2013 IEEE International Test Conference (ITC)最新文献_第6页

An enhanced procedure for calculating dynamic properties of high-performance DAC on ATE 在ATE上计算高性能DAC动态特性的增强程序

2013 IEEE International Test Conference (ITC) Pub Date : 2013-09-01 DOI: 10.1109/TEST.2013.6651877

Ming-Hsien Lu

引用次数: 0

ATE test time reduction using asynchronous clock period 使用异步时钟周期减少ATE测试时间

2013 IEEE International Test Conference (ITC) Pub Date : 2013-09-01 DOI: 10.1109/TEST.2013.6651931

P. Venkataramani, V. Agrawal

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引用次数: 10

Test-yield improvement of high-density probing technology using optimized metal backer with plastic patch 利用优化后的塑料贴片金属垫片提高高密度探测技术的测试良率

2013 IEEE International Test Conference (ITC) Pub Date : 2013-09-01 DOI: 10.1109/TEST.2013.6651888

Sen-Kuei Hsu, Hao Chen, Chung-Han Huang, Der-Jiann Liu, Wei-Hsun Lin, Hung-Chih Lin, C. Peng, Min-Jer Wang

引用次数: 0

Two-level compression through selective reseeding 通过选择性重新播种进行两级压缩

2013 IEEE International Test Conference (ITC) Pub Date : 2013-03-15 DOI: 10.1109/TEST.2013.6651896

P. Wohl, J. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, J. E. Colburn

引用次数: 4

A test probe for TSV using resonant inductive coupling 一种采用谐振电感耦合的TSV测试探头

2013 IEEE International Test Conference (ITC) Pub Date : 2013-01-01 DOI: 10.1109/itc.2013.6861555

R. Rashidzadeh, I. Basith

引用次数: 2