President's Message

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Juan Manuel Ramirez Cortés, Mark E. Davis
{"title":"President's Message","authors":"Juan Manuel Ramirez Cortés, Mark E. Davis","doi":"10.1109/mim.2023.10208250","DOIUrl":null,"url":null,"abstract":"On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mim.2023.10208250","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.
总统的消息
我谨代表仪器与测量学会(IMS)欢迎大家来到本期特别版的仪器与测量杂志,该杂志由AUTOTESTCON 2022期间发表的精选论文组成。会议委员会进行了彻底的审查程序,以接受在会议上提交的文件。随后,一些作者被邀请提交其论文的扩充版,以使这一期特刊面向广大读者。正如你所看到的,最佳学生论文和最佳技术论文也被自豪地收录在这个版本中。我要祝贺作者、编辑和审稿人为实现这一目标所做的宝贵工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Instrumentation & Measurement Magazine
IEEE Instrumentation & Measurement Magazine 工程技术-工程:电子与电气
CiteScore
4.20
自引率
4.80%
发文量
147
审稿时长
>12 weeks
期刊介绍: IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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