2013 8th IEEE Design and Test Symposium最新文献_第3页

Verification of multi decisional reactive agent using SMV model checker 用SMV模型检查器验证多决策反应剂

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727075

Abdelhay Haqiq, B. Bounabat

引用次数: 5

Liquid level monitoring using passive RFID tags 使用无源RFID标签进行液位监测

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727088

A. Atojoko, M. Bin-Melha, E. Elkazmi, M. Usman, R. Abd‐Alhameed, C. See

引用次数: 2

Power constraints test scheduling of 3D stacked ICs 3D堆叠ic的功耗约束测试调度

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727115

S. Roy, Joya Sengupta, C. Giri, H. Rahaman

引用次数: 1

A BIST method for TSVs pre-bond test 一种用于tsv粘结前测试的BIST方法

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727081

H. Zimouche, G. D. Natale, M. Flottes, B. Rouzeyre

引用次数: 7

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity 部分电阻缺陷和偏置温度不稳定性对SRAM解码器可靠性的影响

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727124

Seyab Khan, M. Taouil, S. Hamdioui, H. Kukner, P. Raghavan, F. Catthoor

{"title":"Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity","authors":"Seyab Khan, M. Taouil, S. Hamdioui, H. Kukner, P. Raghavan, F. Catthoor","doi":"10.1109/IDT.2013.6727124","DOIUrl":"https://doi.org/10.1109/IDT.2013.6727124","url":null,"abstract":"Partial open defects in modern Static Random Access Memory (SRAM) address decoders are one of the main causes of small delays; these are hard to detect and may result in escapes and reliability problems. In addition, Aging failures - such as Bias Temperature Instability (BTI)-may worsen the situation and accelerate the degradation (i.e. increase the delay) and cause sooner field failures. This paper investigates the impact of partial opens and BTI in SRAM address decoders first separately and thereafter in a combined manner. Simulation results show that BTI impact strongly depends on the selected worldline, transistor location and addressing scheme; and it cause up to 14.27% additional delay. In addition, they show that partial opens, which do not cause hard faults and allow memory operations to pass correctly, contribute up to 23.65% additional delay. Combining these failure mechanisms reveals that the degradation can strongly be worsened and accelerate wear-out; an additional delay of up to 31.20% can be caused. This indicates the importance of incorporating appropriate design-for-reliability/testability schemes in order to guarantee the required lifetime of the memory system.","PeriodicalId":446826,"journal":{"name":"2013 8th IEEE Design and Test Symposium","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134258658","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 14

Optimizing test architecture of 3D stacked ICs for partial stack/complete stack using hard SoCs 优化3D堆叠ic的部分堆叠/完全堆叠测试架构

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727114

S. Roy, C. Giri, H. Rahaman

引用次数: 1

Single-ended sense amplifier robustness evaluation for OxRRAM technology OxRRAM技术单端感测放大器鲁棒性评价

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727097

H. Aziza, M. Bocquet, M. Moreau, J. Portal

引用次数: 2

Resource reservation technique for handover calls using integrated modeling technique 基于集成建模技术的交接呼叫资源预留技术

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727087

F. Onah, M. Ezeja, C. Ani

{"title":"Resource reservation technique for handover calls using integrated modeling technique","authors":"F. Onah, M. Ezeja, C. Ani","doi":"10.1109/IDT.2013.6727087","DOIUrl":"https://doi.org/10.1109/IDT.2013.6727087","url":null,"abstract":"The increase in GSM mobile station (MS) density, without a corresponding increase in radio channel resource capacity, reduces the quality of service (QoS) standard provided to users. Attempts to improve the QoS standard usually leads to the creation of new base stations (BS) with the consequent reduction in the existing cell sizes. Although, the available network capacity is increased, this happens at the expense of increased numbers of call handoversSuch increase is usually accommodated by resource reservation. How well the reservation is made greatly influences the GSM network quality of service (QoS) and the general BS resource utilization. This work presents a radio channel resource reservation technique for GSM handover calls. A typical GSM network architecture was modeled using an integrated modeling technique in a MATLAB block oriented simulation environment. The analytical part of the model was developed using the Markov chain principle and validated using the existing popular Lee's queuing model. The relationships between the handover call blocking probability, fresh call blocking probability, the number of resources to be reserved and traffic intensity were established. Simulation results were analyzed and a method of determining the optimum number of resources that can be reserved for handover calls for a given BS resource capacity was presented.","PeriodicalId":446826,"journal":{"name":"2013 8th IEEE Design and Test Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124057103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

An UHF RFID emulation platform with fault injection and real time monitoring capabilities 具有故障注入和实时监控功能的超高频RFID仿真平台

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727143

Omar Abdelmalek, D. Hély, V. Beroulle, I. Mezzah

引用次数: 7

Opportunistic redundancy for improving reliability of embedded processors 提高嵌入式处理器可靠性的机会冗余

2013 8th IEEE Design and Test Symposium Pub Date : 2013-12-01 DOI: 10.1109/IDT.2013.6727090

Z. Wang, Renlin Li, A. Chattopadhyay

引用次数: 3