{"title":"Model-Order Reduction of the Full-Wave Partial-Element Equivalent-Circuit (PEEC) Method Based on a Modal Approach","authors":"Philipp Herwigk, Marco Leone","doi":"10.1109/temc.2025.3577351","DOIUrl":"https://doi.org/10.1109/temc.2025.3577351","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"51 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144370691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Impact of Discharge-Point Geometry on Air-Discharge ESD Testing: Current-Waveform Shape and Intensity","authors":"Hans Kunz","doi":"10.1109/temc.2025.3576324","DOIUrl":"https://doi.org/10.1109/temc.2025.3576324","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"26 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144328537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yuxuan Wu, Kushan Choksi, Samuel Defaz, Abdul Basit Mirza, Fang Luo
{"title":"Modeling and Optimization of Near-Field Coupling Between Power Loop and Gate Drive in High-Density Bidirectional Converters","authors":"Yuxuan Wu, Kushan Choksi, Samuel Defaz, Abdul Basit Mirza, Fang Luo","doi":"10.1109/temc.2025.3571381","DOIUrl":"https://doi.org/10.1109/temc.2025.3571381","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"6 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144319770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yan Li, Wan Ji, Xiaotian Yang, Guoliang Yu, Yang Qiu, Da Li, Haomiao Zhou, En-xiao Liu, Er-ping Li
{"title":"Machine Learning to Predict EMI Radiation and Optimize the Structure of Pinmap Packages","authors":"Yan Li, Wan Ji, Xiaotian Yang, Guoliang Yu, Yang Qiu, Da Li, Haomiao Zhou, En-xiao Liu, Er-ping Li","doi":"10.1109/temc.2025.3574362","DOIUrl":"https://doi.org/10.1109/temc.2025.3574362","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"51 1","pages":"1-12"},"PeriodicalIF":2.1,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144288474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Open Access Publishing","authors":"","doi":"10.1109/TEMC.2025.3577554","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3577554","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"1032-1032"},"PeriodicalIF":2.0,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11036563","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144281316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Corrections to “Periodic Nonuniform Sampling for Enhanced Recognition of Spread Spectrum Clocking-Based Electromagnetic Signature”","authors":"Euibum Lee;Dong-Hoon Choi;Taesik Nam;Jong-Gwan Yook","doi":"10.1109/TEMC.2025.3556536","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556536","url":null,"abstract":"The above article [1] omitted a crucial step: A phase unwrapping process for $angle {{s}_{D.text{mea}}}[ n ]$ to prevent unnecessary spikes in its derivative, $d{ {angle {{s}_{D.text{mea}}}[ n ]} }/dn$, as given in (12a), (13a), and (14) and plots on Fig. 5. Additionally, the y-axis of the upper plot in Fig. 5 represents phase difference, not the phase.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"1031-1031"},"PeriodicalIF":2.0,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11036575","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144281154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}