IEEE Transactions on Electromagnetic Compatibility最新文献

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Lead-Specific Optimization of Transfer Function Validation Pathways for Magnetic Resonance RF Safety Evaluation 磁共振射频安全性评估传递函数验证路径的铅特异性优化
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-15 DOI: 10.1109/TEMC.2025.3566298
Zhichao Wang;Ziyu Zuo;Shuo Song;Jianfeng Zheng;Qingyan Wang;Yu Wang;Wolfgang Kainz;Ji Chen
{"title":"Lead-Specific Optimization of Transfer Function Validation Pathways for Magnetic Resonance RF Safety Evaluation","authors":"Zhichao Wang;Ziyu Zuo;Shuo Song;Jianfeng Zheng;Qingyan Wang;Yu Wang;Wolfgang Kainz;Ji Chen","doi":"10.1109/TEMC.2025.3566298","DOIUrl":"10.1109/TEMC.2025.3566298","url":null,"abstract":"This article presents a novel lead-specific validation method for magnetic resonance radiofrequency safety evaluations on active implantable medical devices (AIMDs). The proposed method designs a set of optimized validation pathways for the specific AIMD lead which achieve 1) high temperature rise or high induced voltages during the validation measurements with 2) minimally correlated electric fields along the pathways inside a electric field generating phantom box. The novel strategy 1) calculates the heating, or the induced voltage, for 603 preselected pathways and ranks these pathways based on temperature rise or voltage values and 2) performs matrix operations on these pathways to select pathways with minimally correlated tangential electric fields to each other. Two commercially available AIMDs were used to demonstrate the effectiveness of this novel strategy. Consequently, the strategy potentially provides a better transfer function validation for AIMD leads in terms of accuracy and completion.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"761-769"},"PeriodicalIF":2.0,"publicationDate":"2025-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144066206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of Radar Absorbing Materials Based on Connected Frequency Selective Surfaces 基于连通频率选择表面的雷达吸波材料设计
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-13 DOI: 10.1109/TEMC.2025.3564363
Vincenzo Violi;Danilo Brizi;Papa Ousmane Leye;Chaouki Kasmi;Islem Yahi;Felix Vega;Agostino Monorchio
{"title":"Design of Radar Absorbing Materials Based on Connected Frequency Selective Surfaces","authors":"Vincenzo Violi;Danilo Brizi;Papa Ousmane Leye;Chaouki Kasmi;Islem Yahi;Felix Vega;Agostino Monorchio","doi":"10.1109/TEMC.2025.3564363","DOIUrl":"10.1109/TEMC.2025.3564363","url":null,"abstract":"This article derives design guidelines for radar absorbing materials (RAM) integrating connected, fishnet-like, resistive frequency selective surfaces (R-FSSs). While R-FSSs have been long used in the radar signature and electromagnetic interferences reduction, nevertheless the configuration where all the unit-cells are physically connected has not been yet thoroughly investigated for this aim. Indeed, the fishnet-like arrangement can guarantee extraordinary key advantages in terms of RAMs fabrication, especially for large production scales. Therefore, this article, by resorting to significant test-cases, aims at deriving practical design procedures to realize advantageous connections among adjacent FSS unit-cells. Specifically, the effects on the overall FSS impedance behavior of the geometrical variations in the unit-cell connections are deeply explored. To ensure the broad applicability of the presented guidelines, the study has been carried out by recurring to an equivalent circuit analysis, based on the transmission line theory, and on accurate full-wave simulations. To prove the practical significance of the developed guidelines, two prototypes of the same RAM based on a resistive and connected FSS have been fabricated. Both in a small flat panel and in a large-scale conformal arrangement, the electromagnetic reflection was drastically reduced in the band between 6 and 18 GHz, while significantly simplifying the fabrication process. In conclusion, the proposed research exhibits promising potential to enable an efficient large-scale fabrication for RAMs, by addressing the difficulties associated with the design of connected unit-cells.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"800-810"},"PeriodicalIF":2.0,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143946238","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ultrawideband Metamaterial Absorber Utilizing Symmetrical Circular Split-Ring Resonator Variants With and Without Extended Cuts for Ku and K-Band Applications 利用对称圆形裂环谐振器变体的超宽带超材料吸收器,有或没有扩展切割,用于Ku和k波段应用
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-12 DOI: 10.1109/TEMC.2025.3542790
Ramesh Amugothu;Vakula Damera
{"title":"Ultrawideband Metamaterial Absorber Utilizing Symmetrical Circular Split-Ring Resonator Variants With and Without Extended Cuts for Ku and K-Band Applications","authors":"Ramesh Amugothu;Vakula Damera","doi":"10.1109/TEMC.2025.3542790","DOIUrl":"10.1109/TEMC.2025.3542790","url":null,"abstract":"This article presents a cutting-edge broadband metamaterial absorber structure designed for wide-angle incidence across the entire Ku- and partial K-band frequency range. The absorber unit cell comprises a symmetrical circular split-ring resonator and extended arcs from another circular split-ring resonator meticulously designed on an FR4 substrate. After thorough parametric optimization and fabrication, simulation results demonstrate an ultrawideband frequency range from 12.52 to 23.66 GHz, with a 98% absorption rate for normal polarizations. The physical mechanism of the proposed metamaterial absorber structure is elucidated by investigating the distribution of the electric field, surface current, and equivalent circuit model. Furthermore, the absorber's compact size (0.14 <inline-formula><tex-math>$lambda _{0}$</tex-math></inline-formula>) and cost-effectiveness (FR4 substrate) enable seamless integration into various devices. The novel design strikes a remarkable balance between cost and performance, effectively meeting the stringent requirements of Ku and K-band applications owing to its broad frequency range and outstanding attributes.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"811-820"},"PeriodicalIF":2.0,"publicationDate":"2025-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143607771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Component Level EM Emission Assessment and Management for RF Desensitization 射频脱敏的元件级电磁发射评估与管理
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-10 DOI: 10.1109/TEMC.2025.3539591
Xiangrui Su;Wenchang Huang;Junghee Cho;Joonki Paek;Chulsoon Hwang
{"title":"Component Level EM Emission Assessment and Management for RF Desensitization","authors":"Xiangrui Su;Wenchang Huang;Junghee Cho;Joonki Paek;Chulsoon Hwang","doi":"10.1109/TEMC.2025.3539591","DOIUrl":"10.1109/TEMC.2025.3539591","url":null,"abstract":"Radio frequency (RF) desensitization is a common issue caused by high-speed components in modern electronic devices. Consequently, numerous studies have focused on characterizing and quantifying electromagnetic (EM) emission sources by using near field scanning to detect EM noise sources. However, before near field scanning, no predetermined threshold is available to quickly assess whether an EM noise source will pose RF desensitization risks in the receiving antenna. This article presents a method to optimize near field scanning settings through EM emission management analysis. Drawing on experience from numerous EM emission studies, we introduce an EM emission management procedure for two common noise sources: dipole-like noise sources and cavity noise sources. The scanning results of three practical examples are provided to validate the efficiency of the proposed EM emission management analysis.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"578-586"},"PeriodicalIF":2.0,"publicationDate":"2025-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143599512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
LED Lamp Flicker Assessment Under Distorted Grid Voltage in Both Harmonic and Supraharmonic Ranges 谐波和超谐波电压畸变下的LED灯闪变评估
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-06 DOI: 10.1109/TEMC.2025.3556986
Marwa S. Osheba;Abdellatif M. Aboutaleb;Jan Desmet;Jos Knockaert
{"title":"LED Lamp Flicker Assessment Under Distorted Grid Voltage in Both Harmonic and Supraharmonic Ranges","authors":"Marwa S. Osheba;Abdellatif M. Aboutaleb;Jan Desmet;Jos Knockaert","doi":"10.1109/TEMC.2025.3556986","DOIUrl":"10.1109/TEMC.2025.3556986","url":null,"abstract":"Supraharmonic (SH) background distortions are blamed for light flickers produced from LED lamps with no clear evidence in literature. Consequently, this article is structured to investigate the effect of the background distortions in the harmonic and SH ranges on the light flickers produced from low power LED lamps that are widely used in residential applications. Four scenarios are performed: The first and second scenarios are done by exposing the LED lamp to a background distortion with harmonic and interharmonic voltage components, respectively. The third and fourth scenarios explore the impact of the grid voltage distortion in the SH range with frequencies that are integer and noninteger multiples of the grid frequency, respectively, on LED lamp flickers. The conducted study comes to the conclusion that visible flicker only appears for scenario 2, in which the visible flicker effect is in inverse relationship with the interharmonic frequencies. In both scenarios 1 and 3, no visible flicker is detected. In scenario 4, the light flicker is negligible. The observations are carried out experimentally on a commercial LED lamp. Then a mathematical analysis is provided to explain the observations in the four scenarios. The main outcomes are validated through a simulation study.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"975-987"},"PeriodicalIF":2.0,"publicationDate":"2025-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143915430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Method for EM Information Leakage Reconstruction Based on Wavelet Analysis and Interframe Interleaved Image Fusion Algorithm 基于小波分析和帧间交错图像融合算法的电磁信息泄漏重建方法
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-05 DOI: 10.1109/TEMC.2025.3557975
Yuliang Sun;Kai Li;Pingyi Tian;Qin Shi;SanQiang Yu;Shanyong Yang;Xinqiang Liu;Guang Yang
{"title":"A Method for EM Information Leakage Reconstruction Based on Wavelet Analysis and Interframe Interleaved Image Fusion Algorithm","authors":"Yuliang Sun;Kai Li;Pingyi Tian;Qin Shi;SanQiang Yu;Shanyong Yang;Xinqiang Liu;Guang Yang","doi":"10.1109/TEMC.2025.3557975","DOIUrl":"10.1109/TEMC.2025.3557975","url":null,"abstract":"Aiming at the fuzzy problem of the image restored by the electromagnetic leakage signal of the display, this article proposes a restoration method of electromagnetic leakage information based on the fusion of wavelet analysis and interframe interleaved image fusion algorithm. Based on the principle of multi-frame average denoizing method, it makes use of the characteristics that the display depends on the periodic repetition of different video frames when displaying image information. Successive frames are superimposed to achieve image enhancement, which effectively reduces the influence of environmental noise. At the same time, the fusion of one-dimensional wavelet transform technology further improves the quality of image reconstruction. The experimental results show that, compared with the direct image reconstruction, the image signal-to-noise ratio, contrast ratio and acuteness of the fusion algorithm using wavelet analysis and frequency domain hierarchical image reconstruction are improved by 79.7%, 15.9%, and 47.8%, respectively. The algorithm has significant application value in the field of electromagnetic leakage signal recovery and signal processing.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"751-760"},"PeriodicalIF":2.0,"publicationDate":"2025-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143909726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Method for In Situ Characterization of Human-Induced ESD 一种人致静电放电的原位表征方法
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-03-05 DOI: 10.1109/TEMC.2025.3544120
Gabriel Fellner;Simon Buttinger;David Pommerenke;Satyajeet Shinde;Michael Hillstrom
{"title":"A Method for In Situ Characterization of Human-Induced ESD","authors":"Gabriel Fellner;Simon Buttinger;David Pommerenke;Satyajeet Shinde;Michael Hillstrom","doi":"10.1109/TEMC.2025.3544120","DOIUrl":"10.1109/TEMC.2025.3544120","url":null,"abstract":"The probability of electronic products being affected by electrostatic discharge (ESD) depends on the probability of the device being subjected to ESD and the voltage level. By determining this statistical probability, product risk assessment, and the selection of appropriate ESD test levels can be performed to ensure the targeted field reliability is reached. Obtaining the necessary statistical information about ESD requires methods that can detect and quantify its parameters. Traditional ESD detection methods are predominantly stationary, requiring reference potential, and lack adaptability for portable devices and wearables. This article demonstrates a novel, portable in situ detection method based on on-body electric and magnetic field measurements. The proposed method integrates a wearable ESD sensor, capable of detecting discharge events, estimating voltage and current levels, and differentiating between human skin and human metal discharges. This sensor's design allows the characterization of the complex ESD environments of a person, offering a significant improvement over existing methods. Additionally, integration with a mobile application enables detailed analysis of the discharge scenario through user questionnaires for the first time.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"729-738"},"PeriodicalIF":2.0,"publicationDate":"2025-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143569636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Accurate Measurement of Intradecoupling Characteristics for Noise Suppression Sheets on Conducting Plates in Low-Frequency Range 精确测量低频范围内导电板上噪声抑制片的内耦合特性
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-26 DOI: 10.1109/TEMC.2025.3538563
Hyun Ho Park
{"title":"Accurate Measurement of Intradecoupling Characteristics for Noise Suppression Sheets on Conducting Plates in Low-Frequency Range","authors":"Hyun Ho Park","doi":"10.1109/TEMC.2025.3538563","DOIUrl":"10.1109/TEMC.2025.3538563","url":null,"abstract":"In this article, a test method is proposed for accurately evaluating the intradecoupling characteristics of noise suppression sheets (NSSs) on a conducting plate using two loop probes placed perpendicularly to the NSS on the same side. The effectiveness of the proposed method is discussed in comparison with the standard test method from IEC 62333-2, particularly by examining the underlying mechanisms based on the image method. To establish a test setup for measuring intradecoupling at frequencies below 100 MHz, the effects of various factors including the distance between the two loop probes, the distance from the probes to the NSS, and the size of the NSS were investigated using three-dimensional full-wave numerical simulations and design of experiments. For validation, intradecoupling ratios of commercial NSSs were measured using both the IEC 62333-2 method and the proposed method with two rectangular loop probes. In addition, regression analysis based on the measurement results was used to derive linear equations for predicting the intradecoupling ratio based on the real relative permeability and thickness, within the frequency range where real permeability is constant. The intradecoupling ratios at 1 MHz predicted by these regression equations showed an average deviation of 0.36<inline-formula><tex-math>$%$</tex-math></inline-formula> from the measured values of real NSSs on conducting plates.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"384-391"},"PeriodicalIF":2.0,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143506803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimal Cancellation Loop Termination to Reduce the Magnetic Field in WPT Systems 减少WPT系统磁场的最优对消回路终止
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-25 DOI: 10.1109/TEMC.2025.3531470
Silvano Cruciani;Tommaso Campi;Francesca Maradei;Mauro Feliziani
{"title":"Optimal Cancellation Loop Termination to Reduce the Magnetic Field in WPT Systems","authors":"Silvano Cruciani;Tommaso Campi;Francesca Maradei;Mauro Feliziani","doi":"10.1109/TEMC.2025.3531470","DOIUrl":"10.1109/TEMC.2025.3531470","url":null,"abstract":"This article introduces an advanced original model to mitigate magnetic fields in near-field wireless power transfer (WPT) systems using a cancellation loop based on magnetic resonance coupling. Mitigating magnetic fields in WPT systems is challenging because these systems intentionally generate magnetic fields, and the current induced in the cancellation loop can create an opposing magnetic field that may degrade WPT performance. The proposed model, which uses a reduced equivalent circuit based on an original theory, can simultaneously manage WPT system performance and shielding effectiveness. The numerical and experimental results show that cancellation loops are highly efficient for WPT systems with high immunity to external fields, while they can cause significant performance degradation in more susceptible WPT systems. Finally, the article offers advanced guidelines for optimizing the cancellation loop by precisely tuning its terminal capacitance, ensuring maximum field mitigation with minimal impact on WPT performance.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"965-974"},"PeriodicalIF":2.0,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143495565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Institutional Listings 机构清单
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-02-20 DOI: 10.1109/TEMC.2025.3525905
{"title":"Institutional Listings","authors":"","doi":"10.1109/TEMC.2025.3525905","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3525905","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"C4-C4"},"PeriodicalIF":2.0,"publicationDate":"2025-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10896934","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143455282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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