The integrated error against log frequency (IELF) method for CEM validation

Abstract

Data with a high feature density is common within EMC measurements and modeling, particularly in the complex and substantially overmoded environments found in aerospace EMC environments. Comparison of experimental and modeled data based on visual assessment of the graphical representation of the data is common and requires both extensive experience and detailed system knowledge in order to be able to interpret the comparisons with confidence. However, in circumstances where a quantification of this comparison is called for, such as when sharing results across partner organizations, obtaining a single representative figure of merit is challenging. The integrated error against log frequency (IELF) method was developed to provide this quantification. It is based on the view that the most significant aspect of the data to be compared is a function of the difference between the two traces being compared, particularly when the individual features are difficult to discriminate. This paper presents the IELF method and demonstrates its potential.