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IEEE Transactions on Electromagnetic Compatibility最新文献

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A Multi-Parameter Statistical Inference Model for the Thermal Burnout Effect of LNA Excited by Repetitive Electromagnetic Disturbances 重复电磁干扰下LNA热燃效应的多参数统计推断模型
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-17 DOI: 10.1109/temc.2025.3525723
Zong-Yang Wang, Yan-Zhao Xie, Yu-Hao Chen, Pu-Qing Zhang
{"title":"A Multi-Parameter Statistical Inference Model for the Thermal Burnout Effect of LNA Excited by Repetitive Electromagnetic Disturbances","authors":"Zong-Yang Wang, Yan-Zhao Xie, Yu-Hao Chen, Pu-Qing Zhang","doi":"10.1109/temc.2025.3525723","DOIUrl":"https://doi.org/10.1109/temc.2025.3525723","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"30 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142989028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis and Optimization of Fast Ethernet Terminations for Reduction of Differential-to-Common-Mode Conversion 减少差共模转换的快速以太网终端分析与优化
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-10 DOI: 10.1109/temc.2024.3523962
Ludovica Illiano, Xiaokang Liu, Flavia Grassi, Sergio A. Pignari
{"title":"Analysis and Optimization of Fast Ethernet Terminations for Reduction of Differential-to-Common-Mode Conversion","authors":"Ludovica Illiano, Xiaokang Liu, Flavia Grassi, Sergio A. Pignari","doi":"10.1109/temc.2024.3523962","DOIUrl":"https://doi.org/10.1109/temc.2024.3523962","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"25 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142961224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2024 Index IEEE Transactions on Electromagnetic Compatibility Vol. 66 2024索引IEEE电磁兼容性交易卷66
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-01-09 DOI: 10.1109/TEMC.2025.3526545
{"title":"2024 Index IEEE Transactions on Electromagnetic Compatibility Vol. 66","authors":"","doi":"10.1109/TEMC.2025.3526545","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3526545","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"1-46"},"PeriodicalIF":2.0,"publicationDate":"2025-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10834608","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142937834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurements of Induced Voltages on Overhead Distribution Line Due to Altitude-Triggered Lightning 高空雷击对架空配电线路感应电压的测量
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-30 DOI: 10.1109/TEMC.2024.3511938
Gan Yang;Shaodong Chen;Xu Yan;Lu Feng;Weitao Lyu;Gaopeng Lu;Lyuwen Chen;Yanfeng Fan
{"title":"Measurements of Induced Voltages on Overhead Distribution Line Due to Altitude-Triggered Lightning","authors":"Gan Yang;Shaodong Chen;Xu Yan;Lu Feng;Weitao Lyu;Gaopeng Lu;Lyuwen Chen;Yanfeng Fan","doi":"10.1109/TEMC.2024.3511938","DOIUrl":"10.1109/TEMC.2024.3511938","url":null,"abstract":"This article presents the measurements of induced voltages at the terminal of an overhead distribution line caused by three altitude-triggered lightning events, consisting of three mini-return strokes and 16 subsequent return strokes. The results indicate that even mini-return strokes can generate significant induced voltages on the overhead line, as one of the mini-return strokes occurring at a distance of 20 m produces a peak value of 37.1 kV. The voltage waveforms predominantly exhibit positive polarity, with a noticeable negative polarity rebound at the end of the descending edge. However, the polarity of the voltage waveform induced by a subsequent return stroke exhibits either bipolar or unipolar characteristics, depending on the location of the lightning relative to the overhead line. During a lightning event, the average 10%–90% rise time of the induced voltage waveforms caused by the subsequent return strokes is slightly less than that of the mini-return stroke. Moreover, compared with the simulation results, the induced voltages are notably influenced by the tortuosity of the lightning channel.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"200-208"},"PeriodicalIF":2.0,"publicationDate":"2024-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142905170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling Nonlinear Black-Box Conducted Immunity of Mixed Analog-Digital Integrated Circuits Using Particle Swarm Optimization (PSO) and Piecewise Volterra Series 基于粒子群算法和分段Volterra级数的混合模数集成电路非线性黑盒传导抗扰度建模
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-26 DOI: 10.1109/temc.2024.3516496
Xi Chen, Shuguo Xie, Mengyuan Wei, Bing Shao, Yuanyuan Li, Shuling Zhou, Xiaozong Huang, Xiaoqiang Yang, Wenshuang Yi, Xiaokang Wen
{"title":"Modeling Nonlinear Black-Box Conducted Immunity of Mixed Analog-Digital Integrated Circuits Using Particle Swarm Optimization (PSO) and Piecewise Volterra Series","authors":"Xi Chen, Shuguo Xie, Mengyuan Wei, Bing Shao, Yuanyuan Li, Shuling Zhou, Xiaozong Huang, Xiaoqiang Yang, Wenshuang Yi, Xiaokang Wen","doi":"10.1109/temc.2024.3516496","DOIUrl":"https://doi.org/10.1109/temc.2024.3516496","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"31 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-12-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142887509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the Application of the Guided-Wave Approach to Reproduce the Electromagnetic Fields Radiated by Precursory Pulses in Altitude-Triggered Lightning 导波法在高度触发闪电前兆脉冲电磁场再现中的应用
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-25 DOI: 10.1109/TEMC.2024.3507793
Quanxin Li;Guohua Yang;Chijie Zhuang;Yang Zhang;Weitao Lyu;Bo Zhang;Jinliang He
{"title":"On the Application of the Guided-Wave Approach to Reproduce the Electromagnetic Fields Radiated by Precursory Pulses in Altitude-Triggered Lightning","authors":"Quanxin Li;Guohua Yang;Chijie Zhuang;Yang Zhang;Weitao Lyu;Bo Zhang;Jinliang He","doi":"10.1109/TEMC.2024.3507793","DOIUrl":"10.1109/TEMC.2024.3507793","url":null,"abstract":"The electric fields radiated by precursory pulses from triggered lightning experiments were carried out in this article. Preceding the initial stage, a total of 50 precursors are found span a duration of over 500 ms using a threshold of 50 A. The statistical summary of the precursory current pulses was presented. Two selected precursors were simulated and compared to the measured electric fields based on the extended guided-wave M-component model considering the presence of tall object on the ground. It is found that the late-time response of the electric fields at 110 m, which is mainly produced due to the presence of the wind turbine blade, generally agrees well with the measured data from the two precursors. Notable excursions of both initial negative and the following positive polarities are found through the simulated electric fields. The azimuthal magnetic fields are presented, as well as the sensitivity analysis about the electric and magnetic fields.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"209-216"},"PeriodicalIF":2.0,"publicationDate":"2024-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142887816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Electromagnetic Compatibility Society Information IEEE电磁兼容协会信息
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-19 DOI: 10.1109/TEMC.2024.3504884
{"title":"IEEE Electromagnetic Compatibility Society Information","authors":"","doi":"10.1109/TEMC.2024.3504884","DOIUrl":"10.1109/TEMC.2024.3504884","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"C2-C2"},"PeriodicalIF":2.0,"publicationDate":"2024-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10807724","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Open Access Publishing IEEE开放获取出版
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-19 DOI: 10.1109/TEMC.2024.3512241
{"title":"IEEE Open Access Publishing","authors":"","doi":"10.1109/TEMC.2024.3512241","DOIUrl":"10.1109/TEMC.2024.3512241","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"1922-1922"},"PeriodicalIF":2.0,"publicationDate":"2024-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10807761","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Electromagnetic Compatibility Information for Authors IEEE《作者电磁兼容性信息汇刊》
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-19 DOI: 10.1109/TEMC.2024.3504877
{"title":"IEEE Transactions on Electromagnetic Compatibility Information for Authors","authors":"","doi":"10.1109/TEMC.2024.3504877","DOIUrl":"10.1109/TEMC.2024.3504877","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"C3-C3"},"PeriodicalIF":2.0,"publicationDate":"2024-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10807763","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Electromagnetic Compatibility Information for Authors IEEE《作者电磁兼容性信息汇刊》
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-19 DOI: 10.1109/TEMC.2024.3504886
{"title":"IEEE Transactions on Electromagnetic Compatibility Information for Authors","authors":"","doi":"10.1109/TEMC.2024.3504886","DOIUrl":"10.1109/TEMC.2024.3504886","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"C3-C3"},"PeriodicalIF":2.0,"publicationDate":"2024-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10807728","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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