Thin Films 砷掺杂CdTe薄膜中非均匀活性电荷载流子的纳米成像

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980573

C. Jiang, J. Moseley, C. Xiao, S. Harvey, E. Colegrove, W. Metzger, M. Al‐Jassim

{"title":"Nanometer-Scale Imaging of Inhomogeneous Active Charge Carriers in Arsenic-Doped CdTe Thin Films","authors":"C. Jiang, J. Moseley, C. Xiao, S. Harvey, E. Colegrove, W. Metzger, M. Al‐Jassim","doi":"10.1109/PVSC40753.2019.8980573","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.8980573","url":null,"abstract":"We report nanometer-scale imaging of active carrier distribution of As-doped CdTe films by scanning capacitance microscopy (SCM). We developed SCM sample preparation for CdTe by ion-milling followed by thermal processing. The nanometer-resolution carrier delineation for CdTe was validated by imaging on a CdTe cross-section sample made by a molecular beam epitaxy layer stack with As-doping concentrations of 1015~1018/cm3. We found that the carrier distribution in As-doped films was significantly nonuniform, with inhomogeneity ranging from sub-μm to a few μm and concentration variation of one order of magnitude (low 1016 to low 1017/cm3). This nonuniformity is distributed randomly, independent of grain structure and grain boundary (GB). We used Kelvin probe force microscopy (KPFM) and cathodoluminescence (CL) to further map the surface potential and radiative illumination on the same area as the SCM image. Higher potential and lower CL intensity were found on GBs but not on SCM contrast, illustrating positive GB charging and GB recombination but not GB-distinguished doping. The overall KPFM potential image is in rough agreement with the SCM carrier distribution, in terms of Fermi-level position relative to the bandgap edge—thus resulting in the band-edge potential fluctuation. Nonuniform carrier concentration, potential fluctuation, and defect recombination can all together cause the Voc deficit of the As-doped CdTe device.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"14 1","pages":"0786-0790"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88401539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

GaAs/Si Double-Junction Cells Fabricated by Sacrificial Layer Etching of Directly-Bonded III-V/Si Junctions 牺牲层蚀刻直接键合III-V/Si结制备GaAs/Si双结电池

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980757

Ryo Kozono, Sanji Yoon, Jianbo Liang, N. Shigekawa

引用次数: 1

Post-Deposition Recrystallization of Co-Evaporated CuInxGa(1-x)Se2 Films by Bromide Vapor Treatments 溴化物蒸汽处理共蒸发CuInxGa(1-x)Se2薄膜沉积后的再结晶

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980803

Elizabeth Palmiotti, S. Karki, Benjamin Belfore, Sina Soltanmohammad, G. Rajan, S. Marsillac, A. Rockett

引用次数: 4

Real-world PV Module Degradation across Climate Zones Determined from Suns-Voc, Loss Factors and I-V Steps Analysis of Eight Years of I-V, Pmp Time-series Datastreams 从太阳- voc，损失因子和I-V步骤确定的真实世界PV组件跨气候区的退化，8年I-V的分析，Pmp时间序列数据流

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980541

Jiqi Liu, Menghong Wang, A. Curran, Ahmad Maroof Karimi, Wei-Heng Huang, Erdmut Schnabel, M. Köhl, J. Braid, R. French

{"title":"Real-world PV Module Degradation across Climate Zones Determined from Suns-Voc, Loss Factors and I-V Steps Analysis of Eight Years of I-V, Pmp Time-series Datastreams","authors":"Jiqi Liu, Menghong Wang, A. Curran, Ahmad Maroof Karimi, Wei-Heng Huang, Erdmut Schnabel, M. Köhl, J. Braid, R. French","doi":"10.1109/PVSC40753.2019.8980541","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.8980541","url":null,"abstract":"We report here on performance and mechanistic degradation analysis of 8 years of I-V, Pmp time-series for eight commercial crystalline silicon photovoltaic (PV) modules, located in three distinct climate zones. A data-driven algorithm has been applied to extract I-V features and detect steps in 3.2 million I-V curves. Using the Y ear-on-Y ear determined linear PLR, we found that one brand F (glass-backsheet) module has a much greater (more negative) PLR than another brand G (double glass) in BWh hot desert climate zone. BSh hot semi-arid is shown to be the most aggressive climate zone of the three in which modules were fielded, the third being ET tundra climate. The mechanisms causing most significant power loss for modules in BWh, BSh and ET climate zones are current mismatch (shading), cell shunting, and series resistance, respectively based on Analytic Suns-Voc analysis derived from outdoor I-V curves. Using steps observed in the I-V curves of the systems we are also able to identify and characterize the shading of specific modules.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"11 1","pages":"0680-0686"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86604217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Annual energy yield analysis of solar cell technology 太阳能电池技术年发电量分析

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980523

M. Abbott, G. Xing, G. Scardera, D. Payne, K. McIntosh, Ben A. Sudbury, J. Meydbray, T. Fung, Muhammad Umair Khan, Yu Zhang, S. Zou, Xusheng Wang

{"title":"Annual energy yield analysis of solar cell technology","authors":"M. Abbott, G. Xing, G. Scardera, D. Payne, K. McIntosh, Ben A. Sudbury, J. Meydbray, T. Fung, Muhammad Umair Khan, Yu Zhang, S. Zou, Xusheng Wang","doi":"10.1109/PVSC40753.2019.8980523","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.8980523","url":null,"abstract":"The ultimate value of any photovoltaic technology is the amount of energy it delivers once installed in the field. Gathering this data experimentally can take many years and requires great cost with limited scope to vary the input parameters. Simulations based on detailed lab measurements provide a more cost-effective option to predict the energy yield of a PV technology rapidly. This paper demonstrates the application of highly detailed ray tracing and SPICE modelling to determine the annual energy yield. It compares the simulated performance of different texturing technologies and predicts the losses at a cell, module and system level. Specifically, it studies upright random pyramids, isotexture and two types of MCCE black silicon applied to a Cz bifacial PERC cell. The difference between isotexture and random pyramids was close to 5% at the cell level, however this significantly reduced to less than 2% at a system level indicating that this analysis is critical to properly assess the ultimate value of a technology.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"39 1","pages":"3046-3050"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90204154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

The Case for Custom TMY’s: Examples Using the NSRDB 定制TMY的案例:使用NSRDB的例子

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980811

M. Sengupta, A. Habte, J. Freeman

引用次数: 1

Effects of CsF Post-deposition Treatment on Cu(In, Ga)Se2 Thin Films and Solar Cells CsF沉积后处理对Cu(In, Ga)Se2薄膜和太阳能电池的影响

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980502

Hojin Lee, Kihwan Kim, Yuseong Jang, Seong-wook Nam, B. Shin

引用次数: 1

Electronic Properties and Molar Excitation Coefficient for Organic Solar Cells Materials by using TD-DFT Method 利用TD-DFT方法研究有机太阳能电池材料的电子特性和摩尔激发系数

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8980795

M. Salim, R. Nekovei

引用次数: 4

Rough and Straightforward Estimation of the Mismatching Loss by Partial Shading of the PV Modules Installed on an Urban Area or Car-Roof 通过部分遮阳对安装在城市地区或车顶的光伏组件进行不匹配损失的粗略和直接估计

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Pub Date : 2019-06-01 DOI: 10.1109/PVSC40753.2019.8981199

K. Araki, Kan‐Hua Lee, T. Masuda, Yoshitaka Hayakawa, N. Yamada, Y. Ota, M. Yamaguchi

{"title":"Rough and Straightforward Estimation of the Mismatching Loss by Partial Shading of the PV Modules Installed on an Urban Area or Car-Roof","authors":"K. Araki, Kan‐Hua Lee, T. Masuda, Yoshitaka Hayakawa, N. Yamada, Y. Ota, M. Yamaguchi","doi":"10.1109/PVSC40753.2019.8981199","DOIUrl":"https://doi.org/10.1109/PVSC40753.2019.8981199","url":null,"abstract":"Solar panels used for EV charging stations and car-roof PV are often partially shaded and lead to substantial energy loss. It is known that this mismatching loss can be reduced by increasing the number of parallel strings. First, a probability model was developed using a one-year solar irradiance monitoring around the car body in 5 directions. The developed model successfully matched to the measured solar resource in each direction and succeeded to quantify the probability of the partial shading on the car. Another related issue of the inherent mismatching loss of the car-roof PV is non-uniform illumination caused by the curved shape of the panel. This can also be modeled by ray-tracing simulation. Then, we calculated the PV output affected by mismatching due to various sunlight patterns and partial shade patterns by Monte Carlo method. It was found that the average efficiency asymptotically approached 1 - 1 / N (N is the number of strings). We also examined the relationship between partial shade quantity and power generation loss in a 30 kW solar system array and verified the above model.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"33 1","pages":"1218-1225"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83702585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 12