Simple Offset Elimination Technique for Two-Wire Measurements

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
M. Obrecht
{"title":"Simple Offset Elimination Technique for Two-Wire Measurements","authors":"M. Obrecht","doi":"10.1109/MIM.2023.10208249","DOIUrl":null,"url":null,"abstract":"Measuring small inductors and capacitors can be challenging with the use of conventional LCR-meters that have a test frequency of 10 kHz or less. With a 10 nH inductor at 10 kHz, the impedance is only 6 mOhms, that is comparable to the resistance of the probes. At a frequency of 100 kHz, the impedance increases to 60 mOhms. On the other hand, a 1 pF capacitor at 10 kHz results in an impedance of 15 MOhms, which makes a capacitive connection between the probes noticeable and affects the measurement of impedance. This paper presents two case studies: an extraction the parasitic inductance of the two-wire probes using the HP4284A LCR-meter and HP16034E test fixture, and extraction of the parasitic capacitance using the LCR-Reader-R2 tweezer-meter. This method enables accurate measurements of sub-nH inductors and sub-pF capacitors using test frequencies below 300 kHz.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"45-50"},"PeriodicalIF":1.6000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MIM.2023.10208249","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

Measuring small inductors and capacitors can be challenging with the use of conventional LCR-meters that have a test frequency of 10 kHz or less. With a 10 nH inductor at 10 kHz, the impedance is only 6 mOhms, that is comparable to the resistance of the probes. At a frequency of 100 kHz, the impedance increases to 60 mOhms. On the other hand, a 1 pF capacitor at 10 kHz results in an impedance of 15 MOhms, which makes a capacitive connection between the probes noticeable and affects the measurement of impedance. This paper presents two case studies: an extraction the parasitic inductance of the two-wire probes using the HP4284A LCR-meter and HP16034E test fixture, and extraction of the parasitic capacitance using the LCR-Reader-R2 tweezer-meter. This method enables accurate measurements of sub-nH inductors and sub-pF capacitors using test frequencies below 300 kHz.
双线测量的简单偏移消除技术
使用测试频率为10kHz或更低的传统LCR仪表测量小型电感器和电容器可能具有挑战性。使用10kHz的10nH电感器,阻抗仅为6mOhms,与探针的电阻相当。在100kHz的频率下,阻抗增加到60mOhms。另一方面,10kHz下的1pF电容器产生15MOhms的阻抗,这使得探针之间的电容连接明显,并影响阻抗的测量。本文介绍了两个案例研究:使用HP4284A LCR计和HP16034E测试夹具提取双线探针的寄生电感,以及使用LCR-Reader-R2镊子计提取寄生电容。该方法能够使用低于300kHz的测试频率精确测量亚nH电感器和亚pF电容器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Instrumentation & Measurement Magazine
IEEE Instrumentation & Measurement Magazine 工程技术-工程:电子与电气
CiteScore
4.20
自引率
4.80%
发文量
147
审稿时长
>12 weeks
期刊介绍: IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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