Component Level EM Emission Assessment and Management for RF Desensitization

Abstract

Radio frequency (RF) desensitization is a common issue caused by high-speed components in modern electronic devices. Consequently, numerous studies have focused on characterizing and quantifying electromagnetic (EM) emission sources by using near field scanning to detect EM noise sources. However, before near field scanning, no predetermined threshold is available to quickly assess whether an EM noise source will pose RF desensitization risks in the receiving antenna. This article presents a method to optimize near field scanning settings through EM emission management analysis. Drawing on experience from numerous EM emission studies, we introduce an EM emission management procedure for two common noise sources: dipole-like noise sources and cavity noise sources. The scanning results of three practical examples are provided to validate the efficiency of the proposed EM emission management analysis.