IEEE Open Journal of the Industrial Electronics Society最新文献

{"title":"Battery Energy Storage Systems in Microgrids: A Review of SoC Balancing and Perspectives","authors":"Thales Augusto Fagundes;Guilherme Henrique Favaro Fuzato;Lucas Jonys Ribeiro Silva;Augusto Matheus dos Santos Alonso;Juan C. Vasquez;Josep M. Guerrero;Ricardo Quadros Machado","doi":"10.1109/OJIES.2024.3455239","DOIUrl":"10.1109/OJIES.2024.3455239","url":null,"abstract":"Microgrids (MGs) often integrate various energy sources to enhance system reliability, including intermittent methods, such as solar panels and wind turbines. Consequently, this integration contributes to a more resilient power distribution system. In addition, battery energy storage system (BESS) units are connected to MGs to offer grid-supporting services, such as peak shaving, load compensation, power factor quality, and operation during source failures. In this context, an energy management system (EMS) is necessary to incorporate BESS in MGs. Consequently, state-of-charge (SoC) equalization is a common approach to address EMS requirements and balance the internal load among BESS units in MG operation. In this article, we present a comprehensive review of EMS strategies for balancing SoC among BESS units, including centralized and decentralized control, multiagent systems, and other concepts, such as designing nonlinear strategies, optimal algorithms, and categorizing agents into clusters. Moreover, in this article, we discuss alternatives to improve EMS and strategies regarding the topology of power converters, including redundancy-based topology, modular multilevel converter, cascaded-based converter, and hybrid-type systems. In addition, this article explores optimization processes aimed at reducing operational costs while considering SoC equalization. Finally, second-life BESS units are explored as an emerging topic, focusing on their operation within specific power converters topologies to achieve SoC balance.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"961-992"},"PeriodicalIF":5.2,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10666276","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Real-Time Cyber-Physical Digital Twin for Low Earth Orbit Satellite Constellation Network Enhanced Wide-Area Power Grid","authors":"Tianshi Cheng;Tong Duan;Venkata Dinavahi","doi":"10.1109/OJIES.2024.3454010","DOIUrl":"10.1109/OJIES.2024.3454010","url":null,"abstract":"Low Earth orbit (LEO) satellite networks, such as SpaceX's Starlink, offer enhanced communication potential for contemporary power grid measurement and control. Yet, the dynamic nature of these networks complicates their modeling and simulation. This study introduces a modular, data-oriented digital twin framework for real-time simulation of wide-area ac–dc grids with LEO satellite networks. The framework integrates RustSat for satellite tracking, SatSDN with MiniNet for SDN simulations, and entity-component-system (ECS)-Grid for real-time power system simulation. It features a data-centric design using an ECS framework with a structure-of-arrays memory layout, optimizing cache efficiency and computational performance, and offers high extensibility for interdisciplinary simulations. This marks the initial effort to develop a digital twin for real-time co-simulation of large-scale power systems and LEO satellite constellation networks. Evaluations on a wide-area synthetic ac–dc system with multiple satellite network types confirm the efficiency and precision of our approach, underscoring its potential in bridging LEO satellite networks with power system applications.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1029-1041"},"PeriodicalIF":5.2,"publicationDate":"2024-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10663871","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Developing a TinyML Image Classifier in an Hour","authors":"Riccardo Berta;Ali Dabbous;Luca Lazzaroni;Danilo Pietro Pau;Francesco Bellotti","doi":"10.1109/OJIES.2024.3451959","DOIUrl":"10.1109/OJIES.2024.3451959","url":null,"abstract":"Tiny machine learning technologies are bringing intelligence ever closer to the sensor, thus enabling the key benefits of edge computing (e.g., reduced latency, improved data security, higher energy efficiency, and lower bandwidth consumption, also without the need for constant connectivity). This promises to significantly enhance industrial applications but requires suited development tools to deal with the complexity of the edge technologies and context. We propose an agile Jupyter Python notebook as a simple, manageable tool to efficiently and effectively develop microcontroller-based intelligent imaging classification sensors. The notebook implements a methodology involving hyperparameter tuning and comparison of different shallow and deep learning models, with quantization. It exports TensorFlow Lite models, deployable on several microcontroller families, and optionally exploits the STM32Cube.AI developer cloud service, which allows benchmarking the developed models on a set of real-world tiny hardware target platforms. Assessment concerns various types of metrics, both for machine learning (e.g., accuracy) and embedded systems (e.g., memory footprint, latency, and energy consumption). We have verified the support for development effectiveness and efficiency on four ultralow resolution image-classification datasets, with different levels of input and task complexity. In all cases, the tool was able to build microcontroller-deployment ready, beyond the state-of-the-art models, within 1 h on Google Colab CPUs.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"946-960"},"PeriodicalIF":5.2,"publicationDate":"2024-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10659231","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Dynamic Voltage Balancing Across Series-Connected 10 kV SiC JBS Diodes in Medium Voltage 3L-NPC Power Converter Having Snubberless Series-Connected 10 kV SiC MOSFETs","authors":"Sanket Parashar;Nithin Kolli;Raj Kumar Kokkonda;Ajit Kanale;Subhashish Bhattacharya;Bantval Jayant Baliga","doi":"10.1109/OJIES.2024.3450509","DOIUrl":"10.1109/OJIES.2024.3450509","url":null,"abstract":"This article addresses the mitigation of dynamic voltage imbalance in series-connected 10 kV silicon carbide (SiC) JBS diodes within a three-level NPC (3L-NPC) converter using active turn-\u0000<sc>off</small>\u0000 delay control across complementary series-connected 10 kV SiC \u0000<sc>mosfet</small>\u0000s. The implementation of active turn-\u0000<sc>off</small>\u0000 delay control in SiC \u0000<sc>mosfet</small>\u0000s eliminates the need for passive \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubbers, which otherwise increase the switching \u0000<inline-formula><tex-math>$dv/dt$</tex-math></inline-formula>\u0000 mismatch and snubber current across the diodes. In addition, parasitic base-plate capacitance across \u0000<sc>mosfet</small>\u0000s and diodes, along with parasitic bus bar and snubber inductance in the commutation path, contribute to turn-\u0000<sc>off</small>\u0000 voltage mismatch and snubber loss in series-connected 10 kV SiC JBS diodes. The mismatch in nonlinear capacitance of series-connected devices (\u0000<sc>mosfet</small>\u0000s and diodes) and the nonlinear \u0000<sc>mosfet</small>\u0000 \u0000<inline-formula><tex-math>$i$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$-$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$v_{gs}$</tex-math></inline-formula>\u0000 curve affect the turn-\u0000<sc>on</small>\u0000 and turn-\u0000<sc>off</small>\u0000 voltage transitions between complementary switching \u0000<sc>mosfet</small>\u0000s and diodes, leading to variations in turn-\u0000<sc>off</small>\u0000 voltage mismatch and snubber losses. The 3L-NPC converter has eight types of switching transition, complicating the analysis of \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubber design. This complexity is further increased by nonlinear device parameters, parasitic capacitance, and inductance in the commutation path for each of the eight 10 kV SiC \u0000<sc>mosfet</small>\u0000s and four 10 kV SiC JBS diodes. To address these challenges, this research develops a mathematical model for the switching transition between 10 kV SiC \u0000<sc>mosfet</small>\u0000s and complementary 10 kV SiC JBS diodes in a two-level clamped inductive switching (CIS) test setup. The model considers the effects of parasitic base-plate capacitance and the absence of an \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubber due to active turn-\u0000<sc>off</small>\u0000 delay control across series-connected SiC \u0000<sc>mosfet</small>\u0000s. Subsequently, the mathematical model is refined using an iterative algorithm to account for mismatches in nonlinear device capacitance of \u0000<sc>mosfet</small>\u0000s and diodes, as well as the nonlinear \u0000<inline-formula><tex-math>$i$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$-$</tex-math></inline-formula>\u0000<inline-formula><tex-math>$v_{gs}$</tex-math></inline-formula>\u0000 curve of \u0000<sc>mosfet</small>\u0000s during the switching transition of the diode. This refined model is then used to design the \u0000<inline-formula><tex-math>$RC$</tex-math></inline-formula>\u0000 snubber for series-connected 10 kV SiC JBS diodes and to optimize the turn-\u0000","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"1058-1084"},"PeriodicalIF":5.2,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10652239","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Comparative Assessment of Modulation Strategies in Modular Multilevel Converters: An Attempt for a Better Compromise Between the efficiency and Capacitor Voltages' Dispersion","authors":"Anthony Abdayem, Jean Sawma, Adrián Beneit, Ramon Blasco-Gimenez, Flavia Khatounian, Eric Monmasson","doi":"10.1109/ojies.2024.3447885","DOIUrl":"https://doi.org/10.1109/ojies.2024.3447885","url":null,"abstract":"","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"40 1","pages":""},"PeriodicalIF":8.5,"publicationDate":"2024-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Design of a Redundancy-Based Cascaded Bidirectional DC–DC Converter for Improved Reliability in Energy Storage Devices","authors":"Thales Augusto Fagundes;Guilherme Henrique Favaro Fuzato;Rafael Fernando Quirino Magossi;Ana Laís Rui Oliveira;Ricardo Quadros Machado","doi":"10.1109/OJIES.2024.3446911","DOIUrl":"10.1109/OJIES.2024.3446911","url":null,"abstract":"This article proposes a redundancy-based cascaded bidirectional dc/dc converter designed to interface battery energy storage system (BESS) units. With the employment of this topology, its reliability is increased due to redundancy in power conversion, which differs from conventional structures formed by dc/dc converters that cannot process power flow when a fault occurs. Thus, the topology is provided merging the cascaded bidirectional Boost converter and cascaded bidirectional Cuk converter. Subsequently, the coupled mathematical model of the proposed topology can be readily calculated, considering all feasible (different) subcircuits according to the switching pattern. Therefore, small-signal analysis is applied to design the PI controllers, followed by a closed-loop performance evaluation using an infinity norm and stability analysis to assess the operation of the dc/dc converter in closed loop for different values of load and current references. Finally, a lab-scale prototype and a hardware-in-the-loop setup prove the effectiveness of the dc/dc converter working in various scenarios and also operating with the traditional SoC-based droop for balancing the BESS units.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"898-915"},"PeriodicalIF":5.2,"publicationDate":"2024-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10643290","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Toward Semantic Event-Handling for Building Explainable Cyber-Physical Systems","authors":"Gernot Steindl;Tobias Schwarzinger;Katrin Schreiberhuber;Fajar J. Ekaputra","doi":"10.1109/OJIES.2024.3447001","DOIUrl":"10.1109/OJIES.2024.3447001","url":null,"abstract":"In the context of cyber-physical systems (CPS), understanding system behaviors is crucial for ensuring reliability, efficiency, and trust. However, due to the increasing complexity of the modern CPS, gaining such understanding is becoming more challenging. In this article we provide a foundation for explaining system behavior through detected system events. To this end, the article proposes a technology-agnostic, semantic event-handling module to address the challenge of enhancing explainability within CPS. This module is designed to be part of the common architecture for Explainable CPS and, therefore, can be integrated seamlessly into existing CPS frameworks by providing different interfaces to access detected events. Two case studies in the smart building and smart grid domain are carried out to demonstrate the feasibility and efficacy of the approach, utilizing an open-source software stack for the prototypical implementation. A qualitative evaluation of the proposed approach, based on the ISO/IEC 25010:2023, was used to analyze the software design. Our evaluation result shows that the semantic event-handling module is appropriate as a generic approach to handling events within a CPS. The module becomes a foundation for incorporating explainability into the system, which is needed as a foundation to ensure human trust and enable informed decision-making.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"928-945"},"PeriodicalIF":5.2,"publicationDate":"2024-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10643286","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142175880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Survey of Ontologies Considering General Safety, Security, and Operation Aspects in OT","authors":"Siegfried Hollerer;Thilo Sauter;Wolfgang Kastner","doi":"10.1109/OJIES.2024.3441112","DOIUrl":"10.1109/OJIES.2024.3441112","url":null,"abstract":"The integration of information technology (IT) and operational technology (OT) is deepening, amplifying the interconnectedness of operational, safety, and security demands within industrial automation systems. Lacking comprehensive guidance, risk managers often resort to manual solutions based on best practices or rely on domain experts, who usually offer insights limited to their specific areas of expertise. Given the intricate interplay among these domains, employing ontologies for knowledge representation could hold the key to capturing all necessary relationships and constraints for effective risk management processes. This study conducts a systematic mapping analysis of ontologies published over the past five years, focusing on at least one domain relevant to OT system risk management. Its objective is to categorize papers, offer a panoramic view of research themes and contributors, discern potential publication patterns, and identify research avenues based on a comprehensive review of these ontologies. Findings indicate a relatively stable research interest, with most publications presenting proof of concepts or initial experimental results for their ontological applications. This study establishes a foundation for classifying comprehensive OT ontologies and pinpoints unresolved issues that can steer future research efforts. It offers insights into the current state-of-the-art within this research area.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"861-885"},"PeriodicalIF":5.2,"publicationDate":"2024-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10632623","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141940424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Explainable Model Prediction of Memristor","authors":"Sruthi Pallathuvalappil;Rahul Kottappuzhackal;Alex James","doi":"10.1109/OJIES.2024.3440578","DOIUrl":"10.1109/OJIES.2024.3440578","url":null,"abstract":"System level simulation of neuro-memristive circuits under variability are complex and follow a black-box neural network approach. In realistic hardware, they are often difficult to cross-check for accuracy and reproducible results. The accurate memristor model prediction becomes critical to decipher the overall circuit function in a wide range of nonideal and practical conditions. In most neuro-memristive systems, crossbar configuration is essential for implementing multiply and accumulate calculations, that form the primary unit for neural network implementations. Predicting the specific memristor model that best fits the crossbar simulations to make it explainable is an open challenge that is solved in this article. As the size of the crossbar increases the cross-validation becomes even more challenging. This article proposes predicting the memristor device under test by automatically evaluating the \u0000<italic>I–V</i>\u0000 behavior using random forest and extreme gradient boosting algorithms. Starting with a single memristor model, the prediction approach is extended to memristor crossbar-based circuits explainable. The performance of both algorithms is analyzed based on precision, recall, f1-score, and support. The accuracy, macro average, and weighted average of both algorithms at different operational frequencies are explored.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"836-846"},"PeriodicalIF":5.2,"publicationDate":"2024-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10631696","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141940425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"AutomationML Meets Bayesian Networks: A Comprehensive Safety-Security Risk Assessment in Industrial Control Systems","authors":"Pushparaj Bhosale;Wolfgang Kastner;Thilo Sauter","doi":"10.1109/OJIES.2024.3439388","DOIUrl":"10.1109/OJIES.2024.3439388","url":null,"abstract":"Industrial control systems (ICSs) play a crucial role in the smooth operation of critical infrastructures, and their increasing complexity and interconnectedness necessitate integrating safety and security measures. Thus, an integrated risk assessment approach is essential to identify and address potential hazards and vulnerabilities. However, conducting such risk assessments becomes complex and challenging due to the difficulty in data availability. Acquiring data from various sources poses a significant hurdle. To address these challenges, automation markup language (AML) provides a standardized framework that facilitates the seamless exchange of engineering information. This article uses AML libraries and connection setup techniques to generate a valuable model of a single source of data for an integrated safety and security risk assessment. The automated risk assessment employs the AML model as a data source and the Bayesian belief network (BBN) as the risk assessment method. The value of risk associated with the system is calculated using the BBN models as the product of the probability of occurrence and severity. An evaluation of the proposed risk assessment method is also provided based on ISO 31000. AML's effectiveness as a valuable information model in meeting the growing need for comprehensive safety and security risk assessment in ICSs is demonstrated.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"5 ","pages":"823-835"},"PeriodicalIF":5.2,"publicationDate":"2024-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10623880","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141940426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}