2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2最新文献_第5页

+Three-step H2Se/Ar/H2S reaction of metal precursors for large area Cu(In,Ga)(Se,S)2 with uniform Ga distribution +金属前驱体H2Se/Ar/H2S三步反应，大面积Cu(In,Ga)(Se,S)2,Ga分布均匀

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2013-01-01 DOI: 10.1109/pvsc-vol2.2012.6656716

Kihwan Kim, Evan Kimberly, Andrew Damiani, G. Hanket, W. Shafarman

引用次数: 1

Multifunctional PECVD layers: Dopant source, passivation, and optics 多功能PECVD层:掺杂源、钝化和光学

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2013-01-01 DOI: 10.1109/pvsc-vol2.2012.6656780

J. Seiffe, F. Pillath, D. Trogus, A. Brand, C. Savio, M. Hofmann, J. Rentsch

引用次数: 0

Changes in cadmium telluride photovoltaic system performance due to spectrum 光谱对碲化镉光伏系统性能的影响

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2013-01-01 DOI: 10.1109/pvsc-vol2.2012.6656768

L. Nelson, Mark Frichtl, A. Panchula

{"title":"Changes in cadmium telluride photovoltaic system performance due to spectrum","authors":"L. Nelson, Mark Frichtl, A. Panchula","doi":"10.1109/pvsc-vol2.2012.6656768","DOIUrl":"https://doi.org/10.1109/pvsc-vol2.2012.6656768","url":null,"abstract":"Seasonal and short-term weather-related changes in the solar spectrum can induce shifts in the performance of photovoltaic (PV) systems that affect both annual energy predictions and system characterization. The spectral shift factor, which is a metric indicative of how much the performance of a PV system will vary from nameplate due to deviations from the ASTM G173 spectrum (air mass of 1.5), is predicted using TMY3 data and the simple model of the atmospheric radiative transfer for sunshine (SMARTS) model and is correlated with cadmium telluride (CdTe) PV system performance in four different climates. The predicted spectral shift factors for CdTe systems show improved performance in the late summer and early fall and diminished performance in the winter. These intraannual variations can be as large as ±3%, but annual spectral shift factors are typically within ± 1% of nameplate. The spectral shift factor of CdTe systems was found to be most sensitive to the precipitable water content of the atmosphere. Consequently, a parameterization of CdTe spectral shift factor as an exponential function of precipitable water is derived using the outputs of the SMARTS model in 11 locations. This parameterization is shown to predict observed monthly and daily fluctuations in CdTe PV performance. Future efforts will incorporate this methodology into energy predictions that will reduce uncertainty.","PeriodicalId":6420,"journal":{"name":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2013-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89230629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 18

On the interplay between microstructure and interfaces in high-efficiency microcrystalline silicon solar cells 高效微晶硅太阳电池微结构与界面的相互作用

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2013-01-01 DOI: 10.1109/pvsc-vol2.2013.6656747

S. Hanni, D. Alexander, L. Ding, G. Bugnon, M. Boccard, C. Battaglia, P. Cuony, J. Escarré, G. Parascandolo, S. Nicolay, M. Cantoni, M. Despeisse, F. Meillaud, C. Ballif

引用次数: 1

Life cycle water usage in CdTe photovoltaics CdTe光伏电池的生命周期用水

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2013-01-01 DOI: 10.1109/pvsc-vol2.2013.6656781

P. Sinha, A. Meader, M. de Wild-Scholten

引用次数: 0

Integration and reliability of ultra thin silicon solar cells and modules fabricated using SOM® technology 采用SOM®技术制造的超薄硅太阳能电池和模块的集成和可靠性

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2012-10-26 DOI: 10.4229/27THEUPVSEC2012-3CV.2.37

D. Jawarani, Dewei Xu, Scott Smith, R. Rao, L. Mathew, S. Saha, D. Sarkar, S. Banerjee, P. Ho

{"title":"Integration and reliability of ultra thin silicon solar cells and modules fabricated using SOM® technology","authors":"D. Jawarani, Dewei Xu, Scott Smith, R. Rao, L. Mathew, S. Saha, D. Sarkar, S. Banerjee, P. Ho","doi":"10.4229/27THEUPVSEC2012-3CV.2.37","DOIUrl":"https://doi.org/10.4229/27THEUPVSEC2012-3CV.2.37","url":null,"abstract":"Thin crystalline silicon solar cells are of interest due to significant material cost reduction and potentially high conversion efficiency. We have previously demonstrated a patented, novel exfoliation technology capable of producing large area (156×156 mm) 25 µm thin flexible mono c-Si cells with high efficiencies. In this paper we address the mechanical strength and handling requirements of these foils during wafer transfer, cell processing and module integration. Based on a bi-material foil composed of thin monocrystalline silicon and a supporting substrate fabricated using our novel SOM® (Semiconductor on Metal) kerf-less exfoliation process, closed-form mechanical analyses are introduced and developed to evaluate their strength and fracture behaviors. These analyses include the thermal stresses in the composite films and the effect of surface texturing on the fracture behavior of silicon in these foils. Functional cells were fabricated and module reliability results that include thermal shock and highly accelerated stress tests (HAST) are also shown in this paper.","PeriodicalId":6420,"journal":{"name":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82670694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Overirradiance (cloud enhancement) events at high latitudes 高纬度地区的过辐照度(云增强)事件

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2012-10-26 DOI: 10.4229/27THEUPVSEC2012-4BV.4.50

G. Yordanov, O. Midtgård, T. O. Saetre, Henrik Kofoed Nielsen, L. Norum

引用次数: 25

PV inverter performance and reliability: What is the role of the bus capacitor? 光伏逆变器性能与可靠性:母线电容的作用是什么?

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2012-06-03 DOI: 10.1109/PVSC-VOL2.2012.6656709

J. Flicker, R. Kaplar, M. Marinella, J. Granata

引用次数: 36

Preliminary temperature accelerated life test (ALT) on III-V commercial concentrator triple-junction solar cells III-V型商用聚光器三结太阳能电池的初步温度加速寿命试验

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2012-06-03 DOI: 10.1109/PVSC-VOL2.2012.6750496

P. Espinet-González, C. Algora, V. Orlando, N. Núñez, M. Vázquez, J. Bautista, H. Xiugang, L. Barrutia, I. Rey‐Stolle, K. Araki

{"title":"Preliminary temperature accelerated life test (ALT) on III-V commercial concentrator triple-junction solar cells","authors":"P. Espinet-González, C. Algora, V. Orlando, N. Núñez, M. Vázquez, J. Bautista, H. Xiugang, L. Barrutia, I. Rey‐Stolle, K. Araki","doi":"10.1109/PVSC-VOL2.2012.6750496","DOIUrl":"https://doi.org/10.1109/PVSC-VOL2.2012.6750496","url":null,"abstract":"A quantitative temperature accelerated life test on sixty GaInP/GaInAs/Ge triple-junction commercial concentrator solar cells is being carried out. The final objective of this experiment is to evaluate the reliability, warranty period, and failure mechanism of high concentration solar cells in a moderate period of time. The acceleration of the degradation is realized by subjecting the solar cells at temperatures markedly higher than the nominal working temperature under a concentrator, while the photo-current nominal conditions are emulated by injecting current in darkness. Three experiments at three different temperatures are necessary in order to obtain the acceleration factor which relates the time at the stress level with the time at nominal working conditions. However, up to now only the test at the highest temperature has finished. Therefore, we can not provide complete reliability information but we have analyzed the life data and the failure mode of the solar cells inside the climatic chamber at the highest temperature. The failures have been all of them catastrophic. In fact, the solar cells have turned into short circuits. We have fitted the failure distribution to a two parameters Weibull function. The failures are wear-out type. We have observed that the busbar and the surrounding fingers are completely deteriorated.","PeriodicalId":6420,"journal":{"name":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73771662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

The plasmonics front electrodes applied to thin film solar cells 等离子体前电极应用于薄膜太阳能电池

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Pub Date : 2012-06-03 DOI: 10.1109/PVSC-VOL2.2012.6750498

A. Kolodziej, W. Baranowski, Michał Kołodziej, T. Kolodziej

引用次数: 1