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IEEE Transactions on Electromagnetic Compatibility最新文献

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Design of SREMP Simulator Based on the Oblique Thin-Wire FDTD Method 基于斜细线时域有限差分法的SREMP模拟器设计
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-08 DOI: 10.1109/temc.2025.3583177
Zheng-Yu Huang, Yi-Ru Zheng, Chen Chao, Li-Hua Shi
{"title":"Design of SREMP Simulator Based on the Oblique Thin-Wire FDTD Method","authors":"Zheng-Yu Huang, Yi-Ru Zheng, Chen Chao, Li-Hua Shi","doi":"10.1109/temc.2025.3583177","DOIUrl":"https://doi.org/10.1109/temc.2025.3583177","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"4 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144603038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Near-Field Radiation Prediction for Neuromorphic Chip Based on Deep Learning 基于深度学习的神经形态芯片近场辐射预测
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-08 DOI: 10.1109/temc.2025.3583673
Yan Li, Li-Nan Mo, Dianjun Deng, Guoliang Yu, Yang Qiu, Mingmin Zhu, Jiawei Wang, Haomiao Zhou, Da Li, En-Xiao Liu, Er-Ping Li
{"title":"Near-Field Radiation Prediction for Neuromorphic Chip Based on Deep Learning","authors":"Yan Li, Li-Nan Mo, Dianjun Deng, Guoliang Yu, Yang Qiu, Mingmin Zhu, Jiawei Wang, Haomiao Zhou, Da Li, En-Xiao Liu, Er-Ping Li","doi":"10.1109/temc.2025.3583673","DOIUrl":"https://doi.org/10.1109/temc.2025.3583673","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"49 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144603005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Accurate Characterization of Electromagnetic Coupling Through Hollow Shields With TWP Cables Over an Ultrawide Frequency Range 超宽频率范围内TWP电缆空心屏蔽电磁耦合的精确表征
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-04 DOI: 10.1109/temc.2025.3578332
Oussama Gassab, Hao Xie, Yu Zhu, Chunlei Zhang, Xianjun Hu, Xiaomeng Ren, Ruisang Liu, Xiude Tu, Duo Xiao, Wen-Yan Yin
{"title":"Accurate Characterization of Electromagnetic Coupling Through Hollow Shields With TWP Cables Over an Ultrawide Frequency Range","authors":"Oussama Gassab, Hao Xie, Yu Zhu, Chunlei Zhang, Xianjun Hu, Xiaomeng Ren, Ruisang Liu, Xiude Tu, Duo Xiao, Wen-Yan Yin","doi":"10.1109/temc.2025.3578332","DOIUrl":"https://doi.org/10.1109/temc.2025.3578332","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"29 1","pages":"1-9"},"PeriodicalIF":2.1,"publicationDate":"2025-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144566036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nanostructured, Highly Flexible, Optically Transparent EMI Shielding Thin Film for Smart Electronics 用于智能电子的纳米结构，高度柔性，光学透明的电磁干扰屏蔽薄膜
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-03 DOI: 10.1109/temc.2025.3581564
Anshuman Choudhary, M. Jaleel Akhtar
{"title":"Nanostructured, Highly Flexible, Optically Transparent EMI Shielding Thin Film for Smart Electronics","authors":"Anshuman Choudhary, M. Jaleel Akhtar","doi":"10.1109/temc.2025.3581564","DOIUrl":"https://doi.org/10.1109/temc.2025.3581564","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"13 1","pages":"1-9"},"PeriodicalIF":2.1,"publicationDate":"2025-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144566089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterizing Magnetic Shielding Effectiveness Below 30 MHz Using Time-Domain Techniques 利用时域技术表征30mhz以下的磁屏蔽效能
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-01 DOI: 10.1109/temc.2025.3581324
Julio C. Parra, Lirim Koraqi, Davy Pissoort, Mireya Fernández-Chimeno, Frank Leferink, Marco A. Azpúrua
{"title":"Characterizing Magnetic Shielding Effectiveness Below 30 MHz Using Time-Domain Techniques","authors":"Julio C. Parra, Lirim Koraqi, Davy Pissoort, Mireya Fernández-Chimeno, Frank Leferink, Marco A. Azpúrua","doi":"10.1109/temc.2025.3581324","DOIUrl":"https://doi.org/10.1109/temc.2025.3581324","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"69 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144533273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
About the Detection of Instantaneous and Delayed Failures During Radiated Susceptibility Tests Performed in Reverberation Chambers as a Function of the Stirring Technique 关于在混响室中进行的辐射敏感性试验中瞬时和延迟失效的检测与搅拌技术的关系
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-01 DOI: 10.1109/temc.2025.3572703
Quentin Jacquet, Guillaume Andrieu, Ludovic Vollet, Marc Romero-De-La-Osa
{"title":"About the Detection of Instantaneous and Delayed Failures During Radiated Susceptibility Tests Performed in Reverberation Chambers as a Function of the Stirring Technique","authors":"Quentin Jacquet, Guillaume Andrieu, Ludovic Vollet, Marc Romero-De-La-Osa","doi":"10.1109/temc.2025.3572703","DOIUrl":"https://doi.org/10.1109/temc.2025.3572703","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"23 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144532971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Decoupling Method to Reduce Radio Frequency Interference (RFI) Noise From High-Speed Connector 一种降低高速连接器射频干扰（RFI）噪声的新型解耦方法
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-01 DOI: 10.1109/temc.2025.3580282
Chih-Yu Fang, Li-Ching Huang, Bin-Chyi Tseng, Tzong-Lin Wu
{"title":"A Novel Decoupling Method to Reduce Radio Frequency Interference (RFI) Noise From High-Speed Connector","authors":"Chih-Yu Fang, Li-Ching Huang, Bin-Chyi Tseng, Tzong-Lin Wu","doi":"10.1109/temc.2025.3580282","DOIUrl":"https://doi.org/10.1109/temc.2025.3580282","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"19 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144533274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Broadband Transmission Rasorber With Dual-Broadband Absorption by High-Accuracy Equivalent Admittance Analysis Method With Convergent Solution Conditions 采用收敛解条件下高精度等效导纳分析方法的双宽带吸收宽带传输反射器
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-07-01 DOI: 10.1109/temc.2025.3580406
Zijian Xing, Jilong Cui, Pengyue Yang, Qian Wang, Guangwei Yang, Jianying Li, Ling Wang
{"title":"Broadband Transmission Rasorber With Dual-Broadband Absorption by High-Accuracy Equivalent Admittance Analysis Method With Convergent Solution Conditions","authors":"Zijian Xing, Jilong Cui, Pengyue Yang, Qian Wang, Guangwei Yang, Jianying Li, Ling Wang","doi":"10.1109/temc.2025.3580406","DOIUrl":"https://doi.org/10.1109/temc.2025.3580406","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"47 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144533275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Model-Order Reduction of the Full-Wave Partial-Element Equivalent-Circuit (PEEC) Method Based on a Modal Approach 基于模态方法的全波部分单元等效电路（PEEC）模型阶降阶方法
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-06-23 DOI: 10.1109/temc.2025.3577351
Philipp Herwigk, Marco Leone
{"title":"Model-Order Reduction of the Full-Wave Partial-Element Equivalent-Circuit (PEEC) Method Based on a Modal Approach","authors":"Philipp Herwigk, Marco Leone","doi":"10.1109/temc.2025.3577351","DOIUrl":"https://doi.org/10.1109/temc.2025.3577351","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"51 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144370691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Impact of Discharge-Point Geometry on Air-Discharge ESD Testing: Current-Waveform Shape and Intensity 放电点几何形状对空气放电ESD测试的影响：电流波形形状和强度
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-06-19 DOI: 10.1109/temc.2025.3576324
Hans Kunz
{"title":"The Impact of Discharge-Point Geometry on Air-Discharge ESD Testing: Current-Waveform Shape and Intensity","authors":"Hans Kunz","doi":"10.1109/temc.2025.3576324","DOIUrl":"https://doi.org/10.1109/temc.2025.3576324","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"26 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144328537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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