IEEE Transactions on Electromagnetic Compatibility最新文献_第9页

Estimation of Apparent Ionospheric Reflection Height from LEMP Waveforms for the Case of Tilted Lightning Channel 倾斜闪电通道情况下LEMP波形对电离层反射高度的估计

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-03 DOI: 10.1109/TEMC.2024.3502457

Yuto Ichikawa;Yoshihiro Baba;Toshihiro Tsuboi;Vladimir A. Rakov

{"title":"Estimation of Apparent Ionospheric Reflection Height from LEMP Waveforms for the Case of Tilted Lightning Channel","authors":"Yuto Ichikawa;Yoshihiro Baba;Toshihiro Tsuboi;Vladimir A. Rakov","doi":"10.1109/TEMC.2024.3502457","DOIUrl":"10.1109/TEMC.2024.3502457","url":null,"abstract":"The interaction of lightning electromagnetic pulse with the ionosphere has been often analyzed using the finite-difference time-domain method in the 2-D cylindrical coordinate system or in the 2-D spherical coordinate system. In this article, time-update equations for electric and magnetic fields in the 3-D spherical coordinate system are presented, and vertical electric fields at far distances over the curved surface of the Earth from the base of a vertical or tilted lightning return-stroke channel are computed. The lightning channel is represented by the modified transmission-line model with linear current decay with the distance along the channel. A realistic channel-base current waveform with a risetime of 3 <italic>μs represented by the Heidler function is used. The ionosphere is simulated by a nonuniform medium whose conductivity increases exponentially with altitude. Apparent ionospheric reflection heights are estimated based on the arrival time difference between the ground wave and the first skywave. When the arrival times of ground wave and skywave are defined as the arrival times of their field peaks, the estimated ionospheric reflection height depends on channel tilt angle and increases with increasing field observation distance. In contrast, when the arrival times of ground wave and skywave are defined as the arrival times of 80% of their field derivative peaks, the estimated ionospheric reflection height is not much influenced by either distance or channel tilt angle.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"521-529"},"PeriodicalIF":2.0,"publicationDate":"2024-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142776651","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Multilayer Energy Selective Surface With Wide Operational Band and High Shielding Effectiveness Based on Second-Order Filter 基于二阶滤波器的宽工作频带、高屏蔽效能的多层能量选择表面

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-03 DOI: 10.1109/TEMC.2024.3494021

Tao Zhou;Peiguo Liu;Chenxi Liu;Huan Jiang;Tao Tian

{"title":"Multilayer Energy Selective Surface With Wide Operational Band and High Shielding Effectiveness Based on Second-Order Filter","authors":"Tao Zhou;Peiguo Liu;Chenxi Liu;Huan Jiang;Tao Tian","doi":"10.1109/TEMC.2024.3494021","DOIUrl":"10.1109/TEMC.2024.3494021","url":null,"abstract":"In this article, a novel multilayer energy selective surface (ESS) with an ultrawide operational band and high-power isolation composed of nonresonant unit cells is presented. A simple second-order filter circuit is designed and optimized first. Then, an ESS with metallic patches and octagonal rings is designed to match the second-order filter circuit under the guidance from circuits to metasurfaces. The ESS performs a nonlinear response for the low-power and high-power incident microwaves. The operating properties of the ESS are generated by the interlayer resonance of nonresonant capacitive patches and inductive octagonal rings. Circuit and full-wave simulations are conducted, respectively, and their results show relatively good consistency. Meanwhile, two ESS prototypes are fabricated, and experiments are conducted under different incident power levels in WR-137 and WR-90 waveguides. According to the simulated and experimental results, the proposed ESS has a wide 1 dB operational band covering 5.8–9.0 GHz for low-power incident wave, and high shielding effectiveness of 22 dB under high-power microwave. Particularly, the maximum SE reaches up to 25.7 dB at 9 GHz. This article provides a feasible and promising method for providing strong electromagnetic protection for broadband electronic devices.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"337-340"},"PeriodicalIF":2.0,"publicationDate":"2024-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142776649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Reflectionless Low-Pass Filters Based on Reflection Symmetric Structure for IEMI Suppression 基于反射对称结构的抑制IEMI的无反射低通滤波器

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-03 DOI: 10.1109/TEMC.2024.3502445

Yevgeniy S. Zhechev;Evgeniya B. Chernikova;Alexander M. Zabolotsky

{"title":"Reflectionless Low-Pass Filters Based on Reflection Symmetric Structure for IEMI Suppression","authors":"Yevgeniy S. Zhechev;Evgeniya B. Chernikova;Alexander M. Zabolotsky","doi":"10.1109/TEMC.2024.3502445","DOIUrl":"10.1109/TEMC.2024.3502445","url":null,"abstract":"This article presents reflectionless low-pass filters based on a reflection symmetric structure for suppressing intentional electromagnetic interference (IEMI). The protective structures can attenuate ultra-wideband (UWB) and narrowband (NB) IEMIs, and their potential application is investigated. The frequency and time characteristics of the structures are examined in terms of suppressing IEMI and maintaining signal integrity. Full-wave electrodynamic simulation was performed using the finite element method in the frequency range of 0–10 GHz. To verify the simulation results, prototypes were fabricated, and their <italic>S-parameters were measured using a vector network analyzer. The results indicate that the structures have a passband of 1.37 GHz for the modal filter (MF) and 0.8 GHz for the meander line (ML). The value of <italic>S21 for both structures does not exceed −15 dB in the frequency range from 3.5 to 10 GHz. In the full frequency range, <italic>S11 does not exceed −15 dB. The comparative analysis of IEMI suppression using these filters demonstrated that the structures offer advantages in terms of attenuating conducted UWB and NB IEMIs according to the analysis of five standard <italic>N-norms. The results indicate that all proposed structures can suppress IEMI with different spectra, but the ML structure showed the best suppression performance. However, this resulted in a reduced bandwidth of the ML. The simulation with data rates normalized to the bandwidth of each filter demonstrated that the MF provides higher signal transmission quality.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"487-497"},"PeriodicalIF":2.0,"publicationDate":"2024-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142777019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Measurement Method for Mixed-Mode S-Parameters of Termination Structure in Differential Communication Line 差分通信线路终端结构混模s参数测量方法

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-27 DOI: 10.1109/TEMC.2024.3495038

Masahiro Yoshida;Yusuke Yano;Jianqing Wang

{"title":"Measurement Method for Mixed-Mode S-Parameters of Termination Structure in Differential Communication Line","authors":"Masahiro Yoshida;Yusuke Yano;Jianqing Wang","doi":"10.1109/TEMC.2024.3495038","DOIUrl":"10.1109/TEMC.2024.3495038","url":null,"abstract":"Bulk current injection (BCI) tests are considered an important method of evaluating the immunity of a differential communication system. Malfunctions during BCI tests are partly caused by common-mode reflection and mode conversion of electronic control units (ECUs). Their characteristics are determined by termination structures (such as connector, enclosure, and ground wiring) and components on a printed circuit board (PCB) housed in ECUs. Conventional measurement methods using current probes cannot separate the characteristics of the termination structures for ECUs on one side because the measurement results include the effects of cable length resonances and reflections at the ECUs. Furthermore, the methods cannot measure mode conversions between the differential and common modes because currently, the current probe measures only the common mode. Thus, we cannot obtain an accurate model of the ECU on one side in the differential communication system. This study proposes a method to measure mixed-mode S-parameters of the termination structures for the ECU on one side using a current probe. We designed the load simulator on the other side to suppress the reflection and mode conversion using matched termination and balanced circuit. Consequently, we measured only the equipment under test (EUT) characteristics without cable length resonances. In addition, we placed two ports on the PCB instead of an IC to measure transmission through the EUT. Subsequently, we measured the characteristics including mode conversions. Furthermore, the effectiveness of this method was verified by SPICE simulation and experiment. In the experiment, experimental and theoretical results were compared considering measurement errors.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"362-373"},"PeriodicalIF":2.0,"publicationDate":"2024-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142753027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Design and Failure Mechanism Analysis of a High-Power Limiter at DC-6 GHz With GaAs PIN Technology 基于GaAs PIN技术的dc - 6ghz大功率限幅器设计及失效机理分析

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-27 DOI: 10.1109/TEMC.2024.3493458

Yue Zhang;Liang Zhou;Fayang Pan;Jun-Fa Mao

{"title":"Design and Failure Mechanism Analysis of a High-Power Limiter at DC-6 GHz With GaAs PIN Technology","authors":"Yue Zhang;Liang Zhou;Fayang Pan;Jun-Fa Mao","doi":"10.1109/TEMC.2024.3493458","DOIUrl":"10.1109/TEMC.2024.3493458","url":null,"abstract":"This article examines the electrical-thermal-stress effects of a high-power handling limiter operating at DC-6 GHz, utilizing gallium arsenide positive-intrinsic-negative (PIN) technology for protection against intentional electromagnetic interference. The limiter's performance is evaluated under high-power microwave induced pulse injection at 2 GHz, with varying pulse widths and a pulse repetition frequency (PRF) of 50 Hz. Destruction of the limiter is observed when the pulse width and input power reach 3 <italic>μs and 63 dBm, respectively. The failure mechanisms are analyzed in three aspects. First, the thermal distribution of the limiter's microstrip lines is understood through equivalent circuit analysis of the PIN diodes. The characteristics of the limiter across different frequencies are also investigated, with a focus on the power levels of PIN diodes near the limiter's input. Additionally, owing to the observed differences in heat-induced discoloration on the two PIN diodes near the input port, their thermal and stress effects are compared by incorporating temperature boundary conditions and absorbed power in the analysis. Thermal accumulation in the PIN diodes is further explored under a higher PRF of 100 kHz. Finally, the thermal and stress effects on the bonding wire interconnects near the limiter's input are considered. Postmeasurement observations reveal damage to both the bonding wire and the PIN diodes, indicating that the bonding wire fails after the PIN diodes.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"227-236"},"PeriodicalIF":2.0,"publicationDate":"2024-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142753105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Morphological Search for Near-Field Equivalent Infinitesimal Dipole Models 近场等效无穷小偶极子模型的形态学搜索

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-25 DOI: 10.1109/TEMC.2024.3492701

Tomas Monopoli;Xinglong Wu;Cheng Yang;Christian Schuster;Sergio Amedeo Pignari;Johannes Wolf;Flavia Grassi

引用次数: 0

Design and Development of a Bounded-Wave High-Altitude Electromagnetic Pulse Simulator Incorporating Self-Steepening Marx Generator and Antenna Integrated Pulse-Shaping Switch 设计和开发包含自增马克思发生器和天线集成脉冲整形开关的边界波高空电磁脉冲模拟器

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-22 DOI: 10.1109/TEMC.2024.3491424

Le Cheng;Jing Xiao;Gang Wu;Wei Wu;Kaisheng Mei;Gefei Wang;Wei Jia;Zhiqiang Chen;Fan Guo;Zicheng Zhang

{"title":"Design and Development of a Bounded-Wave High-Altitude Electromagnetic Pulse Simulator Incorporating Self-Steepening Marx Generator and Antenna Integrated Pulse-Shaping Switch","authors":"Le Cheng;Jing Xiao;Gang Wu;Wei Wu;Kaisheng Mei;Gefei Wang;Wei Jia;Zhiqiang Chen;Fan Guo;Zicheng Zhang","doi":"10.1109/TEMC.2024.3491424","DOIUrl":"10.1109/TEMC.2024.3491424","url":null,"abstract":"The threat of high-altitude electromagnetic pulse (HEMP) to electronic information equipment has received widespread attention. Specific to the performance evaluation testing requirements of subsystem-level equipment against the HEMP threat, a miniaturized vertical polarized bounded-wave simulator is designed and developed in this article. Based on the direct drive method wherein a fast compact Marx generator (CMG) discharges to a guided-wave antenna with a codesigned pulse-shaping switch, the developed simulator is capable of generating a standard HEMP radiation environment in a limited test volume and guaranteeing the consistency of peak field intensity with a fixed operation voltage. Integration of a self-steepening structure into the conventional CMG effectively improves the output pulse front edge by modulating the stray capacitance value. Consequently, the primary pulse output with an amplitude exceeding 220 kV and a rising time of less than 4.7 ns can be realized, significantly expanding the dynamic working range of the pulse-shaping switch. Additionally, the integrated design of the pulse-shaping switch and the radiation antenna ensures structure continuity, facilitating the distortionless transmission of the feeding voltage pulse. This modification enables the realization of the rising time of the radiation electric field extending from the standard 2.5 ± 0.5 ns to the subnanosecond range. The simulator can generate an electromagnetic environment with a maximum electric field intensity surpassing 100 kV/m and a field uniformity of 2.8 dB. This article provides a fresh perspective on the design of a compact and reliable bounded-wave HEMP simulator.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"174-190"},"PeriodicalIF":2.0,"publicationDate":"2024-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142690665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

On the Correct Approach to the Modeling and Analysis of Quantitative EMC Proficiency Testing Data for the Purpose of Evaluating Test Laboratory Claims of Competency 关于为评估测试实验室能力声明而对电磁兼容性能力测试定量数据进行建模和分析的正确方法

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-20 DOI: 10.1109/TEMC.2024.3467039

Harry H. Hodes;Din D. Ng

{"title":"On the Correct Approach to the Modeling and Analysis of Quantitative EMC Proficiency Testing Data for the Purpose of Evaluating Test Laboratory Claims of Competency","authors":"Harry H. Hodes;Din D. Ng","doi":"10.1109/TEMC.2024.3467039","DOIUrl":"10.1109/TEMC.2024.3467039","url":null,"abstract":"Traditional statistical procedures used for analyzing quantitative electromagnetic compatibility (EMC) proficiency test (PT) data are overly simplistic, given that they are implicitly based upon the following erroneous assumptions: first, PT data in a given round constitute a random sample drawn from an underlying population that is distributed normally, and therefore, the normality criteria can used to set the pass/fail threshold for PT participants based upon an arbitrary, predefined choice of \u0000<italic>Z\u0000-value; and second the maximum permissible error values are unimportant and can be ignored. Those two fundamental errors produce misclassified PT pass/fail results, which can have serious economic consequences for both EMC test laboratories and their customers. This article first reviews the published literature on quantitative EMC PT from the standpoint of assessing the statistical methodologies used and how the pass/fail criteria were applied. Next, this article discusses the effects of these statistical procedure errors. Finally, it details a practical, more accurate alternative Bayesian method that incorporates the maximum permissible error as the \u0000<italic>a priori\u0000 information in its analysis model. This method treats the quantitative EMC PT data as a population with no specific presumed distribution.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"1780-1792"},"PeriodicalIF":2.0,"publicationDate":"2024-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142678477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Transient Modeling of High-Speed Links Using Transfer Learning-Based Neural Network Initialization 利用基于迁移学习的神经网络初始化对高速链路进行瞬态建模

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-19 DOI: 10.1109/TEMC.2024.3488058

Jiarui Qiu;Hanzhi Ma;Fengzhao Zhang;Zengyi Sun;Er-Ping Li

{"title":"Transient Modeling of High-Speed Links Using Transfer Learning-Based Neural Network Initialization","authors":"Jiarui Qiu;Hanzhi Ma;Fengzhao Zhang;Zengyi Sun;Er-Ping Li","doi":"10.1109/TEMC.2024.3488058","DOIUrl":"10.1109/TEMC.2024.3488058","url":null,"abstract":"Accurate and efficient signal integrity modeling methods are crucial in the iterative design process of high-speed links. While data-driven deep learning exhibits robust capabilities for temporal transient modeling, it often ignores the correlations among high-speed links sharing similar structures, necessitating separate retraining for each distinct case. In this study, we propose a new transient modeling approach for high-speed links employing a transfer learning-enhanced deep simple recurrent unit (TL-DSRU) method. The deep simple recurrent unit architecture overcomes the challenges in handling sequential data and parallel processing found in traditional recurrent neural networks, enabling efficient modeling. Our technique leverages the initialization principles of transfer learning, utilizing a pretrained model of a basic high-speed link to enhance the comprehension of more intricate cases. The proposed TL-DSRU model combines parallelization and transfer learning initialization methods to balance training speed and accuracy, thereby enhancing the practicality and generalization potential of neural network-based transient simulation for high-speed links. Comparative experiments demonstrate that the transfer learning-based initialization method substantially outperforms typical neural network random initialization techniques, delivering markedly improved time-domain waveform prediction accuracy across various channels and equalization in high-speed links, as well as yielding more precise predictions of eye diagram parameters.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"2065-2073"},"PeriodicalIF":2.0,"publicationDate":"2024-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142673446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

UWB Far-End Crosstalk Mitigation With “LL” Shaped Defected Tabbed Routing Structures 利用 "LL "形缺陷标签路由结构缓解 UWB 远端串扰

IF 2 3区计算机科学

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-19 DOI: 10.1109/TEMC.2024.3493142

Yingcong Zhang;Guoan Wang

{"title":"UWB Far-End Crosstalk Mitigation With “LL” Shaped Defected Tabbed Routing Structures","authors":"Yingcong Zhang;Guoan Wang","doi":"10.1109/TEMC.2024.3493142","DOIUrl":"10.1109/TEMC.2024.3493142","url":null,"abstract":"This article investigates a novel approach to mitigate far-end crosstalk (FEXT) in high density interconnects featuring distinctive “LL” shaped defected tabbed routing structures. The integration of “LL” shaped defected patterns and trapezoidal tabs are specifically engineered to concurrently increase capacitive coupling and decrease inductive coupling, mitigating FEXT to a greater extent. The proposed methodology is comprehensively analyzed utilizing the generated equivalent circuit model. Moreover, the capacitance and inductance matrices of coupled line, tabbed routing, and the proposed structures are extracted from full wave simulations and analyzed with numerical equations to ensure an accurate evaluation of FEXT. To validate the efficacy of the proposed designs, the structure prototypes are implemented with FR-4 printed circuit board. The <italic>S-parameters performance and eye diagrams are measured and compared. The measurement results demonstrate that the proposed structure effectively enhances FEXT behavior while ensuring robust high-speed signal propagation along the transmission paths. Specifically, FEXT is reduced by 15 dB within the frequency range of 1–18 GHz, and the maximum reduction of 55 dB at 10.6 GHz. The proposed structure exhibits superior FEXT behavior improvement within a wide frequency range, indicating significant potential for practical wideband high-speed applications.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"247-253"},"PeriodicalIF":2.0,"publicationDate":"2024-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142673447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0