Journal of Synchrotron Radiation最新文献

{"title":"High-resolution X-ray scanning with a diffuse Huffman-patterned probe to reduce radiation damage.","authors":"Alaleh Aminzadeh, Andrew M Kingston, Lindon Roberts, David M Paganin, Timothy C Petersen, Imants D Svalbe","doi":"10.1107/S1600577525002127","DOIUrl":"https://doi.org/10.1107/S1600577525002127","url":null,"abstract":"<p><p>Scanning objects with a tightly focused beam (of photons or electrons for example) can provide high-resolution images. However, rapid deposition of energy into a small area can damage tissues in organic samples or may rearrange the chemical structure or physical properties of inorganic materials. Scanning an object with a broad, or diffuse, beam can deliver an equivalent probe energy but spread it over a much wider footprint. However, typically the imaging resolution is proportional to the probe diameter and a diffuse probe sacrifices resolution. Here we propose a method to achieve `high resolution' imaging (in the sense that resolution is smaller than the probe diameter) using a diffuse probe. We achieve this by encoding a pattern onto the probe and employing a decoding step to recover a tight delta-like impulse response. Huffman sequences, by design, have the optimal delta-like autocorrelation for aperiodic (non-cyclic) convolution and are well conditioned. Here we adapt 1D Huffman sequences to design 2D Huffman-like discrete arrays as diffuse imaging probes that have spatially broad, relatively thin, uniform intensity profiles and have excellent aperiodic autocorrelation metrics. Examples of broad shaped diffuse beams were developed for the case of X-ray imaging. A variety of masks were fabricated by the deposition of finely structured layers of tantalum on a silicon oxide wafer. The layers form a pattern of discrete pixels that modify the shape of an incident uniform beam of low-energy X-rays as it passes through the mask. The intensity profiles of the X-ray beams after transmission through these masks were validated, first by acquiring direct-detector X-ray images of the masks, and second by raster scanning a pinhole over each mask pattern, pixel-by-pixel, collecting `bucket' signals as applied in traditional ghost imaging. The masks were then used to raster scan the shaped X-ray beam over several simple binary and `gray' test objects, again producing bucket signals, from which sharp reconstructed object images were obtained by deconvolving their bucket images.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":"32 Pt 3","pages":"700-717"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067338/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144047786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The OÆSE endstation at BESSY II: operando X-ray absorption spectroscopy for energy materials.","authors":"Raul Garcia-Diez, Johannes Frisch, Marianne van der Merwe, Romualdus Enggar Wibowo, Mihaela Gorgoi, Elmar Kataev, Catalina E Jimenez, Mauricio D Arce, William Smith, Wilson Quevedo-Garzon, Regan G Wilks, Dirk Wallacher, Leonhard J Reinschlüssel, Gülen C Tok, Hubert A Gasteiger, Marcus Bär","doi":"10.1107/S160057752500116X","DOIUrl":"10.1107/S160057752500116X","url":null,"abstract":"<p><p>The investigation of a wide range of energy materials under relevant operation conditions, allowing for real-time investigations of the (electro)chemical mechanisms governing the performance of related applications, is enabled by the new Operando Absorption and Emission Spectroscopy at EMIL (OÆSE) endstation in the Energy Materials In-situ Laboratory Berlin (EMIL) at the BESSY II synchrotron facility in Berlin, Germany. Currently primarily used for X-ray absorption spectroscopy (XAS) studies, the OÆSE endstation utilizes the undulator-based two-colour EMIL beamline (covering an energy range between 80 and 10000 eV) to enable soft, tender, and hard XAS. In this work, the setup, along with operando sample environments tailored to address specific questions, is described, emphasizing its modularity and adaptability, and detailing specific strategies to minimize undesired radiation-induced effects caused by the high brilliance of the EMIL beamline. The in situ growth of electrodeposited copper monitored by soft and hard XAS, at the Cu L₃ edge (sXAS) and Cu K edge (hXAS), respectively, is used as a proof-of-concept experiment, showcasing the capabilities of the OÆSE endstation as a versatile tool for comprehensive in situ/operando studies of energy materials under relevant conditions.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"634-648"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067322/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143732468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Ultimate brightness of a medium-energy synchrotron light source at operational beam intensity.","authors":"Victor Smaluk, Timur Shaftan, Dean Hidas","doi":"10.1107/S1600577525002723","DOIUrl":"https://doi.org/10.1107/S1600577525002723","url":null,"abstract":"<p><p>Synchrotron light sources are key instruments of modern science, providing unique opportunities for groundbreaking studies in diverse scientific disciplines and driving innovation in numerous scientific and technological fields. Fourth-generation light sources provide unprecedented capabilities in imaging, spectroscopy and diffraction techniques. Ultimate brightness is the key to advancing to a smaller scale, faster response, and higher data measurement and processing rate. The brightness is primarily determined by the electron beam emittance and energy spread at operational intensity. A common feature of fourth-generation synchrotrons is the short length of the electron bunches combined with a very small transverse beam size. Consequently, the high particle density leads to strong collective effects that significantly increase the emittance and limit the achievable brightness at operational beam intensity. In this article, we summarize our studies of the emittance and brightness scaled with the beam energy and intensity, taking into account the effects of intrabeam scattering, beam-impedance interaction and bunch lengthening provided by higher-harmonic RF systems to identify optimal combinations of machine and beam parameters.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":"32 Pt 3","pages":"595-604"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067340/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143992495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Macromolecular crystallography at Elettra: current and future perspectives.","authors":"Raghurama P Hegde, Nicola Demitri, Annie Héroux, Alessandro Olivo, Giorgio Bais, Michele Cianci, Paola Storici, Dan George Dumitrescu, Nishant Kumar Varshney, Balasubramanian Gopal, D D Sarma, Lisa Vaccari, Silvia Onesti, Maurizio Polentarutti","doi":"10.1107/S1600577525001055","DOIUrl":"10.1107/S1600577525001055","url":null,"abstract":"<p><p>The Elettra synchrotron radiation facility, located in Trieste, Italy, is a third-generation storage ring, operating in top-up mode at both 2.0 and 2.4 GeV. The facility currently hosts one beamline fully dedicated to macromolecular crystallography, XRD2. XRD2 is based on a superconducting wiggler, and it has been open to users since 2018. On-site and remote access for data collection, as well as monitoring tools and automatic data analysis pipelines are available to its users. In addition, since 1994 Elettra has operated a general-purpose diffraction beamline, XRD1, offering the macromolecular community a wide spectrum extending to long wavelengths for phasing and ion identification. Ancillary facilities support the beamlines, providing sample preparation and a high-throughput crystallization platform for the user community. A new CryoEM facility is being established on campus and jointly operated by the Consiglio Nazionale della Ricerche - Istituto Officina dei Materiali (CNR-IOM) and Elettra, providing further opportunities to the Elettra user community. This review outlines the current capabilities and anticipated developments for macromolecular crystallography at Elettra to accompany the upcoming upgrade to Elettra 2.0, featuring a six-bend enhanced achromat lattice. The new source is expected to deliver a high-brilliance beam, enabling the macromolecular crystallography community to better address the emerging and future scientific challenges.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"757-765"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067329/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143732228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Current and future perspectives for structural biology at the Grenoble EPN campus: a comprehensive overview.","authors":"Andrew A McCarthy, Shibom Basu, Florent Bernaudat, Matthew P Blakeley, Matthew W Bowler, Philippe Carpentier, Gregory Effantin, Sylvain Engilberge, David Flot, Frank Gabel, Lukas Gajdos, Jos J A G Kamps, Eaazhisai Kandiah, Romain Linares, Anne Martel, Igor Melnikov, Estelle Mossou, Christoph Mueller-Dieckmann, Max Nanao, Didier Nurizzo, Petra Pernot, Alexander Popov, Antoine Royant, Daniele de Sanctis, Guy Schoehn, Romain Talon, Mark D Tully, Montserrat Soler-Lopez","doi":"10.1107/S1600577525002012","DOIUrl":"https://doi.org/10.1107/S1600577525002012","url":null,"abstract":"<p><p>The European Photon and Neutron campus in Grenoble is a unique site, encompassing the European Synchrotron Radiation Facility Extremely Brilliant Source, the Institut Laue-Langevin, the European Molecular Biology Laboratory and the Institut de Biologie Structurale. Here, we present an overview of the structural biology beamlines, instruments and support facilities available on the EPN campus. These include advanced macromolecular crystallography using neutrons or X-rays, small-angle X-ray or neutron scattering, cryogenic electron microscopy, and spectroscopy. These highly complementary experimental approaches support cutting-edge research for integrated structural biology in our large user community. This article emphasizes our significant contributions to the field, outlines current advancements made and provides insights into our future prospects, offering readers a comprehensive understanding of the EPN campus's role in advancing integrated structural biology research.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":"32 Pt 3","pages":"577-594"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067332/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144051203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"TXM-Pal: a companion software for advanced data processing in spectroscopic X-ray microscopy.","authors":"Sugeun Jo, Sangwoo Kim, Jun Lim","doi":"10.1107/S1600577525002036","DOIUrl":"10.1107/S1600577525002036","url":null,"abstract":"<p><p>Transmission X-ray microscopy (TXM) is a powerful and non-destructive tool for interpreting the chemical states of a wide range of materials. It utilizes X-ray absorption near-edge structure (XANES) for the chemically sensitive mapping of specific elements, making it particularly effective for studying heterogeneous systems. However, specialized software is required for XANES imaging analyses to precisely align and correct the image drift, ensuring accurate XANES fitting. To address this issue, we developed TXM-Pal, a Python-based software optimized for XANES imaging data analysis at the 7C-XNI beamline in Pohang Light Source II. This software includes a user-friendly graphical user interface that facilitates XANES analysis, allowing images to be processed within a few minutes. The Rust-based implementation in TXM-Pal accelerates data analysis by tens of times compared with programs of pure Python. Using TXM-Pal, we procured detailed insights into the XANES analytical workflow. To demonstrate the efficacy of the proposed software, we mapped the Ni oxidation states within lithium-ion battery cathodes and thereby revealed their heterogeneity. TXM-Pal will be continuously updated to enhance XANES imaging analysis for users at spectroscopic X-ray microscope beamlines.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"815-822"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067337/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143774686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Counting multiple X-rays per pulse with an avalanche photodiode detector.","authors":"Liam T Powers, Aidan M Jacobsen, Stephen M Durbin","doi":"10.1107/S1600577525002462","DOIUrl":"https://doi.org/10.1107/S1600577525002462","url":null,"abstract":"<p><p>Avalanche photodiode detectors (APDs) at X-ray synchrotrons are typically limited to recording at most one photon per synchrotron pulse. Digitizing the APD amplifier outputs enables signal processing to accurately measure a mean count rate of at least four photons per pulse based on initial synchrotron measurements. Higher rates are readily achievable. This method allows APDs to be utilized for time-resolved measurements at much higher intensities than before.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":"32 Pt 3","pages":"629-633"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067339/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144057822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Development of a multi-functional chamber for resonant X-ray scattering experiments in the tender X-ray regime at the PAL-XFEL.","authors":"Soon Hee Park, Seonghan Kim, Jaeku Park, Seokhwan Yun, Jaehong Jeong, Je Geun Park, Kyung Sook Kim, Tae Kyu Choi, Intae Eom, Dogeun Jang, Minseok Kim, Jae Hyuk Lee, Sang Youn Park, Hyunjung Kim, Sae Hwan Chun","doi":"10.1107/S1600577525002899","DOIUrl":"https://doi.org/10.1107/S1600577525002899","url":null,"abstract":"<p><p>The hard X-ray undulator line at Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) provides a wide range of photon energies encompassing both the tender (2-5 keV) and hard (5-15 keV) X-ray regimes. Its Femtosecond X-ray Scattering (FXS) endstation is dedicated to research in condensed matter physics and materials science, and supports various time-resolved X-ray experiments, such as diffraction, spectroscopy and resonant X-ray scattering. We report the development of a multi-functional chamber at the FXS endstation to support the experiments in the tender X-ray regime where significant air scattering and absorption pose challenges. This chamber enables optical-pump/X-ray-probe experiments in a vacuum environment, with its functionality demonstrated through time-resolved resonant elastic X-ray scattering experiments on a ruthenate Li₂RuO₃ near the Ru L₃ (∼2.84 keV) absorption edge. Designed to readily accommodate modular instruments, the chamber offers flexibility to provide diverse experiment conditions requested by users at the FXS endstation.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":"32 Pt 3","pages":"539-547"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067342/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144053984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Status and perspective of protein crystallography at the first multi-bend achromat based synchrotron MAX IV.","authors":"Ana Gonzalez, Tobias Krojer, Jie Nan, Monika Bjelčić, Swati Aggarwal, Ishkan Gorgisyan, Mirko Milas, Mikel Eguiraun, Cecilia Casadei, Manoop Chenchiliyan, Andrius Jurgilaitis, David Kroon, Byungnam Ahn, John Carl Ekström, Oskar Aurelius, Dean Lang, Thomas Ursby, Marjolein M G M Thunnissen","doi":"10.1107/S1600577525002255","DOIUrl":"10.1107/S1600577525002255","url":null,"abstract":"<p><p>The first multi-bend achromat based synchrotron MAX IV operates two protein crystallography beamlines, BioMAX and MicroMAX. BioMAX is designed as a versatile, stable, high-throughput beamline catering for most protein crystallography experiments. MicroMAX is a more ambitious beamline dedicated to serial crystallography including time-resolved experiments. Both beamlines exploit the special characteristics of fourth-generation beamlines provided by the 3 GeV ring of MAX IV. In addition, the fragment-based drug discovery platform, FragMAX, is hosted and, at the FemtoMAX beamline, protein diffraction experiments exploring ultrafast time resolution can be performed. A technical and operational overview of the different beamlines and the platform is given as well as an outlook for protein crystallography embedded in the wider possibilities that MAX IV offers to users in the life sciences.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"779-791"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067333/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143784600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The High Energy diffraction beamline at the Canadian Light Source.","authors":"Aly Rahemtulla, Graham King, Ariel Gomez, Narayan Appathurai, Adam F G Leontowich, Rielly Castle, Nicholas Burns, Chang Yong Kim, Beatriz Moreno, Stefan Kycia","doi":"10.1107/S1600577525001262","DOIUrl":"10.1107/S1600577525001262","url":null,"abstract":"<p><p>The design, performance, and capabilities of the High Energy beamline at the Brockhouse Sector of the Canadian Light Source are described. The beamline uses a single bent silicon wafer as a side-bounce Laue monochromator, using the (111), (422), or (533) hkl reflections to access energies ranging from 25 to 90 keV. The cryogenically cooled crystal serves as the only optical element in the beamline providing a simple, convenient, and reliable configuration. The bending provides a vertical focus as small as 20 µm. The flux ranges from 1 × 10¹⁰ to 1 × 10¹³ photons s^-1, depending on the energy, with typical pre-monochromator slit settings. A large translation table in the hutch moves to follow the beam as the energy is changed. Data are collected using large area detectors. Common uses include rapid collection of powder diffraction data, penetration of thick samples and devices, high pressure diffraction, and pair distribution function measurements.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"750-756"},"PeriodicalIF":2.5,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12067344/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143732243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}