{"title":"Channel-based behavioral test synthesis for improved module reachability","authors":"Y. Makris, A. Orailoglu","doi":"10.1145/307418.307506","DOIUrl":"https://doi.org/10.1145/307418.307506","url":null,"abstract":"We introduce a novel behavioral test synthesis methodology that attempts to increase module reachability, driven by powerful global design path analysis. Based on the notion of transparency channels, test justification and propagation bottlenecks are revealed for each module in the design. Subsequently the proposed behavioral test synthesis scheme eliminates during scheduling, allocation and binding, as many reachability bottlenecks, as possible. Furthermore, it identifies the control states and provides the templates required for translating each module's test into global design rest. We demonstrate our scheme on a representative example, unveiling the potential of path analysis based techniques to accurately identify and eliminate module reachability bottlenecks, thus guiding behavioral rest synthesis.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129480012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Mukherjee, J. Jain, K. Takayama, M. Fujita, J. Abraham, D. Fussell
{"title":"An efficient filter-based approach for combinational verification","authors":"R. Mukherjee, J. Jain, K. Takayama, M. Fujita, J. Abraham, D. Fussell","doi":"10.1145/307418.307475","DOIUrl":"https://doi.org/10.1145/307418.307475","url":null,"abstract":"We have developed a filter-based framework where several fundamentally different techniques can be combined to provide fully automated and efficient heuristic solutions to verification and possibly other NP-complete problems. Such an integrated methodology is far more robust and efficient than any single existing technique on a wide variety of circuits. Our methodology has been applied to verify the ISCAS 85 benchmark circuits and efficient verification results have been presented on a large set of industrial circuits which could not be verified using several published techniques and commercial verification tools available to us.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128521151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Object-oriented reuse methodology for VHDL","authors":"C. Barna, W. Rosenstiel","doi":"10.1145/307418.307590","DOIUrl":"https://doi.org/10.1145/307418.307590","url":null,"abstract":"In the reuse domain, the necessity of finding a new more suitable description language opposes the need to make reuse an accepted practice, and thus related to standards. This paper presents a new method to reuse VHDL described components in an IP centric manner. The basic object reuse model uses an object-oriented extension of VHDL, Objective VHDL. In contrast to conventional reuse approaches, which imply a considerable re-design effort, this new approach bridges the gap between design and reuse integration. The methodology is implemented in the form of a Reuse Management System which handles the classification, modification, adaption, storage and retrieval of the reuse components.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127369905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Testing the configurable interconnect/logic interface of SRAM-based FPGA's","authors":"M. Renovell, J. Portal, J. Figueras, Y. Zorian","doi":"10.1145/307418.307576","DOIUrl":"https://doi.org/10.1145/307418.307576","url":null,"abstract":"The objective of this paper is to define a minimum number of configurations for testing the configurable modules that interface the global interconnect and the logic cells of SRAM-based FPGAs. In usual SRAM-based FPGAs, Configurable Interface Modules (CIMs) can be found between the global interconnect and inputs of the logic cells (input CIMs) or between output of the logic cells and the global interconnect (output CIMs). It is demonstrated that an input CIM that connects N/sup in/ segments to a logic cell input requires N/sup in/ test configurations and that an output CIM that connects a logic cell output to N/sup out/ segments requires 2 test configurations. Then, it is proven that a set of K/sup in/ input CIMs can be tested in parallel making the number of required test configurations equal to N/sup in/. In the same way, a set of K/sup out/ output CIMs is shown to require only 2 test configurations if N/sup out/>K/sup out/. Finally, it is shown that the complete mXm array of logic cells with K/sup in/ input CIMs and K/sup out/ output CIMs can be tested with only N/sup in/ test configurations using the XOR tree and shift register structures.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129973757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"How to use knowledge in an analysis process","authors":"H. Holzheuer","doi":"10.1145/307418.307551","DOIUrl":"https://doi.org/10.1145/307418.307551","url":null,"abstract":"An efficient design and analysis process is based on an enormous amount of knowledge and information. Therefore, tools and techniques for knowledge acquisition, representation, and visualisation have to be integrated into the overall design process but they don't have to be treated as separate components. The variety of knowledge sources and its dependency on the environment lead to a complex integration task. This paper presents a knowledge enriched approach to support a signal integrity analysis process.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131968833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Higher product complexity and shorter development time - continuous challenge to design and test environment","authors":"Jouko Junkkari","doi":"10.1145/307418.307423","DOIUrl":"https://doi.org/10.1145/307418.307423","url":null,"abstract":"Digital technologies enable more functionality and new attractive products at faster pace. What are the challenges faced in the development? How must the processes change? How must the tools change? How must the businesses change? What are the strategic questions to be answered? The author gives consideration to this.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130252198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Increasing efficiency of symbolic model checking by accelerating dynamic variable reordering","authors":"C. Meinel, Christian Stangier","doi":"10.1145/307418.307454","DOIUrl":"https://doi.org/10.1145/307418.307454","url":null,"abstract":"Model checking has been proven to be a powerful tool in verification of sequential circuits, reactive systems, protocols, etc. The model checking of systems with huge state spaces is possible only if there is a very efficient representation of the model. Ordered Binary Decision Diagrams (OBDDs) allow an efficient symbolic representation of the model. Our goal is to accelerate the variable reordering process but retaining good OBDD sizes. To obtain this, we adapted two methods introduced by Meinel and Slobodova called Block Restricted Sifting (BRS) and Sample Sifting to the needs of model checking.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122706465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Time constrained module scheduling with global resource sharing","authors":"C. Jäschke, R. Laur, F. Beckmann","doi":"10.1145/307418.307491","DOIUrl":"https://doi.org/10.1145/307418.307491","url":null,"abstract":"Commonly used scheduling algorithms in high-level synthesis only accept one process at a time and are not capable of sharing resources across process boundaries. This results in the usage of at least one resource per operation type and process. A new method is proposed in order to overcome these restrictions and to share high-cost or limited resources within a process group. This allows the use of less than one resource per operation type and process, while keeping the mutual independence of the involved processes. The method represents an extension of general scheduling algorithms and is not tied to a specific algorithm. It is applied to the time constrained force-directed scheduling algorithm. For this the scope of the scheduling is extended to the processes of the whole system and a two-part modification is applied to the original procedure. A multi-process example illustrates the resource sharing capabilities of the extension.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131156022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cycle-based simulation with decision diagrams","authors":"R. Ubar, J. Raik, A. Morawiec","doi":"10.1145/307418.307538","DOIUrl":"https://doi.org/10.1145/307418.307538","url":null,"abstract":"This paper addresses the problem of efficient functional simulation of synchronous digital systems. A technique based on the use of decision diagrams (DD) for representing the functions of a design at RT and behavioural level is introduced. The DD evaluation technique is combined with cycle based simulation mechanism to achieve significant speed up of the simulation execution. Experimental results are provided for demonstrating the efficiency gain of this method in comparison to the event-driven simulation.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132588654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Integrated resource assignment and scheduling of task graphs using finite domain constraints","authors":"K. Kuchcinski","doi":"10.1145/307418.307494","DOIUrl":"https://doi.org/10.1145/307418.307494","url":null,"abstract":"This paper presents an approach to modeling of task graphs using finite domain constraints. The synthesis of such models into an architecture consisting of microprocessors, ASICs and communication devices, is then defined as an optimization problem and it is solved using constraint solving techniques. The presented approach offers an elegant and powerful modeling technique for different architecture features as well as heterogeneous constraints. The extensive experimental results prove the feasibility of this approach.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131798359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}