IEEE Open Journal of the Industrial Electronics Society最新文献

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A Hidden Surveillant Transmission Line Protection Layer for Cyber-Attack Resilience of Power Systems
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-30 DOI: 10.1109/OJIES.2025.3534588
Hossein Ebrahimi;Sajjad Golshannavaz;Amin Yazdaninejadi;Edris Pouresmaeil
{"title":"A Hidden Surveillant Transmission Line Protection Layer for Cyber-Attack Resilience of Power Systems","authors":"Hossein Ebrahimi;Sajjad Golshannavaz;Amin Yazdaninejadi;Edris Pouresmaeil","doi":"10.1109/OJIES.2025.3534588","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3534588","url":null,"abstract":"This article proposes a framework to enhance the resilience of cyber-physical power systems (CPPSs) against cyber-attacks that are capable of bypassing the cyber-based defense mechanisms. To do so, a hidden and local surveillant protection layer is introduced that utilizes isolated measurement devices. Since this surveillance layer relies on local measurements, cyber-attackers cannot affect its performance. However, it requires highly accurate fault detection and classification units (FDCUs) which means requiring additional expenses. Therefore, at the outset, this article employs a deep-learning-based fault detection and classification method using a bidirectional long short-term memory (Bi-LSTM) model to achieve high accuracy with only local transmission line current measurements. The insight and knowledge of the FDCUs are also shared across their neighboring buses through the power-line-carrier communication system. Owing to the need for additional hardware, this system is modeled within a techno-economic framework. The established framework is applied to the CPPS through the evaluation based on distance from average solution (EDAS) method. The EDAS method allows for dynamic adjustments to the integration level of FDCUs based on an analysis of potential cascading failures from various cyber-attack target sets. Extensive simulations conducted on the IEEE 30-bus testbed validate the effectiveness of the proposed framework. The conducted evaluations show that the Bi-LSTM model achieves an impressive accuracy level exceeding 99.66%. This result highlights the robust performance of the proposed surveillant layer and demonstrates its superiority over existing fault detection and classification methods. The scalability of the proposed framework is also confirmed on the IEEE 118-bus testbed.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"170-180"},"PeriodicalIF":5.2,"publicationDate":"2025-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10858390","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automated Cattle Monitoring System for Calving Time Prediction Using Trajectory Data Embedded Time Series Analysis
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-28 DOI: 10.1109/OJIES.2025.3533663
Wai Hnin Eaindrar Mg;Thi Thi Zin;Pyke Tin;Masaru Aikawa;Kazayuki Honkawa;Yoichiro Horii
{"title":"Automated Cattle Monitoring System for Calving Time Prediction Using Trajectory Data Embedded Time Series Analysis","authors":"Wai Hnin Eaindrar Mg;Thi Thi Zin;Pyke Tin;Masaru Aikawa;Kazayuki Honkawa;Yoichiro Horii","doi":"10.1109/OJIES.2025.3533663","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3533663","url":null,"abstract":"This research introduces an automated system for cattle monitoring and calving time prediction, utilizing trajectory data embedded with time-series analysis. Designed for large-scale farms, our system offers continuous 12-h monitoring, ensuring precise capture of cattle movements. By utilizing time series analysis on the trajectory data, our system predicts calving events in advance, effectively distinguishing between abnormal (requiring human assistance) and normal (not requiring assistance) for each cow. We utilized 360° surveillance cameras to provide comprehensive coverage without disturbing the cattle's natural behavior. We employed tailored versions of the Detectron2 and YOLOv8 models to achieve efficient and precise cattle detection, comparing their performance in terms of missed detections and false detections. For tracking, we used our customized tracking algorithm, which minimizes ID switching and ensures continuous identification even in challenging conditions such as occlusions. While some ID switching errors still occur over extended tracking periods, we integrated tracking and identification to further optimize the handling of track IDs and global IDs. Our system incorporates a 4-h forecasting of cattle movement using Euclidean fluctuating summation (EFS) feature combined with our custom long short-term memory model. Experimental results demonstrate a detection accuracy of 98.70%, tracking and identification accuracy of 99.18%, and forecasting with an average error rate of 14.07%. Furthermore, the system accurately classifies cattle as either normal or abnormal and predicts calving events a 4-h in advance using the EFS feature, comparing its performance with various machine learning algorithms. The system's seamless integration significantly enhances farm management and animal welfare.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"216-234"},"PeriodicalIF":5.2,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10856329","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143388645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Tuning Method for the Supplementary Voltage Controller of Dual-Side Grid Forming Converters in Distributed Storage Systems
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-23 DOI: 10.1109/OJIES.2025.3533022
Angel Perez-Basante;Asier Gil de Muro;Ander Ordono;Salvador Ceballos;Eneko Unamuno;Jon Andoni Barrena
{"title":"A Tuning Method for the Supplementary Voltage Controller of Dual-Side Grid Forming Converters in Distributed Storage Systems","authors":"Angel Perez-Basante;Asier Gil de Muro;Ander Ordono;Salvador Ceballos;Eneko Unamuno;Jon Andoni Barrena","doi":"10.1109/OJIES.2025.3533022","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3533022","url":null,"abstract":"Utility-scale battery energy storage systems (BESSs) are currently being used to provide auxiliary services, such as frequency regulation, peak shaving, or grid balancing, among others. Hybrid ac/dc distribution grids where the BESS systems are connected in the dc side and the dc/ac interface is implemented through a grid forming (GF) converter are currently researched. These solutions combine the benefits given by the dc distribution and the possibility to provide emulated inertia and damping to the system through the use of GF control techniques. This article presents a novel tuning method, based on small signal analysis, for the configuration parameters of a dual-side GF controller. It aims to minimize the dynamic performance difference between the dual-side and ideal GF controllers, thus ensuring that the dual-side GF provides the expected support to the grid in terms of inertia, damping and primary response, while simultaneously controlling the dc voltage. This is achieved through the optimum tuning of the supplementary dc voltage regulator embedded in the dual-side GF controller. Real-time estimation of the optimum controller gains by making use of an artificial neural network is proposed. Simulation and experimental results are presented to validate the method.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"202-215"},"PeriodicalIF":5.2,"publicationDate":"2025-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10850770","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Run-Time Value Chain Analysis and Cost Accounting via Microservices in Agile Manufacturing
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-22 DOI: 10.1109/OJIES.2025.3532664
Salman Javed;Cristina Paniagua;Imran Javed;Jan van Deventer;Jerker Delsing
{"title":"Run-Time Value Chain Analysis and Cost Accounting via Microservices in Agile Manufacturing","authors":"Salman Javed;Cristina Paniagua;Imran Javed;Jan van Deventer;Jerker Delsing","doi":"10.1109/OJIES.2025.3532664","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3532664","url":null,"abstract":"The rapid evolution of manufacturing processes driven by Industry 4.0 demands systems capable of quickly adapting to dynamic market conditions and evolving customer needs. Agile manufacturing emphasizes flexibility, adaptability, and real-time responsiveness, posing challenges in run-time value chain analysis (VCA), including cost flows and production times. This article presents a novel two-stage VCA approach using an activity-based costing mechanism via microservices to address these challenges. The VCA system enables real-time cost accounting and decision-making, supporting both pre and postproduction VCA, contrasting with traditional methods that rely on historical data. The first stage involves top–down cost calculations from resources to microservices. In contrast, the second focuses on constructing efficient manufacturing activities based on product requirements, allowing for granular analysis of costs and production times across microservices, activities, broader business processes, and finally, cost objects (e.g., customized products, batches of products, or customer invoices). The approach is validated through a proof-of-concept implementation of the VCA system integrated with the Eclipse Arrowhead framework and simulating Fischertechnik indexed line milling, drilling, and conveying operations. The results demonstrate the effectiveness of the proposed method in providing detailed insights into costs and production times, enhancing the efficiency and competitiveness of agile manufacturers.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"181-201"},"PeriodicalIF":5.2,"publicationDate":"2025-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10849611","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2024 Index IEEE Open Journal of the Industrial Electronics Society Vol. 5 IEEE工业电子学会开放期刊第5卷
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-20 DOI: 10.1109/OJIES.2025.3531738
{"title":"2024 Index IEEE Open Journal of the Industrial Electronics Society Vol. 5","authors":"","doi":"10.1109/OJIES.2025.3531738","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3531738","url":null,"abstract":"","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1-23"},"PeriodicalIF":5.2,"publicationDate":"2025-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10847312","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142992884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reliable DC Shipboard Power Systems—Design, Assessment, and Improvement
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-20 DOI: 10.1109/OJIES.2025.3532095
Robin van der Sande;Aditya Shekhar;Pavol Bauer
{"title":"Reliable DC Shipboard Power Systems—Design, Assessment, and Improvement","authors":"Robin van der Sande;Aditya Shekhar;Pavol Bauer","doi":"10.1109/OJIES.2025.3532095","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3532095","url":null,"abstract":"Targeting a climate-neutral maritime sector drives the adoption of the all-electric ship (AES). While AESs can utilize both ac and dc shipboard power systems (SPS), a dc system offers advantages in efficiency, power density, and source synchronization. However, the enhanced network complexity of dc grids combined with the high penetration of power electronic devices and harsh environmental conditions can compromise the system's reliability. Therefore, this article provides an overview of the reliability aspect of dc-SPSs, addressing the power system design, adequacy assessment, and reliability improvement. First, the performance tradeoffs associated with the SPS design are examined, revealing how changes in the power system topology and dc bus structure impact the vessel's reliability along with other performance parameters. Second, a hierarchical reliability model framework is proposed for the adequacy assessment of dc-SPSs, considering the reliability from the component level up to the system level. To determine the system-level reliability, multiple probabilistic methods, including simulation and analytical models, are compared using a propulsion subsystem example. Finally, an overview of the reliability improvement strategies is provided, addressing methods at the system, device, and component level. These three topics combined aim to provide guidance in the design of future reliable dc-SPSs.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"235-264"},"PeriodicalIF":5.2,"publicationDate":"2025-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10848163","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143430505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Robust Impedance Emulation for Transmission Line Interface in Power-Hardware-in-the-Loop Applications: Optimal Filter Approach
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-17 DOI: 10.1109/OJIES.2025.3531233
Dmitry Rimorov;James Richard Forbes;Olivier Tremblay;Richard Gagnon
{"title":"Robust Impedance Emulation for Transmission Line Interface in Power-Hardware-in-the-Loop Applications: Optimal Filter Approach","authors":"Dmitry Rimorov;James Richard Forbes;Olivier Tremblay;Richard Gagnon","doi":"10.1109/OJIES.2025.3531233","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3531233","url":null,"abstract":"Power-hardware-in-the-loop (PHIL) simulation infrastructure is an invaluable tool for testing and validating emerging technologies expected to be connected to power grids. As such, PHIL closed-loop stability is a crucial factor to consider when designing its numerical interface. Recent work has shown that the transmission line method provides a robust solution to the PHIL interface stability problem while achieving a high level of PHIL closed-loop performance. However, to fully utilize its advantages, it requires a fast impedance emulation control loop. To solve this problem, this article proposes an <inline-formula><tex-math>$mathcal {H}_{infty }$</tex-math></inline-formula> optimal filter approach for characteristic impedance emulation, which allows a systematic and tractable design procedure and produces a robust controller. Robust stability and performance are assessed through the positive realness check and by virtue of the structured singular value. The proposed method and the resulting controller are compared to an existing approach and validated on a 3-kVA, 208-V PHIL experimental testbed with different types of the device under test, including a residential solar inverter. The results demonstrate significant performance improvements that are crucial for the future megawatt-scale PHIL infrastructure.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"158-169"},"PeriodicalIF":5.2,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10844502","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Industrial Electronics Society Information IEEE工业电子学会信息
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-16 DOI: 10.1109/OJIES.2024.3360071
{"title":"IEEE Industrial Electronics Society Information","authors":"","doi":"10.1109/OJIES.2024.3360071","DOIUrl":"https://doi.org/10.1109/OJIES.2024.3360071","url":null,"abstract":"","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"C3-C3"},"PeriodicalIF":5.2,"publicationDate":"2025-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10843406","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142993316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Open Journal of the Industrial Electronics Society Publication Information IEEE工业电子学会开放杂志出版信息
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-15 DOI: 10.1109/OJIES.2024.3360073
{"title":"IEEE Open Journal of the Industrial Electronics Society Publication Information","authors":"","doi":"10.1109/OJIES.2024.3360073","DOIUrl":"https://doi.org/10.1109/OJIES.2024.3360073","url":null,"abstract":"","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"C2-C2"},"PeriodicalIF":5.2,"publicationDate":"2025-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10843091","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142992836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enhancing Industrial Cybersecurity: Insights From Analyzing Threat Groups and Strategies in Operational Technology Environments
IF 5.2
IEEE Open Journal of the Industrial Electronics Society Pub Date : 2025-01-08 DOI: 10.1109/OJIES.2025.3527585
Mukund Bhole;Thilo Sauter;Wolfgang Kastner
{"title":"Enhancing Industrial Cybersecurity: Insights From Analyzing Threat Groups and Strategies in Operational Technology Environments","authors":"Mukund Bhole;Thilo Sauter;Wolfgang Kastner","doi":"10.1109/OJIES.2025.3527585","DOIUrl":"https://doi.org/10.1109/OJIES.2025.3527585","url":null,"abstract":"In recent years, concepts and components of information technology (IT) have made their way into the shop floor, today better known as operational technology (OT). The increasing interconnection and convergence of IT and OT have exposed industrial infrastructures to cyber attacks. In addition, they have become vulnerable to advanced persistent threats. This article examines real-world incidents, looking at the complex landscape of threat groups targeting OT environments and the tactic, technique, and procedures employed by these threat groups. Consequently, it highlights the need for increased vigilance in protecting OT environments, which can be done by using a variety of open-source threat intelligence platforms and databases, including Thai computer emergency response team (ThaiCERT), Malpedia by Fraunhofer-Institut für Kommunikation, Informationsverarbeitung und Ergonomie (Malpedia by FKIE), adversarial tactics, techniques, and common knowledge by massachusetts institute of technology research and engineering (MITRE ATT&CK), and Industrial Control Systems Cyber Emergency Response Team. We aim to provide relevant stakeholders (manufacturers, asset owners and system integrators), including Chief Information Security Officers, with information on emerging threat groups, attack victims and their locations, the origins of attacks, the tools and types of tools used, and the motivations behind these attacks. This understanding is crucial to improving defensive strategies based on relevant standards and frameworks and protecting OT environments against evolving cyber threats.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"6 ","pages":"145-157"},"PeriodicalIF":5.2,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10834594","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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