Reliability analysis reloaded: How will we survive?

R. Aitken, G. Fey, Z. Kalbarczyk, F. Reichenbach, M. Reorda
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引用次数: 17

Abstract

In safety related applications and in products with long lifetimes reliability is a must. Moreover, facing future technology nodes of integrated circuit device level reliability may decrease, i.e., counter-measures have to be taken to ensure product level reliability. But assessing the reliability of a large system is not a trivial task. This paper revisits the state-of-the-art in reliability evaluation starting from the physical device level, to the software system level, all the way up to the product level. Relevant standards and future trends are discussed.
可靠性分析重装上阵:我们将如何生存?
在与安全相关的应用和长寿命的产品中,可靠性是必须的。此外,面对未来集成电路的技术节点,器件级可靠性可能会下降,也就是说,必须采取对策来保证产品级可靠性。但是评估一个大型系统的可靠性并不是一件小事。本文回顾了可靠性评估的最新进展,从物理设备级开始,到软件系统级,一直到产品级。讨论了相关标准和未来发展趋势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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