IEEE Transactions on Electromagnetic Compatibility最新文献

筛选
英文 中文
Operator Influence on IEC 61000-4-2 ESD Waveforms: A Study and Ferrite-Based Replication Proposal 运营商对IEC 61000-4-2 ESD波形的影响:研究和基于铁氧体的复制建议
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-28 DOI: 10.1109/temc.2025.3560614
Panagiotis K. Papastamatis, Eleni P. Nicolopoulou, Christos A. Christodoulou, Ioannis F. Gonos
{"title":"Operator Influence on IEC 61000-4-2 ESD Waveforms: A Study and Ferrite-Based Replication Proposal","authors":"Panagiotis K. Papastamatis, Eleni P. Nicolopoulou, Christos A. Christodoulou, Ioannis F. Gonos","doi":"10.1109/temc.2025.3560614","DOIUrl":"https://doi.org/10.1109/temc.2025.3560614","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"42 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143884312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Pearson's Random Walk Method of Estimating the Electromagnetic Emissions of $N$ Parallel Connected Power Electronic Converters 估计N并联电力电子变流器电磁辐射的Pearson随机游走法
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-22 DOI: 10.1109/temc.2025.3556297
Erjon Ballukja, Karol Niewiadomski, Patrick Koch, Jacek Bojarski, Paul Evans, Niek Moonen, Mark Sumner, David W. P. Thomas
{"title":"A Pearson's Random Walk Method of Estimating the Electromagnetic Emissions of $N$ Parallel Connected Power Electronic Converters","authors":"Erjon Ballukja, Karol Niewiadomski, Patrick Koch, Jacek Bojarski, Paul Evans, Niek Moonen, Mark Sumner, David W. P. Thomas","doi":"10.1109/temc.2025.3556297","DOIUrl":"https://doi.org/10.1109/temc.2025.3556297","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"43 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143862125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Ultrawideband Multituned Absorber With Frequency-Agile Characteristic for EMI Shielding 用于 EMI 屏蔽的具有频率敏捷特性的超宽带多谐吸收器
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-22 DOI: 10.1109/temc.2025.3553764
Jiamei Qin, Mingyu Sun, Aixin Chen
{"title":"An Ultrawideband Multituned Absorber With Frequency-Agile Characteristic for EMI Shielding","authors":"Jiamei Qin, Mingyu Sun, Aixin Chen","doi":"10.1109/temc.2025.3553764","DOIUrl":"https://doi.org/10.1109/temc.2025.3553764","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"2 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143862124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Radio Wave Exposure of the Human Head at Multiple Frequencies of Up to 6 GHz 6 GHz以下多频率人体头部无线电波暴露的评估
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-21 DOI: 10.1109/temc.2025.3554689
Keisuke Kimura, Kazuyuki Saito, Masaharu Takahashi, Tomoaki Nagaoka
{"title":"Evaluation of Radio Wave Exposure of the Human Head at Multiple Frequencies of Up to 6 GHz","authors":"Keisuke Kimura, Kazuyuki Saito, Masaharu Takahashi, Tomoaki Nagaoka","doi":"10.1109/temc.2025.3554689","DOIUrl":"https://doi.org/10.1109/temc.2025.3554689","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"1 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143857743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Effective Approximate Mathematical Expression for Non-Linear Resistance Characteristics of Metal Oxide Elements 金属氧化物元素非线性电阻特性的有效近似数学表达式
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-17 DOI: 10.1109/temc.2025.3557030
Peerawut Yutthagowith, Yoshihiro Baba
{"title":"An Effective Approximate Mathematical Expression for Non-Linear Resistance Characteristics of Metal Oxide Elements","authors":"Peerawut Yutthagowith, Yoshihiro Baba","doi":"10.1109/temc.2025.3557030","DOIUrl":"https://doi.org/10.1109/temc.2025.3557030","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"1 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143847269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Simple Mathematical Expression for Nonlinear Resistive Characteristics of Metal Oxide Elements in Lightning Surge Analysis 雷电浪涌分析中金属氧化物非线性电阻特性的简单数学表达式
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-17 DOI: 10.1109/temc.2025.3557863
Peerawut Yutthagowith, Yoshihiro Baba
{"title":"A Simple Mathematical Expression for Nonlinear Resistive Characteristics of Metal Oxide Elements in Lightning Surge Analysis","authors":"Peerawut Yutthagowith, Yoshihiro Baba","doi":"10.1109/temc.2025.3557863","DOIUrl":"https://doi.org/10.1109/temc.2025.3557863","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"30 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143847158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Electromagnetic Compatibility Society Publication Information IEEE电磁兼容协会出版信息
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-16 DOI: 10.1109/TEMC.2025.3556341
{"title":"IEEE Electromagnetic Compatibility Society Publication Information","authors":"","doi":"10.1109/TEMC.2025.3556341","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556341","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"C2-C2"},"PeriodicalIF":2.0,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10966499","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143839872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Electromagnetic Compatibility Information for Authors IEEE《作者电磁兼容性信息汇刊》
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-16 DOI: 10.1109/TEMC.2025.3556339
{"title":"IEEE Transactions on Electromagnetic Compatibility Information for Authors","authors":"","doi":"10.1109/TEMC.2025.3556339","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556339","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"C3-C3"},"PeriodicalIF":2.0,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10967049","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143839873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Institutional Listings 机构列表
IF 2 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-16 DOI: 10.1109/TEMC.2025.3556337
{"title":"Institutional Listings","authors":"","doi":"10.1109/TEMC.2025.3556337","DOIUrl":"https://doi.org/10.1109/TEMC.2025.3556337","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"C4-C4"},"PeriodicalIF":2.0,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10966497","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143840006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Automated System for Evaluating AIMD Safety in MRI RF Fields 一种新的MRI射频场中AIMD安全性评估自动化系统
IF 2.1 3区 计算机科学
IEEE Transactions on Electromagnetic Compatibility Pub Date : 2025-04-15 DOI: 10.1109/temc.2025.3556975
Ziyu Zuo, Ao Shen, Farshad Ebrahimi, Qingyan Wang, Jianfeng Zheng, Hongbae Jeong, Ananda Kumar, Ji Chen
{"title":"A Novel Automated System for Evaluating AIMD Safety in MRI RF Fields","authors":"Ziyu Zuo, Ao Shen, Farshad Ebrahimi, Qingyan Wang, Jianfeng Zheng, Hongbae Jeong, Ananda Kumar, Ji Chen","doi":"10.1109/temc.2025.3556975","DOIUrl":"https://doi.org/10.1109/temc.2025.3556975","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"34 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143836733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信