IEEE Transactions on Electromagnetic Compatibility最新文献

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An Ultrawideband Multituned Absorber With Frequency-Agile Characteristic for EMI Shielding 用于 EMI 屏蔽的具有频率敏捷特性的超宽带多谐吸收器
IF 2.5 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-22 DOI: 10.1109/TEMC.2025.3553764
Jiamei Qin;Mingyu Sun;Aixin Chen
{"title":"An Ultrawideband Multituned Absorber With Frequency-Agile Characteristic for EMI Shielding","authors":"Jiamei Qin;Mingyu Sun;Aixin Chen","doi":"10.1109/TEMC.2025.3553764","DOIUrl":"10.1109/TEMC.2025.3553764","url":null,"abstract":"A novel synthesis procedure for tunable absorbers is proposed, enabling frequency-agile absorption performance within ultrawide frequency band. Multiple tunable capacitive screens are incorporated to flexibly reconfigure absorption band. This article analyzes the variation in absorption rates concerning the capacitive screen's surface admittance across bands. A metallic patch with different sizes is employed as the first-level capacitive screen to validate the reconfiguration of absorption rates across different bands. To extend the frequency-agile band to lower frequencies, a second-level tunable capacitive screen is proposed. Based on the calculated surface admittance region, appropriate varactor devices are selected and their tuning range are determined. The design incorporates dual-channel independent and continuous control, enabling the structure to flexibly adjust the absorption magnitude across the ultrawide frequency band. The prototype demonstrates seamlessly adjustable absorption capabilities across from 1.42 to 19.0 GHz, achieving a fractional bandwidth of 172.2<inline-formula><tex-math>$%$</tex-math></inline-formula> with a reflection coefficient below <inline-formula><tex-math>$-$</tex-math></inline-formula>10 dB. It also features dual polarization and a low-profile height of 0.052<inline-formula><tex-math>$lambda _{L}$</tex-math></inline-formula>. It offers tunable absorption capability to selectively adjust the absorption characteristics in L-/S-/C-/X-/Ku-bands, making it advantageous for dynamic electromagnetic interference shielding applications.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 4","pages":"1103-1115"},"PeriodicalIF":2.5,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143862124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Radio Wave Exposure of the Human Head at Multiple Frequencies of Up to 6 GHz 6 GHz以下多频率人体头部无线电波暴露的评估
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-21 DOI: 10.1109/TEMC.2025.3554689
Keisuke Kimura;Kazuyuki Saito;Masaharu Takahashi;Tomoaki Nagaoka
{"title":"Evaluation of Radio Wave Exposure of the Human Head at Multiple Frequencies of Up to 6 GHz","authors":"Keisuke Kimura;Kazuyuki Saito;Masaharu Takahashi;Tomoaki Nagaoka","doi":"10.1109/TEMC.2025.3554689","DOIUrl":"10.1109/TEMC.2025.3554689","url":null,"abstract":"Mobile communication devices have become widely used in various situations in our daily lives. Not only are our opportunities for exposure to radio waves increasing, but the exposure environment is also changing owing to developments in telecommunications technology. Conventional studies on radio wave exposure evaluation have focused on only a single frequency, and only a few studies have considered radio wave exposure at multiple frequencies, including the frequencies used in fifth-generation (5G) mobile communications. In this study, specific absorption rate (SAR) evaluations were conducted assuming the exposure of the human body to radio waves with multiple frequency components. To simulate the actual use of a smartphone, analytical models were created using a smartphone model as the electromagnetic wave source and a numerical human body model as the exposure target. In the case of multiple frequencies, SAR was calculated for each frequency component, and SARs were summed. In addition, by changing the power ratio of each frequency component to the total radiated power, the distribution of SAR and the shift in the peak spatial SAR<inline-formula><tex-math>$ _{text{10g}}$</tex-math></inline-formula> (psSAR<inline-formula><tex-math>$ _{text{10g}}$</tex-math></inline-formula>) were investigated. As a result, it was confirmed that the SAR distribution changes with the power ratio of each frequency component in the radio wave. In the case of radio waves with multiple frequency components, no specific power ratios were found to cause a significant increase in psSAR<inline-formula><tex-math>$ _{text{10g}}$</tex-math></inline-formula>.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"778-785"},"PeriodicalIF":2.0,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143857743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Effective Approximate Mathematical Expression for Non-Linear Resistance Characteristics of Metal Oxide Elements 金属氧化物元素非线性电阻特性的有效近似数学表达式
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-17 DOI: 10.1109/TEMC.2025.3557030
Peerawut Yutthagowith;Yoshihiro Baba
{"title":"An Effective Approximate Mathematical Expression for Non-Linear Resistance Characteristics of Metal Oxide Elements","authors":"Peerawut Yutthagowith;Yoshihiro Baba","doi":"10.1109/TEMC.2025.3557030","DOIUrl":"10.1109/TEMC.2025.3557030","url":null,"abstract":"A metal oxide varistor (MOV), manufactured from a blend of zinc oxide and other metal oxides, undergoes changes in resistance or resistivity depending on changes in applied voltage or electric field strength. Typically, the nonlinear resistive characteristics of MOV elements are determined through experimental measurements of voltage and current. This article introduces a mathematical expression comprising two power functions and a constant term with five adjustable coefficients. It is utilized to describe the voltage-current or electric field-current density characteristics across a wide range of current or current density, spanning from microamperes to several tens of kiloamperes or from several hundred A/m<sup>2</sup> to a few hundred of kA/m<sup>2</sup>, respectively. This expression accurately reproduces the observed nonlinear resistive behaviors of several low-voltage MOV elements. A noniterative fitting method is developed to determine the expression's five coefficients, using integration to linearize nonlinear characteristics without requiring iterations or uniform data sampling. Through comparison with a previously proposed expression and experimental data, the proposed technique demonstrates remarkably high accuracy. Furthermore, the proposed technique is applied to accurately estimate the parasitic inductance of an MOV and its lead wires during a residual voltage test conducted with an 8/20-microsecond impulse current.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"988-995"},"PeriodicalIF":2.0,"publicationDate":"2025-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143847269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Simple Mathematical Expression for Nonlinear Resistive Characteristics of Metal Oxide Elements in Lightning Surge Analysis 雷电浪涌分析中金属氧化物非线性电阻特性的简单数学表达式
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-17 DOI: 10.1109/TEMC.2025.3557863
Peerawut Yutthagowith;Yoshihiro Baba
{"title":"A Simple Mathematical Expression for Nonlinear Resistive Characteristics of Metal Oxide Elements in Lightning Surge Analysis","authors":"Peerawut Yutthagowith;Yoshihiro Baba","doi":"10.1109/TEMC.2025.3557863","DOIUrl":"10.1109/TEMC.2025.3557863","url":null,"abstract":"Accurate simulations of transient phenomena in electric power systems with metal oxide varistors (MOVs) or lightning arresters (LAs) using the finite-difference time-domain (FDTD) method for solving Maxwell's equations require simple and accurate representations of MOVs or LAs. By representing a small cell within a MOV or LA with resistivity (<italic>ρ</i>) dependent on electric field (<italic>E</i>), these components can be modeled in three dimensions and seamlessly integrated into FDTD simulations. Achieving computational efficiency in FDTD simulation necessitates avoiding iterative computations for <italic>ρ</i> from <italic>E</i>. Hence, there is a significant need for a simple and accurate mathematical expression of <italic>ρ</i> in terms of <italic>E</i>. This study presents a methodology for deriving a three-coefficient exponential function from experimental data. By using integration properties, this method transforms nonlinear characteristics into linear ones without iterative processes or uniform data sampling. It also incorporates data weighting and outlier discrimination for enhanced accuracy. Comparative analysis with previous methods based on the ordinary least squares method and experimental data, using an applied current with a rise time of approximately 8 μs, confirms high accuracy and effectiveness in computing residual voltages resulting from impulse current injection using the FDTD method.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"996-1003"},"PeriodicalIF":2.0,"publicationDate":"2025-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143847158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Electromagnetic Compatibility Society Publication Information IEEE电磁兼容协会出版信息
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-16 DOI: 10.1109/TEMC.2025.3556341
{"title":"IEEE Electromagnetic Compatibility Society Publication Information","authors":"","doi":"10.1109/TEMC.2025.3556341","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556341","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"C2-C2"},"PeriodicalIF":2.0,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10966499","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143839872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Electromagnetic Compatibility Information for Authors IEEE《作者电磁兼容性信息汇刊》
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-16 DOI: 10.1109/TEMC.2025.3556339
{"title":"IEEE Transactions on Electromagnetic Compatibility Information for Authors","authors":"","doi":"10.1109/TEMC.2025.3556339","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556339","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"C3-C3"},"PeriodicalIF":2.0,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10967049","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143839873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Institutional Listings 机构列表
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-16 DOI: 10.1109/TEMC.2025.3556337
{"title":"Institutional Listings","authors":"","doi":"10.1109/TEMC.2025.3556337","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556337","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"C4-C4"},"PeriodicalIF":2.0,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10966497","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143840006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Automated System for Evaluating AIMD Safety in MRI RF Fields 一种新的MRI射频场中AIMD安全性评估自动化系统
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-15 DOI: 10.1109/TEMC.2025.3556975
Ziyu Zuo;Ao Shen;Farshad Ebrahimi;Qingyan Wang;Jianfeng Zheng;Hongbae Jeong;Ananda Kumar;Ji Chen
{"title":"A Novel Automated System for Evaluating AIMD Safety in MRI RF Fields","authors":"Ziyu Zuo;Ao Shen;Farshad Ebrahimi;Qingyan Wang;Jianfeng Zheng;Hongbae Jeong;Ananda Kumar;Ji Chen","doi":"10.1109/TEMC.2025.3556975","DOIUrl":"10.1109/TEMC.2025.3556975","url":null,"abstract":"Magnetic resonance imaging (MRI) is a widely used diagnostic tool with millions of scans performed annually. However, the presence of active implantable medical devices (AIMDs), such as neurostimulators, can pose significant safety risks due to interactions of AIMDs and the MRI's electromagnetic fields. Specifically, radiofrequency (RF)-induced heating can lead to device malfunction or tissue damage. To address these risks, this study introduces a novel automated scaling and validation test system to evaluate the safety of AIMDs during MRI scans. The system streamlines the process of positioning AIMDs along various trajectories and measuring RF-induced heating, significantly reducing manual intervention and potential errors. Results demonstrate enhanced efficiency and reliability in AIMD model validation, with a high correlation between predicted and measured results. By automating the validation process, this system has the potential to improve patient safety, reduce costs, and expand the use of MRI for patients with AIMDs.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"770-777"},"PeriodicalIF":2.0,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143836733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Modified Microwave Breakdown Threshold Prediction Method Based on Discontinuous Galerkin Approach 一种改进的基于间断伽辽金法的微波击穿阈值预测方法
IF 2.5 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-15 DOI: 10.1109/TEMC.2025.3554044
Tiancheng Zhang;Haoran Qin;Zixi Zhang;Huaguang Bao;Yanyan Zhang;Chao-Fu Wang;Dazhi Ding
{"title":"A Modified Microwave Breakdown Threshold Prediction Method Based on Discontinuous Galerkin Approach","authors":"Tiancheng Zhang;Haoran Qin;Zixi Zhang;Huaguang Bao;Yanyan Zhang;Chao-Fu Wang;Dazhi Ding","doi":"10.1109/TEMC.2025.3554044","DOIUrl":"10.1109/TEMC.2025.3554044","url":null,"abstract":"Microwave devices are susceptible to high-power microwave breakdown effect, which seriously impacts the reliability of their integrated microwave systems, including electromagnetic communication stations and other electronic systems. To evaluate the high-power microwave breakdown characteristics of microwave devices, this article proposes a modified method for predicting the high-power microwave breakdown threshold. The proposed method considers the influence of more operating factors such as temperature, gas, and pulse shape by adjusting physical quantities like diffusion coefficient, adhesion rate, and pressure. Additionally, the newly modified equation can be efficiently solved using the discontinuous Galerkin approach, which has been already proved significant advantages in handling complex multiscale structures. Numerical examples demonstrate the remarkable accuracy and efficiency of the proposed method by comparing the calculated threshold with results from commercial software. We believe that this method provides an effective tool for predicting the breakdown threshold of microwave devices under various conditions, theoretically guiding the design of protection mechanisms for high-performance microwave components.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 4","pages":"1228-1236"},"PeriodicalIF":2.5,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143836750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluating Time Occupancy and Time-Scales in Interference Testing With Pulse-Modulated Noise 脉冲调制噪声干扰测试中时间占用和时间尺度的评估
IF 2.5 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-14 DOI: 10.1109/TEMC.2025.3552044
Michelle Pirrone;Aric Sanders;Adam Wunderlich
{"title":"Evaluating Time Occupancy and Time-Scales in Interference Testing With Pulse-Modulated Noise","authors":"Michelle Pirrone;Aric Sanders;Adam Wunderlich","doi":"10.1109/TEMC.2025.3552044","DOIUrl":"10.1109/TEMC.2025.3552044","url":null,"abstract":"We present experimental results investigating the utility of pulse-modulated noise (PMN) for general-purpose, systematic interference testing. Time-domain interference vulnerabilities are examined by modifying the PMN duty cycle, which controls time occupancy, and the PMN period, which modifies the time-scale. The PMN waveform class that we utilize depends on only two parameters, making it far simpler than real-world communication signals and easier to generate. We perform experimentation with a conducted interference testbed that uses a consumer off-the-shelf IEEE 802.11n wireless local area network Wi-Fi link as the victim system. Comparisons are also made between PMN and measured long-term evolution (LTE) and Wi-Fi signals of corresponding time occupancies to assess if realistic interference impacts are generated by PMN. We find that time occupancy is a strong predictor of interference impacts, but that time-scale and time correlations can also be relevant factors in some circumstances. Overall, our findings support PMN as a useful class of artificial test waveforms for interference testing that can be used to characterize a wide range of interference vulnerabilities on a bidirectional communication link.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 4","pages":"1116-1128"},"PeriodicalIF":2.5,"publicationDate":"2025-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143831693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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