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Sensor-wise methodology to face NBTI stress of NoC buffers 面对NoC缓冲的NBTI压力的传感器智能方法
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.216
Davide Zoni, W. Fornaciari
{"title":"Sensor-wise methodology to face NBTI stress of NoC buffers","authors":"Davide Zoni, W. Fornaciari","doi":"10.7873/DATE.2013.216","DOIUrl":"https://doi.org/10.7873/DATE.2013.216","url":null,"abstract":"Networks-on-Chip (NoCs) are a key component for the new many-core architectures, from the performance and reliability stand-points. Unfortunately, continuous scaling of CMOS technology poses severe concerns regarding failure mechanisms such as NBTI and stress-migration. Process variation makes harder the scenario, decreasing device lifetime and performance predictability during chip fabrication. This paper presents a novel cooperative sensor-wise methodology to reduce the NBTI degradation in the network on-chip (NoC) virtual channel (VC) buffers, considering process variation effects as well. The changes introduced to the reference NoC model exhibit an area overhead below 4%. Experimental validation is obtained using a cycle accurate simulator considering both real and synthetic traffic patterns. We compare our methodology to the best sensor-less round-robin approach used as reference model. The proposed sensor-wise strategy achieves up to 26.6% and 18.9% activity factor improvement over the reference policy on synthetic and real traffic patterns respectively. Moreover a net NBTI Vth saving up to 54.2% is shown against the baseline NoC that does not account for NBTI.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"2 1","pages":"1038-1043"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76765368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
D-MRAM cache: Enhancing energy efficiency with 3T-1MTJ DRAM / MRAM hybrid memory D-MRAM高速缓存:利用3T-1MTJ DRAM / MRAM混合存储器提高能源效率
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.363
H. Noguchi, K. Nomura, K. Abe, S. Fujita, Eishi Arima, Kyundong Kim, Takashi Nakada, Shinobu Miwa, Hiroshi Nakamura
{"title":"D-MRAM cache: Enhancing energy efficiency with 3T-1MTJ DRAM / MRAM hybrid memory","authors":"H. Noguchi, K. Nomura, K. Abe, S. Fujita, Eishi Arima, Kyundong Kim, Takashi Nakada, Shinobu Miwa, Hiroshi Nakamura","doi":"10.7873/DATE.2013.363","DOIUrl":"https://doi.org/10.7873/DATE.2013.363","url":null,"abstract":"This paper describes a proposal of non-volatile cache architecture utilizing novel DRAM / MRAM cell-level hybrid structured memory (D-MRAM) that enables effective power reduction for high performance mobile SoCs without area overhead. Here, the key point to reduce active power is intermittent refresh process for the DRAM-mode. D-MRAM has advantage to reduce static power consumptions compared to the conventional SRAM, because there are no static leakage paths in the D-MRAM cell and it is not needed to supply voltage to its cells when used as the MRAM-mode. Besides, with advanced perpendicular magnetic tunnel junctions (p-MTJ), which decreases the write energy and latency without shortening its retention time, D-MRAM is capable of power reduction by replacing the traditional SRAM caches. Considering the 65-nm CMOS technology, the access latencies of 1MB memory macro are 2.2 ns / 1.5 ns for read / write in DRAM mode, and 2.2 ns / 4.5 ns in MRAM mode, while those of SRAM are 1.17 ns. The SPEC CPU2006 benchmarks have revealed that the energy per instruction (EPI) of the total cache memory can be dramatically reduced by 71 % on average, and the instruction per cycle (IPC) performance of the D-MRAM cache architecture degraded only by approximately 4 % on average in spite of its latency overhead.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"15 1","pages":"1813-1818"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75555366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Reliability analysis reloaded: How will we survive? 可靠性分析重装上阵:我们将如何生存?
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.084
R. Aitken, G. Fey, Z. Kalbarczyk, F. Reichenbach, M. Reorda
{"title":"Reliability analysis reloaded: How will we survive?","authors":"R. Aitken, G. Fey, Z. Kalbarczyk, F. Reichenbach, M. Reorda","doi":"10.7873/DATE.2013.084","DOIUrl":"https://doi.org/10.7873/DATE.2013.084","url":null,"abstract":"In safety related applications and in products with long lifetimes reliability is a must. Moreover, facing future technology nodes of integrated circuit device level reliability may decrease, i.e., counter-measures have to be taken to ensure product level reliability. But assessing the reliability of a large system is not a trivial task. This paper revisits the state-of-the-art in reliability evaluation starting from the physical device level, to the software system level, all the way up to the product level. Relevant standards and future trends are discussed.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"18 1","pages":"358-367"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82428852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Optimizing BDDs for Time-Series dataset manipulation 优化bdd用于时间序列数据集操作
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.212
S. Stergiou, J. Jain
{"title":"Optimizing BDDs for Time-Series dataset manipulation","authors":"S. Stergiou, J. Jain","doi":"10.7873/DATE.2013.212","DOIUrl":"https://doi.org/10.7873/DATE.2013.212","url":null,"abstract":"In this work we advocate the adoption of Binary Decision Diagrams (BDDs) for storing and manipulating Time-Series datasets. We first propose a generic BDD transformation which identifies and removes 50% of all BDD edges without any loss of information. Following, we optimize the core operation for adding samples to a dataset and characterize its complexity. We identify time-range queries as one of the core operations executed on time-series datasets, and describe explicit Boolean function constructions that aid in efficiently executing them directly on BDDs. We exhibit significant space and performance gains when applying our algorithms on synthetic and real-life biosensor time-series datasets collected from field trials.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"17 1","pages":"1018-1021"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80229194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Vertically-stacked double-gate nanowire FETs with controllable polarity: From devices to regular ASICs 具有可控极性的垂直堆叠双栅纳米线场效应管:从器件到常规asic
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.137
P. Gaillardon, L. Amarù, Shashikanth Bobba, M. D. Marchi, D. Sacchetto, Y. Leblebici, G. Micheli
{"title":"Vertically-stacked double-gate nanowire FETs with controllable polarity: From devices to regular ASICs","authors":"P. Gaillardon, L. Amarù, Shashikanth Bobba, M. D. Marchi, D. Sacchetto, Y. Leblebici, G. Micheli","doi":"10.7873/DATE.2013.137","DOIUrl":"https://doi.org/10.7873/DATE.2013.137","url":null,"abstract":"Vertically stacked nanowire FETs (NWFETs) with gate-all-around structure are the natural and most advanced extension of FinFETs. At advanced technology nodes, many devices exhibit ambipolar behavior, i.e., the device shows n- and p-type characteristics simultaneously. In this paper, we show that, by engineering of the contacts and by constructing independent double-gate structures, the device polarity can be electrostatically programmed to be either n- or p-type. Such a device enables a compact realization of XOR-based logic functions at the cost of a denser interconnect. To mitigate the added area/routing overhead caused by the additional gate, an approach for designing an efficient regular layout, called Sea-of-Tiles is presented. Then, specific logic synthesis techniques, supporting the higher expressive power provided by this technology, are introduced and used to showcase the performance of the controllable-polarity NWFETs circuits in comparison with traditional CMOS circuits.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"52 1","pages":"625-630"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81167321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
An integrated approach for managing the lifetime of flash-based SSDs 用于管理基于闪存的ssd的生命周期的集成方法
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.309
Sungjin Lee, Taejin Kim, Jisung Park, Jihong Kim
{"title":"An integrated approach for managing the lifetime of flash-based SSDs","authors":"Sungjin Lee, Taejin Kim, Jisung Park, Jihong Kim","doi":"10.7873/DATE.2013.309","DOIUrl":"https://doi.org/10.7873/DATE.2013.309","url":null,"abstract":"As the semiconductor process is scaled down, the endurance of NAND flash memory greatly deteriorates. To overcome such a poor endurance characteristic and to provide a reasonable storage lifetime, system-level endurance enhancement techniques are rapidly adopted in recent NAND flash-based storage devices like solid-state drives (SSDs). In this paper, we propose an integrated lifetime management approach for SSDs. The proposed lifetime management technique combines several lifetime-enhancement schemes, including lossless compression, deduplication, and performance throttling, in an integrated fashion so that the lifetime of SSDs can be maximally extended. By selectively disabling less effective lifetime-enhancement schemes, the proposed technique achieves both high performance and high energy efficiency while meeting the required lifetime. Our evaluation results show that the proposed technique, over the SSDs with no lifetime management schemes, improves write performance by up to 55% and reduces energy consumption by up to 43% while satisfying a 5-year lifetime warranty.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"33 1","pages":"1522-1525"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82730040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
A parallel fast transform-based preconditioning approach for electrical-thermal co-simulation of power delivery networks 输电网电-热联合仿真中一种基于并行快速变换的预处理方法
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.341
Konstantis Daloukas, Alexia Marnari, N. Evmorfopoulos, P. Tsompanopoulou, G. Stamoulis
{"title":"A parallel fast transform-based preconditioning approach for electrical-thermal co-simulation of power delivery networks","authors":"Konstantis Daloukas, Alexia Marnari, N. Evmorfopoulos, P. Tsompanopoulou, G. Stamoulis","doi":"10.7873/DATE.2013.341","DOIUrl":"https://doi.org/10.7873/DATE.2013.341","url":null,"abstract":"Efficient analysis of massive on-chip power delivery networks is among the most challenging problems facing the EDA industry today. Due to Joule heating effect and the temperature dependence of resistivity, temperature is one of the most important factors that affect IR drop and must be taken into account in power grid analysis. However, the sheer size of modern power delivery networks (comprising several thousands or millions of nodes) usually forces designers to neglect thermal effects during IR drop analysis in order to simplify and accelerate simulation. As a result, the absence of accurate estimates of Joule heating effect on IR drop analysis introduces significant uncertainty in the evaluation of circuit functionality. This work presents a new approach for fast electrical-thermal co-simulation of large-scale power grids found in contemporary nanometer-scale ICs. A state-of-the-art iterative method is combined with an efficient and extremely parallel preconditioning mechanism, which enables harnessing the computational resources of massively parallel architectures, such as graphics processing units (GPUs). Experimental results demonstrate that the proposed method achieves a speedup of 66.1X for a 3.1M-node design over a state-of-the-art direct method and a speedup of 22.2X for a 20.9M-node design over a state-of-the-art iterative method when GPUs are utilized.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"47 1","pages":"1689-1694"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87193039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Minimization of P-circuits using boolean relations 用布尔关系最小化p电路
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.208
A. Bernasconi, V. Ciriani, G. Trucco, T. Villa
{"title":"Minimization of P-circuits using boolean relations","authors":"A. Bernasconi, V. Ciriani, G. Trucco, T. Villa","doi":"10.7873/DATE.2013.208","DOIUrl":"https://doi.org/10.7873/DATE.2013.208","url":null,"abstract":"In this paper, we investigate how to use the complete flexibility of P-circuits, which realize a Boolean function by projecting it onto overlapping subsets given by a generalized Shannon decomposition. It is known how to compute the complete flexibility of P-circuits, but the algorithms proposed so far for its exploitation do not guarantee to find the best implementation, because they cast the problem as the minimization of an incompletely specified function. Instead, here we show that to explore all solutions we must set up the problem as the minimization of a Boolean relation, because there are don't care conditions that cannot be expressed by single cubes. In the experiments we report major improvements with respect to the previously published results.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"8 1","pages":"996-1001"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87563617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Share with care: A quantitative evaluation of sharing approaches in high-level synthesis 谨慎分享:高层次综合中分享方法的定量评价
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.7873/DATE.2013.315
A. Kondratyev, L. Lavagno, M. Meyer, Yosinori Watanabe
{"title":"Share with care: A quantitative evaluation of sharing approaches in high-level synthesis","authors":"A. Kondratyev, L. Lavagno, M. Meyer, Yosinori Watanabe","doi":"10.7873/DATE.2013.315","DOIUrl":"https://doi.org/10.7873/DATE.2013.315","url":null,"abstract":"This paper focuses on the resource sharing problem when performing high-level synthesis. It argues that the conventionally accepted synthesis flow when resource sharing is done after scheduling is sub-optimal because it cannot account for timing penalties from resource merging. The paper describes a competitive approach when resource sharing and scheduling are performed simultaneously. It provides a quantitative evaluation of both approaches and shows that performing sharing during scheduling wins over the conventional approach in terms of quality of results.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"33 1","pages":"1547-1552"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87726158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Breaking the energy Barrier in fault-tolerant caches for multicore systems 打破多核系统容错缓存中的能量屏障
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2013-03-18 DOI: 10.5555/2485288.2485466
P. Ampadu, Meilin Zhang, V. Stojanović
{"title":"Breaking the energy Barrier in fault-tolerant caches for multicore systems","authors":"P. Ampadu, Meilin Zhang, V. Stojanović","doi":"10.5555/2485288.2485466","DOIUrl":"https://doi.org/10.5555/2485288.2485466","url":null,"abstract":"Balancing cache energy efficiency and reliability is a major challenge for future multicore system design. Supply voltage reduction is an effective tool to minimize cache energy consumption, usually at the expense of increased number of errors. To achieve substantial energy reduction without degrading reliability, we propose an adaptive fault-tolerant cache architecture, which provides appropriate error control for each cache line based on the number of faulty cells detected at reduced supply voltages. Our experiments show that the proposed approach can improve energy efficiency by more than 25% and energy-execution time product by over 10%, while improving reliability up to 4X using Mean-Error-To-Failure (METF) metric, compared to the next-best solution at the cost of 0.08% storage overhead.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"15 1","pages":"731-736"},"PeriodicalIF":0.0,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87042791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
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