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Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022最新文献

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SUPPORTING PROVENANCE OF DIGITAL CALIBRATION CERTIFICATES WITH TEMPORAL DATABASES 支持数字校准证书的来源与时间数据库
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.024
Vashti Galpina, I. Smith, J. Hippolyte
{"title":"SUPPORTING PROVENANCE OF DIGITAL CALIBRATION CERTIFICATES WITH TEMPORAL DATABASES","authors":"Vashti Galpina, I. Smith, J. Hippolyte","doi":"10.21014/tc6-2022.024","DOIUrl":"https://doi.org/10.21014/tc6-2022.024","url":null,"abstract":"– Trust in current and historical calibration data is crucial. The recently proposed XML schema for digital calibration certificates (DCCs) provides machine-readability and a common exchange format to enhance this trust. We present a prototype web application developed in the programming language Links for storing and displaying a DCC using a relational database. In particular, we leverage the temporal database features that Links provides to capture different versions of a certificate and inspect differences between versions. The prototype is the starting point for developing software to support DCCs and the data with which they are populated and has underlined that DCCs are the tip of the iceberg in automating the management of digital calibration data, activity that includes data provenance and tracking of modifications.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115063437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
SENSOR FAULT DIAGNOSIS USING DEEP LEARNING FOR OFFSHORE STRUCTURAL HEALTH MONITORING 基于深度学习的海洋结构健康监测传感器故障诊断
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.001
Jianqiang Mou, Liuyang Feng, Xiudong Qian, Shan Cui
{"title":"SENSOR FAULT DIAGNOSIS USING DEEP LEARNING FOR OFFSHORE STRUCTURAL HEALTH MONITORING","authors":"Jianqiang Mou, Liuyang Feng, Xiudong Qian, Shan Cui","doi":"10.21014/tc6-2022.001","DOIUrl":"https://doi.org/10.21014/tc6-2022.001","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128876903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PROMISING BENEFITS OF AN SELF-UPDATING (U)DCC APPLICATION EXAMPLE: THE QUANTUM-BASED PASCAL 一个自更新(u) dcc应用程序示例的好处:基于量子的PASCAL
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.040
T. Rubin, T. Bock, M. Bernien
{"title":"PROMISING BENEFITS OF AN SELF-UPDATING (U)DCC APPLICATION EXAMPLE: THE QUANTUM-BASED PASCAL","authors":"T. Rubin, T. Bock, M. Bernien","doi":"10.21014/tc6-2022.040","DOIUrl":"https://doi.org/10.21014/tc6-2022.040","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130254544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
REPRESENTING METROLOGICAL TRACEABILITY IN DIGITAL SYSTEMS 表示数字系统中的计量可追溯性
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.014
B. Hall, R. M. White
{"title":"REPRESENTING METROLOGICAL TRACEABILITY IN DIGITAL SYSTEMS","authors":"B. Hall, R. M. White","doi":"10.21014/tc6-2022.014","DOIUrl":"https://doi.org/10.21014/tc6-2022.014","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128491872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
THE APMP-DXFG: A FOCUS GROUP ON DIGITAL TRANSFORMATION IN METROLOGY apmp-dxfg:计量数字化转型的焦点小组
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.005
B. Hall, Shan Cui, K. Yamazawa
{"title":"THE APMP-DXFG: A FOCUS GROUP ON DIGITAL TRANSFORMATION IN METROLOGY","authors":"B. Hall, Shan Cui, K. Yamazawa","doi":"10.21014/tc6-2022.005","DOIUrl":"https://doi.org/10.21014/tc6-2022.005","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"144 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116600197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DATA METROLOGY FOR LIFE SCIENCES, MEDICINE AND PHARMACEUTICAL MANUFACTURING 用于生命科学、医学和制药制造的数据计量学
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.025
P. M. Duncan, N. Smith, M. Romanchikova
{"title":"DATA METROLOGY FOR LIFE SCIENCES, MEDICINE AND PHARMACEUTICAL MANUFACTURING","authors":"P. M. Duncan, N. Smith, M. Romanchikova","doi":"10.21014/tc6-2022.025","DOIUrl":"https://doi.org/10.21014/tc6-2022.025","url":null,"abstract":": In many disciplines, such as physics and engineering, the application of tools to support data metrology is encouraged and embedded in many processes and applications while in the life sciences, medicine and pharmaceutical manufacturing sectors these tools are often added as an afterthought, if considered at all. The use of data-driven decision making and the advent of machine learning in these industries has created an urgent demand for harmonised high-quality, instantly available, datasets across domains. The Findable, Accessible, Interoperable, Reproducible principles are designed to improve overall quality of research data. However, this alone does not guarantee that data is fit-for-purpose. Issues such as missing data and metadata, insufficient knowledge of measurement conditions or data provenance are well known and can be aided by applying metrological concepts to data preparation to increase confidence. This work presents the data metrology projects conducted by the National Physical Laboratory Data Science team in healthcare applications.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130603902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TOWARDS DIGITALIZATION OF TEMPERATURE MEASUREMENTS 走向温度测量的数字化
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.004
Jonathan Pearce, R. Veltcheva, D. Tucker, G. Machin
{"title":"TOWARDS DIGITALIZATION OF TEMPERATURE MEASUREMENTS","authors":"Jonathan Pearce, R. Veltcheva, D. Tucker, G. Machin","doi":"10.21014/tc6-2022.004","DOIUrl":"https://doi.org/10.21014/tc6-2022.004","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"186 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123045455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AN INTRODUCTION TO LINKED DATA AND THE SEMANTIC WEB 链接数据和语义网的介绍
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.037
Clifford Brown, D. Hutzschenreuter, Julia Neumann
{"title":"AN INTRODUCTION TO LINKED DATA AND THE SEMANTIC WEB","authors":"Clifford Brown, D. Hutzschenreuter, Julia Neumann","doi":"10.21014/tc6-2022.037","DOIUrl":"https://doi.org/10.21014/tc6-2022.037","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122530474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
USING BLENDER AS A TOOL TO SIMULATE 3D CAMERA BASED MEASUREMENTS 使用搅拌器作为工具来模拟基于三维相机的测量
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.038
C. Pottier, F. Eghtedari, J. Petzing, P. Kinnell
{"title":"USING BLENDER AS A TOOL TO SIMULATE 3D CAMERA BASED MEASUREMENTS","authors":"C. Pottier, F. Eghtedari, J. Petzing, P. Kinnell","doi":"10.21014/tc6-2022.038","DOIUrl":"https://doi.org/10.21014/tc6-2022.038","url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124788819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DIGITAL SCHEMAX AND THE FUTURE OF THE DIGITAL CALIBRATION CERTIFICATE 数字方案和未来的数字校准证书
Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022 Pub Date : 1900-01-01 DOI: 10.21014/tc6-2022.028
Gamze Söylev Öktem, Siegfried Hackel, F. Härtig, Jan Loewe, Benjamin Gloger, J. Jagieniak
{"title":"DIGITAL SCHEMAX AND THE FUTURE OF THE DIGITAL CALIBRATION CERTIFICATE","authors":"Gamze Söylev Öktem, Siegfried Hackel, F. Härtig, Jan Loewe, Benjamin Gloger, J. Jagieniak","doi":"10.21014/tc6-2022.028","DOIUrl":"https://doi.org/10.21014/tc6-2022.028","url":null,"abstract":"− The Digital Calibration Certificate (DCC) is an endeavour spearheaded by the Physikalisch-Technische Bundesanstalt (PTB) to digitalise the creation of calibration certificates, which is currently analogue (paper based). This paper outlines some new developments of the DCC and describes future planned developments. We present the new Digital SchemaX (DX), which has been developed for DCC version 4. Second, an Envelope Digital Certificate (EDC) has been prepared to collect different calibration items that belong together. Third, a planned new schema for Digital Reference Materials (DRM) is briefly introduced. Fourth, a planned schema for Digital Test Certificates (DTC), which are based on test reports is described.","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124930772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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