IEEE Open Journal of the Industrial Electronics Society最新文献

{"title":"Dynamic Voltage Balancing Across Series-Connected 10 kV SiC JBS Diodes in Medium Voltage 3L-NPC Power Converter Having Snubberless Series-Connected 10 kV SiC MOSFETs","authors":"Sanket Parashar;Nithin Kolli;Raj Kumar Kokkonda;Ajit Kanale;Subhashish Bhattacharya;Bantval Jayant Baliga","doi":"10.1109/OJIES.2024.3450509","DOIUrl":"10.1109/OJIES.2024.3450509","url":null,"abstract":"This article addresses the mitigation of dynamic voltage imbalance in series-connected 10 kV silicon carbide (SiC) JBS diodes within a three-level NPC (3L-NPC) converter using active turn-\u0000<sc>off</small>\u0000 delay control across complementary series-connected 10 kV SiC \u0000<sc>mosfet</small>\u0000s. The implementation of active turn-\u0000<sc>off</small>\u0000 delay control in SiC \u0000<sc>mosfet</small>\u0000s eliminates the need for passive \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubbers, which otherwise increase the switching \u0000<inline-formula><tex-math>$dv/dt$</tex-math></inline-formula>\u0000 mismatch and snubber current across the diodes. In addition, parasitic base-plate capacitance across \u0000<sc>mosfet</small>\u0000s and diodes, along with parasitic bus bar and snubber inductance in the commutation path, contribute to turn-\u0000<sc>off</small>\u0000 voltage mismatch and snubber loss in series-connected 10 kV SiC JBS diodes. The mismatch in nonlinear capacitance of series-connected devices (\u0000<sc>mosfet</small>\u0000s and diodes) and the nonlinear \u0000<sc>mosfet</small>\u0000 \u0000<inline-formula><tex-math>$i$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$-$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$v_{gs}$</tex-math></inline-formula>\u0000 curve affect the turn-\u0000<sc>on</small>\u0000 and turn-\u0000<sc>off</small>\u0000 voltage transitions between complementary switching \u0000<sc>mosfet</small>\u0000s and diodes, leading to variations in turn-\u0000<sc>off</small>\u0000 voltage mismatch and snubber losses. The 3L-NPC converter has eight types of switching transition, complicating the analysis of \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubber design. This complexity is further increased by nonlinear device parameters, parasitic capacitance, and inductance in the commutation path for each of the eight 10 kV SiC \u0000<sc>mosfet</small>\u0000s and four 10 kV SiC JBS diodes. To address these challenges, this research develops a mathematical model for the switching transition between 10 kV SiC \u0000<sc>mosfet</small>\u0000s and complementary 10 kV SiC JBS diodes in a two-level clamped inductive switching (CIS) test setup. The model considers the effects of parasitic base-plate capacitance and the absence of an \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubber due to active turn-\u0000<sc>off</small>\u0000 delay control across series-connected SiC \u0000<sc>mosfet</small>\u0000s. Subsequently, the mathematical model is refined using an iterative algorithm to account for mismatches in nonlinear device capacitance of \u0000<sc>mosfet</small>\u0000s and diodes, as well as the nonlinear \u0000<inline-formula><tex-math>$i$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$-$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$v_{gs}$</tex-math></inline-formula>\u0000 curve of \u0000<sc>mosfet</small>\u0000s during the switching transition of the diode. This refined model is then used to design the \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubber for series-connected 10 kV SiC JBS diodes and to optimize the turn-\u0000","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1058-1084"},"PeriodicalIF":5.2,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10652239","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Comparative Assessment of Modulation Strategies in Modular Multilevel Converters: An Attempt for a Better Compromise Between the Efficiency and Capacitor Voltages' Dispersion","authors":"Anthony Abdayem;Jean Sawma;Adrián Beneit;Ramon Blasco-Gimenez;Flavia Khatounian;Eric Monmasson","doi":"10.1109/OJIES.2024.3447885","DOIUrl":"10.1109/OJIES.2024.3447885","url":null,"abstract":"Modulation techniques for Modular Multilevel Converters (MMCs) encounter a limit in the tradeoff between reducing the total harmonic distortion (THD) of the load current and minimizing the number of commutations, primarily due to traditional sorting algorithms. This article presents a novel sorting algorithm to address this challenge. This study compares six modulation methods for MMCs: Nearest Level Control (NLC), Integral Modulation (IM), and PWM using a traditional sorting algorithm, alongside their modified versions featuring the novel sorting algorithm. The effectivenss of each modulation technique discussed in this article is verified through experimental tests. The results show that the proposed modulation techniques utilizing the suggested sorting algorithm, effectively decrease the switching number while maintaining the THD of the load currents. However, there is a slight increase in the disparity of the capacitor voltages, which remains controllable. In addition, the study fills a gap in the literature by providing experimental evidence and a theoretical framework demonstrating the superior efficiency of IM over NLC through frequency analysis and experimental results. These findings highlight the potential of the proposed techniques to optimize the MMC performance.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1274-1285"},"PeriodicalIF":5.2,"publicationDate":"2024-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10643634","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Design of a Redundancy-Based Cascaded Bidirectional DC–DC Converter for Improved Reliability in Energy Storage Devices","authors":"Thales Augusto Fagundes;Guilherme Henrique Favaro Fuzato;Rafael Fernando Quirino Magossi;Ana Laís Rui Oliveira;Ricardo Quadros Machado","doi":"10.1109/OJIES.2024.3446911","DOIUrl":"10.1109/OJIES.2024.3446911","url":null,"abstract":"This article proposes a redundancy-based cascaded bidirectional dc/dc converter designed to interface battery energy storage system (BESS) units. With the employment of this topology, its reliability is increased due to redundancy in power conversion, which differs from conventional structures formed by dc/dc converters that cannot process power flow when a fault occurs. Thus, the topology is provided merging the cascaded bidirectional Boost converter and cascaded bidirectional Cuk converter. Subsequently, the coupled mathematical model of the proposed topology can be readily calculated, considering all feasible (different) subcircuits according to the switching pattern. Therefore, small-signal analysis is applied to design the PI controllers, followed by a closed-loop performance evaluation using an infinity norm and stability analysis to assess the operation of the dc/dc converter in closed loop for different values of load and current references. Finally, a lab-scale prototype and a hardware-in-the-loop setup prove the effectiveness of the dc/dc converter working in various scenarios and also operating with the traditional SoC-based droop for balancing the BESS units.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"898-915"},"PeriodicalIF":5.2,"publicationDate":"2024-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10643290","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Toward Semantic Event-Handling for Building Explainable Cyber-Physical Systems","authors":"Gernot Steindl;Tobias Schwarzinger;Katrin Schreiberhuber;Fajar J. Ekaputra","doi":"10.1109/OJIES.2024.3447001","DOIUrl":"10.1109/OJIES.2024.3447001","url":null,"abstract":"In the context of cyber-physical systems (CPS), understanding system behaviors is crucial for ensuring reliability, efficiency, and trust. However, due to the increasing complexity of the modern CPS, gaining such understanding is becoming more challenging. In this article we provide a foundation for explaining system behavior through detected system events. To this end, the article proposes a technology-agnostic, semantic event-handling module to address the challenge of enhancing explainability within CPS. This module is designed to be part of the common architecture for Explainable CPS and, therefore, can be integrated seamlessly into existing CPS frameworks by providing different interfaces to access detected events. Two case studies in the smart building and smart grid domain are carried out to demonstrate the feasibility and efficacy of the approach, utilizing an open-source software stack for the prototypical implementation. A qualitative evaluation of the proposed approach, based on the ISO/IEC 25010:2023, was used to analyze the software design. Our evaluation result shows that the semantic event-handling module is appropriate as a generic approach to handling events within a CPS. The module becomes a foundation for incorporating explainability into the system, which is needed as a foundation to ensure human trust and enable informed decision-making.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"928-945"},"PeriodicalIF":5.2,"publicationDate":"2024-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10643286","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Survey of Ontologies Considering General Safety, Security, and Operation Aspects in OT","authors":"Siegfried Hollerer;Thilo Sauter;Wolfgang Kastner","doi":"10.1109/OJIES.2024.3441112","DOIUrl":"10.1109/OJIES.2024.3441112","url":null,"abstract":"The integration of information technology (IT) and operational technology (OT) is deepening, amplifying the interconnectedness of operational, safety, and security demands within industrial automation systems. Lacking comprehensive guidance, risk managers often resort to manual solutions based on best practices or rely on domain experts, who usually offer insights limited to their specific areas of expertise. Given the intricate interplay among these domains, employing ontologies for knowledge representation could hold the key to capturing all necessary relationships and constraints for effective risk management processes. This study conducts a systematic mapping analysis of ontologies published over the past five years, focusing on at least one domain relevant to OT system risk management. Its objective is to categorize papers, offer a panoramic view of research themes and contributors, discern potential publication patterns, and identify research avenues based on a comprehensive review of these ontologies. Findings indicate a relatively stable research interest, with most publications presenting proof of concepts or initial experimental results for their ontological applications. This study establishes a foundation for classifying comprehensive OT ontologies and pinpoints unresolved issues that can steer future research efforts. It offers insights into the current state-of-the-art within this research area.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"861-885"},"PeriodicalIF":5.2,"publicationDate":"2024-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10632623","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141940424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Explainable Model Prediction of Memristor","authors":"Sruthi Pallathuvalappil;Rahul Kottappuzhackal;Alex James","doi":"10.1109/OJIES.2024.3440578","DOIUrl":"10.1109/OJIES.2024.3440578","url":null,"abstract":"System level simulation of neuro-memristive circuits under variability are complex and follow a black-box neural network approach. In realistic hardware, they are often difficult to cross-check for accuracy and reproducible results. The accurate memristor model prediction becomes critical to decipher the overall circuit function in a wide range of nonideal and practical conditions. In most neuro-memristive systems, crossbar configuration is essential for implementing multiply and accumulate calculations, that form the primary unit for neural network implementations. Predicting the specific memristor model that best fits the crossbar simulations to make it explainable is an open challenge that is solved in this article. As the size of the crossbar increases the cross-validation becomes even more challenging. This article proposes predicting the memristor device under test by automatically evaluating the \u0000<italic>I–V</i>\u0000 behavior using random forest and extreme gradient boosting algorithms. Starting with a single memristor model, the prediction approach is extended to memristor crossbar-based circuits explainable. The performance of both algorithms is analyzed based on precision, recall, f1-score, and support. The accuracy, macro average, and weighted average of both algorithms at different operational frequencies are explored.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"836-846"},"PeriodicalIF":5.2,"publicationDate":"2024-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10631696","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141940425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"AutomationML Meets Bayesian Networks: A Comprehensive Safety-Security Risk Assessment in Industrial Control Systems","authors":"Pushparaj Bhosale;Wolfgang Kastner;Thilo Sauter","doi":"10.1109/OJIES.2024.3439388","DOIUrl":"10.1109/OJIES.2024.3439388","url":null,"abstract":"Industrial control systems (ICSs) play a crucial role in the smooth operation of critical infrastructures, and their increasing complexity and interconnectedness necessitate integrating safety and security measures. Thus, an integrated risk assessment approach is essential to identify and address potential hazards and vulnerabilities. However, conducting such risk assessments becomes complex and challenging due to the difficulty in data availability. Acquiring data from various sources poses a significant hurdle. To address these challenges, automation markup language (AML) provides a standardized framework that facilitates the seamless exchange of engineering information. This article uses AML libraries and connection setup techniques to generate a valuable model of a single source of data for an integrated safety and security risk assessment. The automated risk assessment employs the AML model as a data source and the Bayesian belief network (BBN) as the risk assessment method. The value of risk associated with the system is calculated using the BBN models as the product of the probability of occurrence and severity. An evaluation of the proposed risk assessment method is also provided based on ISO 31000. AML's effectiveness as a valuable information model in meeting the growing need for comprehensive safety and security risk assessment in ICSs is demonstrated.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"823-835"},"PeriodicalIF":5.2,"publicationDate":"2024-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10623880","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141940426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"TALESS: TSN With Legacy End-Stations Synchronization","authors":"Daniel Bujosa Mateu;Julian Proenza;Alessandro V. Papadopoulos;Thomas Nolte;Mohammad Ashjaei","doi":"10.1109/OJIES.2024.3436590","DOIUrl":"10.1109/OJIES.2024.3436590","url":null,"abstract":"In order to facilitate the adoption of Time Sensitive Networking (TSN) by the industry, it is necessary to develop tools to integrate legacy systems with TSN. In this article, we propose a solution for the coexistence of different time domains from different legacy systems, each with its corresponding synchronization protocol, in a single TSN network. To this end, we experimentally identified the effects of replacing the communications subsystem of a legacy Ethernet-based network with TSN in terms of synchronization. Based on the results, we propose a solution called TALESS (TSN with Legacy End-Stations Synchronization). TALESS can identify the drift between the TSN communications subsystem and the integrated legacy devices (end-stations) and then modify the TSN schedule to adapt to the different time domains to avoid the effects of the lack of synchronization between them. We validate TALESS through both simulations and experiments on a prototype. We demonstrate that thanks to TALESS, legacy systems can synchronize through TSN and even improve features such as their reception jitter or their integrability with other legacy systems.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"807-822"},"PeriodicalIF":5.2,"publicationDate":"2024-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10620612","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141880628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Design and Comprehensive Multiphysics Analysis of Permanent Magnet Synchronous Motor for Podded Propulsion in Marine Applications","authors":"Jang-Hyun Park;Yeon-Ho Jeong;Do-Kwan Hong","doi":"10.1109/OJIES.2024.3419133","DOIUrl":"10.1109/OJIES.2024.3419133","url":null,"abstract":"This article presents the design and comprehensive multiphysics analysis of a permanent magnet synchronous motor (PMSM) intended for small electric podded propulsion systems in marine applications. Minimizing vibration related to underwater radiated noise (URN) and ensuring thermal stability to allow prolonged continuous operation are crucial aspects of propulsion motor design. To reduce URN, particular attention is given to the stator vibration mode order, determined by the slot/pole combination (SPC) of the PMSM. Structure-borne noise analysis is used to evaluate the equivalent radiated power level of three designed PMSMs with different stator vibration mode orders. One-way multiphysics analysis using finite element analysis (FEA) is performed in a water environment for the finally-selected PMSM with pod housing structure. URN generated from the electromagnetic force is predicted by structural-acoustics analysis. Through lumped-parameter thermal network (LPTN) and computational fluid dynamics (CFD) analyses, it is proposed that, based on the cylindrical housing shape, the thermal stability of the podded propulsor can be evaluated using LPTN analysis instead of CFD analysis. A prototype motor is fabricated to validate the results obtained using FEA.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1011-1028"},"PeriodicalIF":5.2,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10614771","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141869134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Dual Modality Reverse Reranking (DM-RR) Based Image Retrieval Framework","authors":"Ikhlaq Ahmed;Naima Iltaf;Rabia Latif;Nor Shahida Mohd Jamail;Zafran Khan","doi":"10.1109/OJIES.2024.3435956","DOIUrl":"10.1109/OJIES.2024.3435956","url":null,"abstract":"Retrieval of a product with desired modifications from a vast inventory of online industrial platforms is frequently encountered in our daily life. This study presents a specialized framework to retrieve user's queried product with its desired changes incorporated. To facilitate interaction between the end-user and agent in such scenarios, a multimodal content-based image retrieval system is essential. The system extracts textual and visual attributes, combining them through inductive learning to a unified representation. It is based on an in-depth understanding of visual characteristics that are modified by textual semantics. Lastly, a novel reverse reranking (RR) algorithm arranges the joint representation of dual modality queries and their corresponding target images for efficient retrieval. The proposed framework is novel compared to earlier methodologies. First, it achieves successful fusion of two different modalities. Second, it introduces a RR algorithm in the inference stage for efficient retrieval. The proposed framework's enhanced performance has been assessed using the Fashion-200 K and MIT-States real-world benchmark datasets. The proposed system can be used in real-world applications subject to its practical implications, such as generalization to diverse domains, availability of domain specific data, nature of the data and queries, and availability of computational resources.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"886-897"},"PeriodicalIF":5.2,"publicationDate":"2024-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10614798","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141869132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}