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FDTD analysis of symmetric TEM cell 对称瞬变电磁体的时域有限差分分析
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513571
C. Rostamzadeh, B. Archambeault, S. Connor
{"title":"FDTD analysis of symmetric TEM cell","authors":"C. Rostamzadeh, B. Archambeault, S. Connor","doi":"10.1109/ISEMC.2005.1513571","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513571","url":null,"abstract":"Traditional measurements of the electric field distribution inside a symmetric square TEM cell can be tedious, difficult and subject to errors. In this paper we evaluate a numerical FDTD method for prediction of spatial electric field distribution within an empty TEM cell. FDTD results compare favorably with measured data, hence providing an excellent tool to replace measurement methods and avoid errors. Emphasis is laid on the basic idea of field perturbation introduced by external field probes and objects, thus promoting FDTD computational techniques as an alternative but accurate, valid and a suitable tool.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"2015 1","pages":"525-529 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74023861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Use of Huygens source excitation in a MoM surface-current EFIE formulation 惠更斯源激励在MoM表面电流EFIE配方中的应用
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513640
D. Leugner, H. Bruns, H. Singer
{"title":"Use of Huygens source excitation in a MoM surface-current EFIE formulation","authors":"D. Leugner, H. Bruns, H. Singer","doi":"10.1109/ISEMC.2005.1513640","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513640","url":null,"abstract":"In this paper the equivalence theorem (Huygens principle) is applied in conjunction with a method of moments (MoM) surface current formulation in order to improve the computation of a certain class of problems arising in the area of EMC. Of special interest is the effect of holes and slots upon the forming of the interior fields of enclosures. For an effective aperture treatment based on a MoM EFIE formulation the electric MoM currents and the electric equivalent sources (Huygens sources) have to be galvanically connected in order to satisfy the continuity equation at the interface. It is observed that one can circumvent instabilities of the EFIE at resonances leading to false interior fields by replacing the original excitation by Huygens sources in the aperture. In a first standard MoM computation the current distribution of the structure is gained. Then the original excitation is replaced by Huygens currents in the aperture plane. A second MoM computation is necessary to compute the internal current distribution. Such a step-by-step EFIE procedure is computationally more efficient than a double-layer current approach. The numerical effort is reduced by almost a factor of four.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"27 1","pages":"834-839 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79337967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Effect of common mode transients on front end rectifiers in offline SMPS 离线SMPS中前端整流器共模瞬变的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513537
M. Sudheer, M. Gunasekaran
{"title":"Effect of common mode transients on front end rectifiers in offline SMPS","authors":"M. Sudheer, M. Gunasekaran","doi":"10.1109/ISEMC.2005.1513537","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513537","url":null,"abstract":"This paper presents the effect of common mode (CM) transient on a typical front-end rectifier of offline power electronic equipment like switched mode power supply (SMPS) and near unity power factor (NUPF) converters. They undergo mode conversion to differential mode (DM) transients. The magnitude, rise time and fall time of such DM transients depend on the coupling capacitance to ground, rise time and position of occurrence of CM transients on AC mains voltage. This DM transient may damage sensitive components and may cause malfunctioning of the ICs used in the SMPS/NUPF circuitry. It will also cause interference in their output voltages. Connecting RC snubbers across the diode bridge can mitigate them. Simulation results, mathematical analysis and experimental results presented here are in close conformity.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"16 1","pages":"346-349 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85362694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An optical feeding antenna with a wider bandwidth than conventional spherical dipole antennas 一种比传统的球形偶极子天线带宽更宽的光学馈电天线
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513483
S. Itakura, S. Nabekura, Y. Okano, M. Tokuda
{"title":"An optical feeding antenna with a wider bandwidth than conventional spherical dipole antennas","authors":"S. Itakura, S. Nabekura, Y. Okano, M. Tokuda","doi":"10.1109/ISEMC.2005.1513483","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513483","url":null,"abstract":"We constructed a wideband, optical feeding antenna that combines elements of a hemispherical antenna and a biconical antenna. Measurement of the radiated electrical field and comparison of the values with ones calculated using the finite difference time domain (FDTD) method showed that the calculated values for the frequency characteristics and the directivities of the radiated electric field agreed very well with the measured ones. The measured frequency characteristics of the radiated electric field were almost flat from 1 to 8 GHz. The measured electrical field levels were from 90 to 100 dB/spl mu/V/m.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"22 1","pages":"107-111 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81624109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Feasibility of new nanolayered transparent thin films for active shielding of low frequency magnetic field 新型纳米透明薄膜主动屏蔽低频磁场的可行性
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513653
M. D'amore, M. S. Sarto, A. Tamburrano, F. Sarto
{"title":"Feasibility of new nanolayered transparent thin films for active shielding of low frequency magnetic field","authors":"M. D'amore, M. S. Sarto, A. Tamburrano, F. Sarto","doi":"10.1109/ISEMC.2005.1513653","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513653","url":null,"abstract":"The feasibility of low-frequency magnetic field active shielding by using transparent metals is investigated. The basics of transparent metals and of the nanotechnology exploited to realize a test sample made of silver and titanium oxide are provided. The design of the shield is carried out by evaluating the maximum current capability of the transparent metal as function of the working temperature in order to assess the performance of the proposed new active shielding technique, which avoids the use of bulk conductors for the current flow. The sensitivity analysis of the efficiency of the transparent active shield proposed is performed by numerical simulations, considering a 2D-test enclosure with an optical aperture, excited by an inner a.c. current source at 50 Hz.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"132 1","pages":"900-905 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79637430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Investigation of radiation source using disc-cone antenna with optical/electrical converter operating from 1 to 10 GHz 1 ~ 10ghz光/电转换器圆盘锥天线辐射源的研究
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513550
T. Nishimura, N. Kuwabara, F. Amemiya
{"title":"Investigation of radiation source using disc-cone antenna with optical/electrical converter operating from 1 to 10 GHz","authors":"T. Nishimura, N. Kuwabara, F. Amemiya","doi":"10.1109/ISEMC.2005.1513550","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513550","url":null,"abstract":"The recent progress of radio wave communication and high-speed electrical equipment has brought the need for radiation sources operating at more than 1 GHz to evaluate EMC test facilities and shielding characteristics. This paper proposes a radiation source using a disc-cone antenna with an O/E converter. A wire grid model construction based on a triangle was studied to maintain the wire density constantly, and a laser diode with an electroabsorption (EA) device was used as the E/O converter. The radiation source was constructed, and the characteristics were measured in an anechoic chamber from 0.3 to 10 GHz. The investigation indicated that the calculation accuracy was improved to employ the wire grid model based on a triangle, and the deviation between the calculated value and the measured value is within /spl plusmn/3 dB from 1 to 10 GHz. This also indicated that the deviation of the gain is within /spl plusmn/5 dB from 1 to 10 GHz and the maximum radiated field is more than 0.1 V/m at a distance of 1 m. Using the radiation source, the shielding effect of the PC case was investigated. The results indicated that the shielding effect decreased in proportion with the increase in frequency, and a careful design is important for maintaining the shielding effect in this frequency range.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"18 1","pages":"414-419 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85053233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The integrated error against log frequency (IELF) method for CEM validation 基于对数频率积分误差(IELF)的CEM验证方法
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513517
R. Simpson, C.R. Jones, I. Macdiarmid, A. Duffy, D. Coleby
{"title":"The integrated error against log frequency (IELF) method for CEM validation","authors":"R. Simpson, C.R. Jones, I. Macdiarmid, A. Duffy, D. Coleby","doi":"10.1109/ISEMC.2005.1513517","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513517","url":null,"abstract":"Data with a high feature density is common within EMC measurements and modeling, particularly in the complex and substantially overmoded environments found in aerospace EMC environments. Comparison of experimental and modeled data based on visual assessment of the graphical representation of the data is common and requires both extensive experience and detailed system knowledge in order to be able to interpret the comparisons with confidence. However, in circumstances where a quantification of this comparison is called for, such as when sharing results across partner organizations, obtaining a single representative figure of merit is challenging. The integrated error against log frequency (IELF) method was developed to provide this quantification. It is based on the view that the most significant aspect of the data to be compared is a function of the difference between the two traces being compared, particularly when the individual features are difficult to discriminate. This paper presents the IELF method and demonstrates its potential.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"296-300 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80460133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
An automatic algorithm for equivalent circuit extraction from noisy frequency responses 基于噪声频率响应的等效电路自动提取算法
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513493
S. Grivet-Talocia, M. Bandinu, F. Canavero
{"title":"An automatic algorithm for equivalent circuit extraction from noisy frequency responses","authors":"S. Grivet-Talocia, M. Bandinu, F. Canavero","doi":"10.1109/ISEMC.2005.1513493","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513493","url":null,"abstract":"This paper presents a fully automatic algorithm for the extraction of equivalent circuits from noisy frequency responses. The application area involves the generation of SPICE-ready macromodels for critical interconnects for signal integrity characterizations. Direct measurements are often employed to obtain a characterization of a given interconnect structure, leading to its frequency-dependent scattering responses. The proposed technique processes these responses and outputs an equivalent circuit. The algorithm is based on a modification of the well-known vector fitting scheme, which has now become a standard tool in EMC and SI studies. The presented improvements focus on robustness to noise, which is always present in measured data, and on automatic order estimation. These issues are addressed via an automatic detection of any spurious poles due to the noise, which are hard relocated in order to maximize the model accuracy. Several application examples are presented to illustrate the excellent capabilities of the new fitting scheme.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"163-168 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89576205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Application of fourier and wavelet transforms to the identification of EMI noise sources in SMPSs 傅立叶和小波变换在smps中电磁干扰噪声源识别中的应用
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513582
L. Coppola, S. Buso, Qian Liu, D. Boroyevich, A. Bell
{"title":"Application of fourier and wavelet transforms to the identification of EMI noise sources in SMPSs","authors":"L. Coppola, S. Buso, Qian Liu, D. Boroyevich, A. Bell","doi":"10.1109/ISEMC.2005.1513582","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513582","url":null,"abstract":"The Fourier and wavelet transform are applied to analyze the signals in a power electronics converter. The wavelet transform makes it possible to have important information about the time evolution of the frequency spectrum. Thank to this post-processing, the source of the harmonic peaks found in the Fourier spectrum can be identified in the time evolution of the signals of the circuit under study","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"28 1","pages":"584-589"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89272059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
New double-shielded power cables generating low magnetic field levels 新型低磁场双屏蔽电力电缆
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513496
M. D'amore, D. Paladino, M. S. Sarto
{"title":"New double-shielded power cables generating low magnetic field levels","authors":"M. D'amore, D. Paladino, M. S. Sarto","doi":"10.1109/ISEMC.2005.1513496","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513496","url":null,"abstract":"The design criteria of new medium voltage cables of a three-phase power line generating very low magnetic field levels are described. The double-shielded cables have the inner screen made of copper and the outer one realized by alloy-49 or steel-1010. The currents induced in the copper shields generate a magnetic field opposite to the one produced by the currents flowing in the inner conductors, thus reducing strongly the external magnetic field. The ferromagnetic shield has the function of confining the magnetic induction flux in order to increase the intensity of the circulating currents in the copper screens. The sizing of the cross-section of the copper screen, which is the crucial aspect of the project, is obtained by means of the thermal analysis of the cables and the computation of the generated magnetic field level. Moreover, the simulation of the three-phase line for the prediction of the power losses is carried out. Prototypes of the new cables are realized and the measurement of the 50 Hz magnetic field generated by the three-phase test line, 25 m long, is carried out in the laboratory. The very low levels of the measured magnetic induction prove the good performances of the new cables.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"179-184 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89480620","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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