Applied Microscopy最新文献

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One-step synthesis of Pt/a-CoOx core/shell nanocomposites Pt/a-CoOx核壳纳米复合材料的一步合成
Applied Microscopy Pub Date : 2019-11-14 DOI: 10.1186/s42649-019-0016-2
Daewoon Kim, Sung Joo Kim, Jong Min Yuk
{"title":"One-step synthesis of Pt/a-CoOx core/shell nanocomposites","authors":"Daewoon Kim,&nbsp;Sung Joo Kim,&nbsp;Jong Min Yuk","doi":"10.1186/s42649-019-0016-2","DOIUrl":"https://doi.org/10.1186/s42649-019-0016-2","url":null,"abstract":"<p>Herein, we synthesize a core/shell Pt/a-CoO<sub>x</sub> nanocomposite via one-step synthesis using a strong reaction agent of borane t-butylamine(BBA) at 200?°C. Transmission electron microscopy study shows that the morphology of nanocomposites is controlled by the stirring time and perfect core/shell structure is formed with over 7?days stirring time.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0016-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4589898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The autophagy research in electron microscopy 自噬的电镜研究
Applied Microscopy Pub Date : 2019-11-06 DOI: 10.1186/s42649-019-0012-6
Minkyo Jung, Hyosun Choi, Ji Young Mun
{"title":"The autophagy research in electron microscopy","authors":"Minkyo Jung,&nbsp;Hyosun Choi,&nbsp;Ji Young Mun","doi":"10.1186/s42649-019-0012-6","DOIUrl":"https://doi.org/10.1186/s42649-019-0012-6","url":null,"abstract":"<p>Autophagy, a highly conserved process of eukaryotic cellular recycling, plays an important role in cell survival and maintenance. Dysfunctional autophagy contributes to the pathologies of many human diseases. Many studies have attempted to clarify the process of autophagy. Here, we review morphological studies of autophagy involving electron microscopy.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0012-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4274988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy 利用透射电子显微镜分析二维材料的微观结构及相关性能
Applied Microscopy Pub Date : 2019-11-04 DOI: 10.1186/s42649-019-0013-5
Yun-Yeong Chang, Heung Nam Han, Miyoung Kim
{"title":"Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy","authors":"Yun-Yeong Chang,&nbsp;Heung Nam Han,&nbsp;Miyoung Kim","doi":"10.1186/s42649-019-0013-5","DOIUrl":"https://doi.org/10.1186/s42649-019-0013-5","url":null,"abstract":"<p>Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0013-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4183506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Liquid electron microscopy: then, now and future 液体电子显微镜:过去,现在和未来
Applied Microscopy Pub Date : 2019-10-25 DOI: 10.1186/s42649-019-0011-7
Anahita Vispi Bharda, Hyun Suk Jung
{"title":"Liquid electron microscopy: then, now and future","authors":"Anahita Vispi Bharda,&nbsp;Hyun Suk Jung","doi":"10.1186/s42649-019-0011-7","DOIUrl":"https://doi.org/10.1186/s42649-019-0011-7","url":null,"abstract":"<p>Contemporary microscopic imaging at near-atomic resolution of diverse embodiments in liquid environment has gained keen interest. In particular, Electron Microscopy (EM) can provide comprehensive framework on the structural and functional characterization of samples in liquid phase. In the past few decades, liquid based electron microscopic modalities have developed tremendously to provide insights into various backgrounds like biological, chemical, nanoparticle and material researches. It serves to be a promising analytical tool in deciphering unique insights from solvated systems. Here, the basics of liquid electron microscopy with few examples of its applications are summarized in brief. The technical developments made so far and its preference over other approaches is shortly presented. Finally, the experimental limitations and an outlook on the future technical advancement for liquid EM have been discussed.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0011-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4983191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Ultrastructure of the fertilized egg envelopes in Hemigrammus erythrozonus, Characidae, Teleostei 红带赤眼虫,特征科,Teleostei受精卵包膜的超微结构
Applied Microscopy Pub Date : 2019-08-20 DOI: 10.1186/s42649-019-0010-8
Byung Soo Chang, Eun-Kyung Choi, Hyun-Wook Kim, Dong Heui Kim
{"title":"Ultrastructure of the fertilized egg envelopes in Hemigrammus erythrozonus, Characidae, Teleostei","authors":"Byung Soo Chang,&nbsp;Eun-Kyung Choi,&nbsp;Hyun-Wook Kim,&nbsp;Dong Heui Kim","doi":"10.1186/s42649-019-0010-8","DOIUrl":"https://doi.org/10.1186/s42649-019-0010-8","url":null,"abstract":"<p>We examined the morphology and ultrastructures of fertilized egg envelopes of glowlight tetra (<i>Hemigrammus erythrozonus</i>) belong to Characidae using light and electron microscopes.</p><p>The fertilized eggs were spherical, transparent, demersal, adhesive, and have no oil droplet. The perivitelline space was well-developed and the micropyle was surrounded by 15–20 uplifted lines of egg envelope in a spoke like pattern. The outer surface of egg envelope was rough side with grooves. Also, the total thickness of the fertilized egg envelope was about 2.1–2.3?μm, and the fertilized egg envelope consisted of two layers, an outer adhesive electron-dense layer with grooves and three feather-like lamellae layers. Collectively, these morphological characteristics of fertilized egg and micropyle with spoke-like structure showed family Characidae specificity, and ultrastructures of outer surface and section of fertilized egg envelope showed species specificity.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0010-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4779730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Applying microscopic analytic techniques for failure analysis in electronic assemblies 应用微观分析技术进行电子组件失效分析
Applied Microscopy Pub Date : 2019-08-13 DOI: 10.1186/s42649-019-0009-1
Otto Grosshardt, Boldizsár Árpád Nagy, Anette Laetsch
{"title":"Applying microscopic analytic techniques for failure analysis in electronic assemblies","authors":"Otto Grosshardt,&nbsp;Boldizsár Árpád Nagy,&nbsp;Anette Laetsch","doi":"10.1186/s42649-019-0009-1","DOIUrl":"https://doi.org/10.1186/s42649-019-0009-1","url":null,"abstract":"<p>The present paper gives an overview of surface failures, internal nonconformities and solders joint failures detected by microscopic analysis of electronic assemblies. Optical microscopy (stereomicroscopy) and Fourier-Transform-Infrared (FTIR) microscopy is used for documentation and failure localization on electronic samples surface. For internal observable conditions a metallographic cross-section analysis of the sample is required. The aim of this work is to present some internal and external observable nonconformities which frequently appear in electronic assemblies. In order to detect these nonconformities, optical microscopy, cross section analysis, FTIR-microscopy and scanning electron microscopy with energy dispersive spectrometry (SEM-EDS) were used as analytical techniques.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0009-1","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4521808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam system 用现代聚焦离子束系统评价离子/电子束诱导电连接沉积
Applied Microscopy Pub Date : 2019-07-18 DOI: 10.1186/s42649-019-0008-2
Byeong-Seon An, Yena Kwon, Jin-Su Oh, Yeon-Ju Shin, Jae-seon Ju, Cheol-Woong Yang
{"title":"Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam system","authors":"Byeong-Seon An,&nbsp;Yena Kwon,&nbsp;Jin-Su Oh,&nbsp;Yeon-Ju Shin,&nbsp;Jae-seon Ju,&nbsp;Cheol-Woong Yang","doi":"10.1186/s42649-019-0008-2","DOIUrl":"https://doi.org/10.1186/s42649-019-0008-2","url":null,"abstract":"<p>Focused ion beam method, which has excellent capabilities such as local deposition and selective etching, is widely used for micro-electromechanical system (MEMS)-based in situ transmission electron microscopy (TEM) sample fabrication. Among the MEMS chips in which one can apply various external stimuli, the electrical MEMS chips require connection between the TEM sample and the electrodes in MEMS chip, and a connected deposition material with low electrical resistance is required to apply the electrical signal. Therefore, in this study, we introduce an optimized condition by comparing the electrical resistance for C-, Pt-, and W- ion beam induced deposition (IBID) at 30?kV and electron beam induced deposition (EBID) at 1 and 5?kV. The W-IBID at 30?kV with the lowest electrical resistance of about 30?Ω shows better electrical properties than C- and Pt-IBID electrodes. The W-EBID at 1?kV has lower electrical resistance than that at 5?kV; thus, confirming its potential as an electrode. Therefore, for the materials that are susceptible to ion beam damage, it is recommended to fabricate electrical connections using W-EBID at 1?kV.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0008-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4719410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Bergman glial cell morphology under the high voltage Electron microscope 高压电子显微镜下的伯格曼胶质细胞形态
Applied Microscopy Pub Date : 2019-07-01 DOI: 10.1186/s42649-019-0007-3
Im Joo Rhyu
{"title":"Bergman glial cell morphology under the high voltage Electron microscope","authors":"Im Joo Rhyu","doi":"10.1186/s42649-019-0007-3","DOIUrl":"https://doi.org/10.1186/s42649-019-0007-3","url":null,"abstract":"<p>The detailed morphology of Bergam glial cell was observed in single field of view during observation of Golgi stained mouse cerebellar cortex under the high voltage electron microscopy. The 3-dimensional organization of Bergman glial cell fully demonstrated with 8-degree stereo-paired images. The morphology of Bergman glial fiber and its appendages forming microdomains connected to other glial fiber are clearly presented in this image. This image provides a valuable insight for understanding morphology of Bergman glial cell.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-019-0007-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"4030150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microscale BTS sculptured by electron beam 电子束雕刻的微型防弹少年团
Applied Microscopy Pub Date : 2019-04-29 DOI: 10.1007/s42649-019-0006-4
Haneul Choi, Young Woo Jeong, Hye Jung Chang
{"title":"Microscale BTS sculptured by electron beam","authors":"Haneul Choi,&nbsp;Young Woo Jeong,&nbsp;Hye Jung Chang","doi":"10.1007/s42649-019-0006-4","DOIUrl":"https://doi.org/10.1007/s42649-019-0006-4","url":null,"abstract":"<p>We applied the advanced bitmap-assisted patterning function of focused ion beam to fabricate microscale sculpture of the ‘BangTanSoNyeonDan’ known as BTS members, the world-wide famous K-pop boyband. With the help of an electron microscope, you can carve your idols on your accessories at micro scale. Fun applications of electron microscopes are not limited to science.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s42649-019-0006-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5104640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Atomic structure and crystallography of joints in SnO2 nanowire networks SnO2纳米线网络中节点的原子结构和晶体学
Applied Microscopy Pub Date : 2019-04-29 DOI: 10.1007/s42649-019-0003-7
Viktor Hrkac, Niklas Wolff, Viola Duppel, Ingo Paulowicz, Rainer Adelung, Yogendra Kumar Mishra, Lorenz Kienle
{"title":"Atomic structure and crystallography of joints in SnO2 nanowire networks","authors":"Viktor Hrkac,&nbsp;Niklas Wolff,&nbsp;Viola Duppel,&nbsp;Ingo Paulowicz,&nbsp;Rainer Adelung,&nbsp;Yogendra Kumar Mishra,&nbsp;Lorenz Kienle","doi":"10.1007/s42649-019-0003-7","DOIUrl":"https://doi.org/10.1007/s42649-019-0003-7","url":null,"abstract":"<p>Joints of three-dimensional (3D) rutile-type (r) tin dioxide (SnO<sub>2</sub>) nanowire networks, produced by the flame transport synthesis (FTS), are formed by coherent twin boundaries at (101)<sup>r</sup> serving for the interpenetration of the nanowires. Transmission electron microscopy (TEM) methods, i.e. high resolution and (precession) electron diffraction (PED), were utilized to collect information of the atomic interface structure along the edge-on zone axes [010]<sup>r</sup>, [111]<sup>r</sup> and superposition directions [001]<sup>r</sup>, [101]<sup>r</sup>. A model of the twin boundary is generated by a supercell approach, serving as base for simulations of all given real and reciprocal space data as for the elaboration of three-dimensional, i.e. relrod and higher order Laue zones (HOLZ), contributions to the intensity distribution of PED patterns. Confirmed by the comparison of simulated and experimental findings, details of the structural distortion at the twin boundary can be demonstrated.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":"49 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s42649-019-0003-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"5100811","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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