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Whole Campaign Emulation with Reinforcement Learning for Cyber Test 基于强化学习的网络测试全战役仿真
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/MIM.2023.10208253
Tyler Cody, Emma Meno, P. Beling, Laura Freeman
{"title":"Whole Campaign Emulation with Reinforcement Learning for Cyber Test","authors":"Tyler Cody, Emma Meno, P. Beling, Laura Freeman","doi":"10.1109/MIM.2023.10208253","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208253","url":null,"abstract":"Cyber-attacks pose existential, nation-level threats and directly challenge societal stability. The breadth of targets (small businesses to nation-states) and continuous nature of cyber-attacks make automated cyber test and evaluation (T&E) crucial to national security and domestic prosperity. Importantly, automation lowers the cost and increases the frequency of cyber T&E, thereby simultaneously increasing cyber test availability and coverage. Spurred by market demand as well as advancements in artificial intelligence (AI), automated approaches to penetration testing have seen a resurgence of interest in the academic literature. Yet to date, this burgeoning research community lacks a shared, long-term vision. Recently, we proposed a concept of whole campaign emulation (WCE) as a challenge problem and framework for automated penetration testing with reinforcement learning (RL) [1]. In this article, we review the state-of-the-art in RL-based automated penetration testing, assess its relation to WCE, and provide a case study using the open-source Network Attack Simulator (NASim) [2].","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"25-30"},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49634130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Society Officers 社会人员
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/mim.2023.10208258
{"title":"Society Officers","authors":"","doi":"10.1109/mim.2023.10208258","DOIUrl":"https://doi.org/10.1109/mim.2023.10208258","url":null,"abstract":"","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136065107","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Risk-Based Approach to Prognostics and Health Management Combining Bayesian Networks and Continuous-Time Bayesian Networks 结合贝叶斯网络和连续时间贝叶斯网络的基于风险的预测和健康管理方法
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/MIM.2023.10208251
Jordan Schupbach, Elliott Pryor, Kyle Webster, John W. Sheppard
{"title":"A Risk-Based Approach to Prognostics and Health Management Combining Bayesian Networks and Continuous-Time Bayesian Networks","authors":"Jordan Schupbach, Elliott Pryor, Kyle Webster, John W. Sheppard","doi":"10.1109/MIM.2023.10208251","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208251","url":null,"abstract":"Performing general prognostics and health management (PHM), especially in electronic systems, continues to present significant challenges. The low availability of failure data makes learning generalized models difficult and constructing generalized models during the design phase often requires a level of understanding of the failure mechanisms that elude the designers. In this paper, we present a generalized approach to PHM based on two types of probabilistic models, Bayesian Networks (BNs) and Continuous-Time Bayesian Networks (CTBNs), and we pose the PHM problem from the perspective of risk mitigation rather than failure prediction. This paper also constitutes an extension of previous work where we proposed this framework initially [1]. In this extended version, we also provide a comparison of exact and approximate sample-based inference for CTBNs to provide practical guidance on conducting inference using the proposed framework.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"3-11"},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42088884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
President's Message 总统的消息
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/mim.2023.10208250
Juan Manuel Ramirez Cortés, Mark E. Davis
{"title":"President's Message","authors":"Juan Manuel Ramirez Cortés, Mark E. Davis","doi":"10.1109/mim.2023.10208250","DOIUrl":"https://doi.org/10.1109/mim.2023.10208250","url":null,"abstract":"On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136065108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Five Guidelines for Practical Compressive Sensing with a Case Study in Antenna Pattern Measurement 实用压缩传感的五个指南——以天线方向图测量为例
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/MIM.2023.10208254
M. Don, Gonzalo R. Arce
{"title":"Five Guidelines for Practical Compressive Sensing with a Case Study in Antenna Pattern Measurement","authors":"M. Don, Gonzalo R. Arce","doi":"10.1109/MIM.2023.10208254","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208254","url":null,"abstract":"Compressive sensing (CS) is a signal processing technique that has found applications in numerous fields, providing benefits such as lower power consumption, reduced memory usage, higher resolution, and faster measurement speed. Despite the vast theoretical advancements in CS, its commercial applications have been slow to develop. Moreover, alternative sensing strategies may outperform CS in many real-world scenarios. In a previous publication [1], five guidelines were proposed to facilitate the use of CS in practical applications. In this follow-on article, we delve into each of these guidelines in detail, using compressive antenna pattern measurement as a case study. By understanding the limitations of CS and choosing appropriate applications, the test and measurement community will be able to successfully utilize its benefits in practical systems.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"12-17"},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45297350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simple Offset Elimination Technique for Two-Wire Measurements 双线测量的简单偏移消除技术
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/MIM.2023.10208249
M. Obrecht
{"title":"Simple Offset Elimination Technique for Two-Wire Measurements","authors":"M. Obrecht","doi":"10.1109/MIM.2023.10208249","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208249","url":null,"abstract":"Measuring small inductors and capacitors can be challenging with the use of conventional LCR-meters that have a test frequency of 10 kHz or less. With a 10 nH inductor at 10 kHz, the impedance is only 6 mOhms, that is comparable to the resistance of the probes. At a frequency of 100 kHz, the impedance increases to 60 mOhms. On the other hand, a 1 pF capacitor at 10 kHz results in an impedance of 15 MOhms, which makes a capacitive connection between the probes noticeable and affects the measurement of impedance. This paper presents two case studies: an extraction the parasitic inductance of the two-wire probes using the HP4284A LCR-meter and HP16034E test fixture, and extraction of the parasitic capacitance using the LCR-Reader-R2 tweezer-meter. This method enables accurate measurements of sub-nH inductors and sub-pF capacitors using test frequencies below 300 kHz.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"45-50"},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46758216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
List of Reviewers 审稿人名单
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/mim.2023.10208256
{"title":"List of Reviewers","authors":"","doi":"10.1109/mim.2023.10208256","DOIUrl":"https://doi.org/10.1109/mim.2023.10208256","url":null,"abstract":"","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136065109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enabling the Department of Defense's Future to Test and Evaluate Artificial Intelligence Enabled Systems 使国防部的未来能够测试和评估人工智能系统
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/MIM.2023.10208252
F. Reeder, Carol Pomales, Diane M. Kotras, James Lockett
{"title":"Enabling the Department of Defense's Future to Test and Evaluate Artificial Intelligence Enabled Systems","authors":"F. Reeder, Carol Pomales, Diane M. Kotras, James Lockett","doi":"10.1109/MIM.2023.10208252","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208252","url":null,"abstract":"While of great potential benefit, Artificial Intelligence (AI) presents new challenges and exacerbates some existing ones for the Department of Defense (DoD) Test and Evaluation (T&E) community. T&E professionals will need to work to ensure that AI-enabled systems' (AIES) complex and variable nature can be sufficiently characterized by the boundaries of acceptable performance. To help the DoD understand and prepare for the challenges of T&E of AIES, we convened a group of AI adoption, AI development, and policy experts to develop a future vision of T&E with respect to AI. The result is a vision of T&E that incorporates the unique requirements for AIES, encompassing policy changes, user engagement approaches, measures and metrics, data, infrastructure, and cybersecurity. This future vision is accomplishable by identifying focus for efforts across DoD, academia, Federally Funded Research and Development Centers (FFRDCs) and industry to provide processes, policy/standards, tools, data, and infrastructure. Thus, we can assure a more feasible future for the T&E of AIES.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"31-38"},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48792918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Open Journal of Instrumentation and Measurement IEEE仪器与测量开放杂志
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/mim.2023.10208260
{"title":"IEEE Open Journal of Instrumentation and Measurement","authors":"","doi":"10.1109/mim.2023.10208260","DOIUrl":"https://doi.org/10.1109/mim.2023.10208260","url":null,"abstract":"","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136065105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Newproducts Newproducts
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-08-01 DOI: 10.1109/mim.2023.10209400
Robert M. Goldberg
{"title":"Newproducts","authors":"Robert M. Goldberg","doi":"10.1109/mim.2023.10209400","DOIUrl":"https://doi.org/10.1109/mim.2023.10209400","url":null,"abstract":"Reports on new products and technologies in the area of instrumentation and measurement industry.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136065106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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